This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.

Symbols

* μSR – see muon spin spectroscopy * χ – see magnetic susceptibility

A

* AAS – Atomic absorption spectroscopy * AED – Auger electron diffraction * AES – Auger electron spectroscopy * AFM – Atomic force microscopy * AFS –

Atomic fluorescence spectroscopy Fluorescence spectroscopy (also known as fluorimetry or spectrofluorometry) is a type of electromagnetic spectroscopy that analyzes fluorescence from a sample. It involves using a beam of light, usually ultraviolet light, that excites the elect ...

* Analytical ultracentrifugation * APFIM – Atom probe field ion microscopy * APS – Appearance potential spectroscopy * ARPES – Angle resolved photoemission spectroscopy * ARUPS – Angle resolved ultraviolet photoemission spectroscopy * ATR – Attenuated total reflectance

B

* BET – BET surface area measurement (BET from Brunauer, Emmett, Teller) * BiFC – Bimolecular fluorescence complementation * BKD – Backscatter Kikuchi diffraction, see EBSD * BRET –

Bioluminescence resonance energy transfer Bioluminescence is the production and emission of light by living organisms. It is a form of chemiluminescence. Bioluminescence occurs widely in marine vertebrates and invertebrates, as well as in some fungi, microorganisms including some b ...

* BSED – Back scattered electron diffraction, see EBSD

C

* CAICISS – Coaxial impact collision ion scattering spectroscopy * CARS – Coherent anti-Stokes Raman spectroscopy * CBED – Convergent beam electron diffraction * CCM – Charge collection microscopy * CDI –

Coherent diffraction imaging Coherent diffractive imaging (CDI) is a "lensless" technique for 2D or 3D reconstruction of the image of nanoscale structures such as nanotubes, nanocrystals, porous nanocrystalline layers, defects, potentially proteins, and more. In CDI, a highl ...

* CE – Capillary electrophoresis * CET –

Cryo-electron tomography Electron cryotomography (CryoET) is an imaging technique used to produce high-resolution (~1–4 nm) three-dimensional views of samples, often (but not limited to) biological macromolecules and cells. CryoET is a specialized application of tr ...

* CL – Cathodoluminescence * CLSM –

Confocal laser scanning microscopy Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser confocal scanning microscopy (LCSM), is an optical imaging technique for increasing optical resolution and contrast of a micrograph by means of using a s ...

* COSY – Correlation spectroscopy * Cryo-EM – Cryo-electron microscopy * Cryo-SEM – Cryo-scanning electron microscopy * CV – Cyclic voltammetry

D

* DE(T)A – Dielectric thermal analysis * dHvA – De Haas–van Alphen effect * DIC – Differential interference contrast microscopy * Dielectric spectroscopy * DLS – Dynamic light scattering * DLTS –

Deep-level transient spectroscopy Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the mater ...

* DMA – Dynamic mechanical analysis * DPI – Dual polarisation interferometry * DRS –

Diffuse reflection spectroscopy Diffusion is the net movement of anything (for example, atoms, ions, molecules, energy) generally from a region of higher concentration to a region of lower concentration. Diffusion is driven by a gradient in Gibbs free energy or chemical p ...

* DSC – Differential scanning calorimetry * DTA – Differential thermal analysis * DVS –

Dynamic vapour sorption Dynamic vapor sorption (DVS) is a gravimetric analysis, gravimetric technique that measures how quickly and how much of a solvent is absorbed by a sample: such as a dry powder absorbing water. It does this by varying the vapor concentration surround ...

E

* EBIC – Electron beam induced current (see IBIC: ion beam induced charge) * EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS) * EBSD –

Electron backscatter diffraction Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide info ...

* ECOSY –

Exclusive correlation spectroscopy Exclusive correlation spectroscopy (ECOSY) is an NMR correlation experiment introduced by O. W. Sørensen, Christian Griesinger, Richard R. Ernst and coworkers for the accurate measurement of small J-coupling In nuclear chemistry and nuclear phy ...

* ECT –

Electrical capacitance tomography Electrical capacitance tomography (ECT) is a method for determination of the dielectric permittivity distribution in the interior of an object from external capacitance measurements. It is a close relative of electrical impedance tomography and ...

* EDAX – Energy-dispersive analysis of x-rays * EDMR – Electrically detected magnetic resonance, see ESR or EPR * EDS or EDX – Energy dispersive X-ray spectroscopy * EELS –

Electron energy loss spectroscopy In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their pa ...

* EFTEM – Energy filtered transmission electron microscopy * EID –

Electron induced desorption The electron (, or in nuclear reactions) is a subatomic particle with a negative one elementary electric charge. Electrons belong to the first generation of the lepton particle family, and are generally thought to be elementary particles ...

* EIT and ERT – Electrical impedance tomography and electrical resistivity tomography * EL –

Electroluminescence Electroluminescence (EL) is an optical and electrical phenomenon, in which a material emits light in response to the passage of an electric current or to a strong electric field. This is distinct from black body light emission resulting fr ...

* Electron crystallography * ELS – Electrophoretic light scattering * ENDOR – Electron nuclear double resonance, see ESR or EPR * EPMA –

Electron probe microanalysis An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It ...

* EPR – Electron paramagnetic resonance spectroscopy * ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis * ESCA – Electron spectroscopy for chemical analysis see XPS * ESD – Electron stimulated desorption * ESEM – Environmental scanning electron microscopy * ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry * ESR –

Electron spin resonance spectroscopy Electron paramagnetic resonance (EPR) or electron spin resonance (ESR) spectroscopy is a method for studying materials that have unpaired electrons. The basic concepts of EPR are analogous to those of nuclear magnetic resonance (NMR), but the s ...

* ESTM – Electrochemical scanning tunneling microscopy * EXAFS – Extended X-ray absorption fine structure * EXSY – Exchange spectroscopy

F

* FCS – Fluorescence correlation spectroscopy * FCCS – Fluorescence cross-correlation spectroscopy * FEM –

Field emission microscopy Field-emission microscopy (FEM) is an analytical technique used in materials science to investigate molecular surface structures and their electronic properties. Invented by Erwin Wilhelm Müller in 1936, the FEM was one of the first surface-analy ...

* FIB – Focused ion beam microscopy * FIM-AP – Field ion microscopy– atom probe * Flow birefringence *

Fluorescence anisotropy Fluorescence anisotropy or fluorescence polarization is the phenomenon where the light emitted by a fluorophore has unequal intensities along different axes of polarization. Early pioneers in the field include Aleksander Jablonski, Gregorio Webe ...

* FLIM –

Fluorescence lifetime imaging Fluorescence-lifetime imaging microscopy or FLIM is an imaging technique based on the differences in the exponential decay rate of the photon emission of a fluorophore from a sample. It can be used as an imaging technique in confocal microscopy, t ...

* Fluorescence microscopy * FOSPM – Feature-oriented scanning probe microscopy * FRET –

Fluorescence resonance energy transfer Fluorescence is the emission of light by a substance that has absorbed light or other electromagnetic radiation. It is a form of luminescence. In most cases, the emitted light has a longer wavelength, and therefore a lower photon energy, tha ...

* FRS – Forward Recoil Spectrometry, a synonym of

ERD ERD may refer to: * Érd, a city in Hungary * Berdyansk Airport, in Ukraine * Economic Relations Division (Bangladesh), of the Bangladeshi Ministry of Finance * Elastic recoil detection * Emergency repair disk * Emergency Reserve Decoration, a Bri ...

* FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry * FTIR – Fourier-transform infrared spectroscopy

G

* GC-MS – Gas chromatography-mass spectrometry * GDMS – Glow discharge mass spectrometry * GDOS – Glow discharge optical spectroscopy * GISAXS – Grazing incidence small angle X-ray scattering * GIXD –

Grazing incidence X-ray diffraction Grazing incidence X-ray and neutron diffraction (GID, GIXD, GIND), typically from a crystalline structure uses small incident angles for the incoming X-ray or neutron beam, so that diffraction can be made surface sensitive. It is used to study sur ...

* GIXR – Grazing incidence X-ray reflectivity * GLC – Gas-liquid chromatography

H

* HAADF – High angle

annular dark-field imaging Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector. Conventional TEM dark-field imagi ...

* HAS – Helium atom scattering * HPLC – High performance liquid chromatography * HREELS – High resolution electron energy loss spectroscopy * HREM –

High-resolution electron microscopy High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. It is a powerful tool to study properties of materials on the ...

* HRTEM – High-resolution transmission electron microscopy * HI-ERDA – Heavy-ion elastic recoil detection analysis * HE-PIXE – High-energy proton induced X-ray emission

I

* IAES –

Ion induced Auger electron spectroscopy A Hanford scientist uses an Auger electron spectrometer to determine the elemental composition of surfaces. Auger electron spectroscopy (AES; pronounced in French) is a common analytical technique used specifically in the study of surfaces and, ...

* IBA –

Ion beam analysis Ion beam analysis ("IBA") is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition and obtain elemental depth profiles in the near-surface layer of solids. All IBA methods are highly sensi ...

* IBIC –

Ion beam induced charge An ion () is an atom or molecule with a net electrical charge. The charge of an electron is considered to be negative by convention and this charge is equal and opposite to the charge of a proton, which is considered to be positive by conven ...

microscopy * ICP-AES – Inductively coupled plasma atomic emission spectroscopy * ICP-MS – Inductively coupled plasma mass spectrometry * Immunofluorescence * ICR – Ion cyclotron resonance * IETS – Inelastic electron tunneling spectroscopy * IGA – Intelligent gravimetric analysis * IGF – Inert gas fusion * IIX – Ion induced X-ray analysis, see particle induced X-ray emission * INS – Ion neutralization spectroscopy * Inelastic neutron scattering * IRNDT – Infrared non-destructive testing of materials * IRS – Infrared spectroscopy * ISS – Ion scattering spectroscopy * ITC – Isothermal titration calorimetry * IVEM – Intermediate voltage electron microscopy

L

* LALLS –

Low-angle laser light scattering Low-angle laser light scattering or LALLS is an application of light scattering that is particularly useful in conjunction with the technique of Size exclusion chromatography, one of the most powerful and widely used techniques to study the Molecula ...

* LC-MS – Liquid chromatography-mass spectrometry * LEED – Low-energy electron diffraction * LEEM – Low-energy electron microscopy * LEIS –

Low-energy ion scattering Low-energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface-sensitive analytical technique used to characterize the chemical and structural makeup of materials. LEIS involves d ...

* LIBS – Laser induced breakdown spectroscopy * LOES – Laser optical emission spectroscopy * LS – Light (Raman) scattering

M

* MALDI – Matrix-assisted laser desorption/ionization * MBE – Molecular beam epitaxy * MEIS – Medium energy ion scattering * MFM – Magnetic force microscopy * MIT –

Magnetic induction tomography Magnetic induction tomography is an imaging technique used to image electromagnetic properties of an object by using the eddy current effect. It is also called electromagnetic induction tomography, electromagnetic tomography (EMT), eddy current to ...

* MPM –

Multiphoton fluorescence microscopy Two-photon excitation microscopy (TPEF or 2PEF) is a fluorescence imaging technique that allows imaging of living tissue up to about one millimeter in thickness, with 0.64 μm lateral and 3.35 μm axial spatial resolution. Unlike traditional flu ...

* MRFM – Magnetic resonance force microscopy * MRI – Magnetic resonance imaging * MS – Mass spectrometry * MS/MS – Tandem mass spectrometry * MSGE – Mechanically stimulated gas emission * Mössbauer spectroscopy * MTA – Microthermal analysis

N

* NAA –

Neutron activation analysis Neutron activation analysis (NAA) is the nuclear process used for determining the concentrations of elements in many materials. NAA allows discrete sampling of elements as it disregards the chemical form of a sample, and focuses solely on atomic ...

* ND – Neutron diffraction * NDP –

Neutron depth profiling Neutron depth profiling (NDP) is a near-surface analysis technique that is commonly used to obtain profiles of concentration as a function of depth for certain technologically important light elements in nearly any substrate. The technique was first ...

* NEXAFS – Near edge X-ray absorption fine structure * NIS – Nuclear inelastic scattering/absorption * NMR – Nuclear magnetic resonance spectroscopy * NOESY – Nuclear Overhauser effect spectroscopy * NRA – Nuclear reaction analysis * NSOM – Near-field optical microscopy

O

* OBIC –

Optical beam induced current Optical beam induced current (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may b ...

* ODNMR – Optically detected magnetic resonance, see ESR or EPR * OES – Optical emission spectroscopy *

Osmometry An osmometer is a device for measuring the osmotic strength of a solution, colloid, or compound. There are several different techniques employed in osmometry: * Vapor pressure osmometers determine the concentration of osmotically active particle ...

P

* PAS – Positron annihilation spectroscopy *

Photoacoustic spectroscopy Photoacoustic spectroscopy is the measurement of the effect of absorbed electromagnetic energy (particularly of light) on matter by means of acoustic detection. The discovery of the photoacoustic effect dates to 1880 when Alexander Graham Bell s ...

* PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography * PAX –

Photoemission of adsorbed xenon The photoelectric effect is the emission of electrons when electromagnetic radiation, such as light, hits a material. Electrons emitted in this manner are called photoelectrons. The phenomenon is studied in condensed matter physics, and solid ...

* PC or PCS – Photocurrent spectroscopy * Phase contrast microscopy * PhD – Photoelectron diffraction * PD – Photodesorption * PDEIS – Potentiodynamic electrochemical impedance spectroscopy * PDS –

Photothermal deflection spectroscopy Photothermal spectroscopy is a group of high sensitivity spectroscopy techniques used to measure optical absorption and thermal characteristics of a sample. The basis of photothermal spectroscopy is the change in thermal state of the sample resultin ...

* PED – Photoelectron diffraction * PEELS – parallel

electron energy loss spectroscopy In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their pa ...

* PEEM – Photoemission electron microscopy (or photoelectron emission microscopy) * PES – Photoelectron spectroscopy * PINEM –

photon-induced near-field electron microscopy Photon-Induced Near-field Electron Microscopy (PINEM) is a variant of the Ultrafast Transmission Electron Microscopy technique and is based on the inelastic coupling between electrons and photons in presence of a surface or a nanostructure. This m ...

* PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis * PIXE – Particle (or proton) induced X-ray spectroscopy * PL – Photoluminescence * Porosimetry * Powder diffraction * PTMS –

Photothermal microspectroscopy Photothermal microspectroscopy (PTMS), alternatively known as photothermal temperature fluctuation (PTTF), is derived from two parent instrumental techniques: infrared spectroscopy and atomic force microscopy (AFM). In one particular type of AFM, kn ...

* PTS –

Photothermal spectroscopy Photothermal spectroscopy is a group of high sensitivity spectroscopy techniques used to measure optical absorption and thermal characteristics of a sample. The basis of photothermal spectroscopy is the change in thermal state of the sample resultin ...

Q

* QENS – Quasielastic neutron scattering * QCM-D –

Quartz crystal microbalance with dissipation monitoring Within surface science, a quartz crystal microbalance with dissipation monitoring (QCM-D) is a type of quartz crystal microbalance (QCM) based on the ring-down technique. It is used in interfacial acoustic sensing. Its most common application is t ...

R

* Raman spectroscopy * RAXRS – Resonant anomalous X-ray scattering * RBS – Rutherford backscattering spectrometry * REM – Reflection electron microscopy * RDS – Reflectance difference spectroscopy * RHEED – Reflection high energy electron diffraction * RIMS – Resonance ionization mass spectrometry * RIXS – Resonant inelastic X-ray scattering * RR spectroscopy – Resonance Raman spectroscopy

S

* SAD – Selected area diffraction * SAED – Selected area electron diffraction * SAM – Scanning Auger microscopy * SANS – Small angle neutron scattering * SAXS – Small angle X-ray scattering * SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation * SCEM – Scanning confocal electron microscopy * SE – Spectroscopic ellipsometry * SEC – Size exclusion chromatography * SEIRA –

Surface enhanced infrared absorption spectroscopy A surface, as the term is most generally used, is the outermost or uppermost layer of a physical object or space. It is the portion or region of the object that can first be perceived by an observer using the senses of sight and touch, and is ...

* SEM – Scanning electron microscopy * SERS – Surface enhanced Raman spectroscopy * SERRS – Surface enhanced resonance Raman spectroscopy * SESANS – Spin Echo Small Angle Neutron Scattering * SEXAFS – Surface extended X-ray absorption fine structure * SICM – Scanning ion-conductance microscopy * SIL – Solid immersion lens * SIM –

Solid immersion mirror Solid is one of the four fundamental states of matter (the others being liquid, gas, and plasma). The molecules in a solid are closely packed together and contain the least amount of kinetic energy. A solid is characterized by structural ri ...

* SIMS – Secondary ion mass spectrometry * SNMS – Sputtered neutral species mass spectrometry * SNOM – Scanning near-field optical microscopy * SPECT –

Single-photon emission computed tomography Single-photon emission computed tomography (SPECT, or less commonly, SPET) is a nuclear medicine tomographic imaging technique using gamma rays. It is very similar to conventional nuclear medicine planar imaging using a gamma camera (that is, ...

* SPM – Scanning probe microscopy * SRM-CE/MS – Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry * SSNMR – Solid-state nuclear magnetic resonance * Stark spectroscopy * STED –

Stimulated emission depletion microscopy Stimulated emission depletion (STED) microscopy is one of the techniques that make up super-resolution microscopy. It creates super-resolution images by the selective deactivation of fluorophores, minimizing the area of illumination at the focal p ...

* STEM – Scanning transmission electron microscopy * STM – Scanning tunneling microscopy * STS –

Scanning tunneling spectroscopy Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons in a sample as a function of their energy. In scanning tunneling microscopy, a metal tip i ...

* SXRD – Surface X-ray diffraction

T

* TAT or TACT – Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography – PAT) * TEM –

Transmission electron microscopy Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a gr ...

* TGA – Thermogravimetric analysis * TIKA – Transmitting ion kinetic analysis * TIMS – Thermal ionization mass spectrometry * TIRFM – Total internal reflection fluorescence microscopy * TLS – Photothermal lens spectroscopy, a type of

photothermal spectroscopy Photothermal spectroscopy is a group of high sensitivity spectroscopy techniques used to measure optical absorption and thermal characteristics of a sample. The basis of photothermal spectroscopy is the change in thermal state of the sample resultin ...

* TMA – Thermomechanical analysis * TOF-MS – Time-of-flight mass spectrometry * Two-photon excitation microscopy * TXRF – Total reflection X-ray fluorescence analysis

U

* Ultrasound attenuation spectroscopy * UPS – UV-photoelectron spectroscopy * USANS – Ultra small-angle neutron scattering * USAXS – Ultra small-angle X-ray scattering * UT – Ultrasonic testing * UV-Vis – Ultraviolet–visible spectroscopy

V

* VEDIC – Video-enhanced differential interference contrast microscopy * Voltammetry

W

* WAXS – Wide angle X-ray scattering * WDX or WDS – Wavelength dispersive X-ray spectroscopy

X

* XAES – X-ray induced Auger electron spectroscopy * XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure) * XAS – X-ray absorption spectroscopy * X-CTR – X-ray crystal truncation rod scattering *

X-ray crystallography X-ray crystallography is the experimental science determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angle ...

* XDS –

X-ray diffuse scattering X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observi ...

* XPEEM – X-ray photoelectron emission microscopy * XPS – X-ray photoelectron spectroscopy * XRD – X-ray diffraction * XRES –

X-ray resonant exchange scattering X-rays (or rarely, ''X-radiation'') are a form of high-energy electromagnetic radiation. In many languages, it is referred to as Röntgen radiation, after the German scientist Wilhelm Conrad Röntgen, who discovered it in 1895 and named it '' ...

* XRF – X-ray fluorescence analysis * XRR –

X-ray reflectivity X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.J ...

* XRS –

X-ray Raman scattering X-ray Raman scattering (XRS) is non-resonant inelastic scattering of X-rays from core electrons. It is analogous to vibrational Raman scattering, which is a widely used tool in optical spectroscopy, with the difference being that the wavelengths o ...

* XSW –

X-ray standing wave The X-ray standing wave (XSW) technique can be used to study the structure of surfaces and interfaces with high spatial resolution and chemical selectivity. Pioneered by B.W. Batterman in the 1960s, the availability of synchrotron light has stimulat ...

technique

References

* * {{cite book , editor=Yao, N , title=Focused Ion Beam Systems: Basics and Applications , publisher=Cambridge University Press , location=Cambridge, UK , year=2007 , isbn=978-0-521-83199-4 Materials analysis methods Analytical chemistry Materials analysis methods Materials analysis methods

Symbols

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B

C

D

E

F

G

H

I

L

M

N

O

P

Q

R

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W

X

See also

References