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EBSD In Process
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material. These types of studies have been carried out using X-ray diffraction (XRD), neutron diffraction and/or electron diffraction in a Transmission electron microscope and spatially resolved acoustic spectroscopy ( SRAS) which analyses elastic waves instead of analysing a diffraction event. The choice of which technique is adopted depends upon various factors, including spatial resolution, area/volume analysed, and whether the measurements are static or dynamical. Geometry For an EBSD measurement a flat/polished crystalline specimen is placed in the SEM chamber at a highly tilted angle (~70° from horizontal) towards the diffraction camera, to increase the co ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Ebsd
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material. These types of studies have been carried out using X-ray diffraction (XRD), neutron diffraction and/or electron diffraction in a Transmission electron microscope and spatially resolved acoustic spectroscopy ( SRAS) which analyses elastic waves instead of analysing a diffraction event. The choice of which technique is adopted depends upon various factors, including spatial resolution, area/volume analysed, and whether the measurements are static or dynamical. Geometry For an EBSD measurement a flat/polished crystalline specimen is placed in the SEM chamber at a highly tilted angle (~70° from horizontal) towards the diffraction camera, to increase the ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fluorescence
Fluorescence is the emission of light by a substance that has absorbed light or other electromagnetic radiation. It is a form of luminescence. In most cases, the emitted light has a longer wavelength, and therefore a lower photon energy, than the absorbed radiation. A perceptible example of fluorescence occurs when the absorbed radiation is in the ultraviolet region of the electromagnetic spectrum (invisible to the human eye), while the emitted light is in the visible region; this gives the fluorescent substance a distinct color that can only be seen when the substance has been exposed to UV light. Fluorescent materials cease to glow nearly immediately when the radiation source stops, unlike phosphorescent materials, which continue to emit light for some time after. Fluorescence has many practical applications, including mineralogy, gemology, medicine, chemical sensors (fluorescence spectroscopy), fluorescent labelling, dyes, biological detectors, cosmic-ray detection, vacu ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Cathodoluminescence
Cathodoluminescence is an optical and electromagnetic phenomenon in which electrons impacting on a luminescent material such as a phosphor, cause the emission of photons which may have wavelengths in the visible spectrum. A familiar example is the generation of light by an electron beam scanning the phosphor-coated inner surface of the screen of a television that uses a cathode ray tube. Cathodoluminescence is the inverse of the photoelectric effect, in which electron emission is induced by irradiation with photons. Origin Luminescence in a semiconductor results when an electron in the conduction band recombines with a hole in the valence band. The difference energy (band gap) of this transition can be emitted in form of a photon. The energy (color) of the photon, and the probability that a photon and not a phonon will be emitted, depends on the material, its purity, and the presence of defects. First, the electron has to be excited from the valence band into the conduction ba ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Nanometers
330px, Different lengths as in respect to the molecular scale. The nanometre (international spelling as used by the International Bureau of Weights and Measures; SI symbol: nm) or nanometer (American and British English spelling differences#-re, -er, American spelling) is a units of measurement, unit of length in the International System of Units (SI), equal to one billionth (short scale) of a metre () and to 1000 picometres. One nanometre can be expressed in scientific notation as , and as metres. History The nanometre was formerly known as the millimicrometre – or, more commonly, the millimicron for short – since it is of a micron (micrometre), and was often denoted by the symbol mμ or (more rarely and confusingly, since it logically should refer to a ''millionth'' of a micron) as μμ. Etymology The name combines the SI prefix ''nano-'' (from the Ancient Greek , ', "dwarf") with the parent unit name ''metre'' (from Greek , ', "unit of measurement"). ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Micrometre
The micrometre ( international spelling as used by the International Bureau of Weights and Measures; SI symbol: μm) or micrometer (American spelling), also commonly known as a micron, is a unit of length in the International System of Units (SI) equalling (SI standard prefix "micro-" = ); that is, one millionth of a metre (or one thousandth of a millimetre, , or about ). The nearest smaller common SI unit is the nanometre, equivalent to one thousandth of a micrometre, one millionth of a millimetre or one billionth of a metre (). The micrometre is a common unit of measurement for wavelengths of infrared radiation as well as sizes of biological cells and bacteria, and for grading wool by the diameter of the fibres. The width of a single human hair ranges from approximately 20 to . The longest human chromosome, chromosome 1, is approximately in length. Examples Between 1 μm and 10 μm: * 1–10 μm – length of a typical bacterium * 3–8 μm – width of ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Energy-dispersive X-ray Spectroscopy
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum (which is the main principle of spectroscopy). The peak positions are predicted by the Moseley's law with accuracy much better than experimental resolution of a typical EDX instrument. To stimulate the emission of characteristic X-rays from a specimen a beam of electrons is focused into the sample being studied. At rest, an atom within the sample contains ground state (or unexcited) electrons in discrete energy levels or electron ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Misorientation
In materials science, misorientation is the difference in crystallographic orientation between two crystallites in a polycrystalline material. In crystalline materials, the orientation of a crystallite is defined by a transformation from a sample reference frame (i.e. defined by the direction of a rolling or extrusion process and two orthogonal directions) to the local reference frame of the crystalline lattice, as defined by the basis of the unit cell. In the same way, misorientation is the transformation necessary to move from one local crystal frame to some other crystal frame. That is, it is the distance in orientation space between two distinct orientations. If the orientations are specified in terms of matrices of direction cosines and , then the misorientation operator going from to can be defined as follows: :\begin & g_B = \Delta g_ g_A \\ & \Delta g_ = g_B g_A^ \end where the term is the reverse operation of , that is, transformation from crystal frame back t ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Sample After EBSD
Sample or samples may refer to: Base meaning * Sample (statistics), a subset of a population – complete data set * Sample (signal), a digital discrete sample of a continuous analog signal * Sample (material), a specimen or small quantity of something * Sample (graphics), an intersection of a color channel and a pixel * SAMPLE history, a mnemonic acronym for questions medical first responders should ask * Product sample, a sample of a consumer product that is given to the consumer so that he or she may try a product before committing to a purchase * Standard cross-cultural sample, a sample of 186 cultures, used by scholars engaged in cross-cultural studies People *Sample (surname) *Samples (surname) * Junior Samples (1926–1983), American comedian Places * Sample, Kentucky, unincorporated community, United States * Sampleville, Ohio, unincorporated community, United States * Hugh W. and Sarah Sample House, listed on the National Register of Historic Places in Iowa, United Sta ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
EBSD In Process
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material. These types of studies have been carried out using X-ray diffraction (XRD), neutron diffraction and/or electron diffraction in a Transmission electron microscope and spatially resolved acoustic spectroscopy ( SRAS) which analyses elastic waves instead of analysing a diffraction event. The choice of which technique is adopted depends upon various factors, including spatial resolution, area/volume analysed, and whether the measurements are static or dynamical. Geometry For an EBSD measurement a flat/polished crystalline specimen is placed in the SEM chamber at a highly tilted angle (~70° from horizontal) towards the diffraction camera, to increase the co ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Valerie Randle
Valerie Randle is a materials engineer who specialised in electron backscatter diffraction, grain boundary engineering, and has written a number of text books on the subject She was Welsh Woman of the Year in 1998 and in the same year was awarded the Rosenhain Award for achievements in Materials Science by the Institute of Materials, Minerals and Mining. In 2004 she was invited as a guest of HM the Queen to a luncheon at Buckingham Palace for the 'top 180 female achievers in the country'. From 2008 she has been included in Who's Who. as part of increasing public recognition of scientists. She has made significant contributions in the field of materials engineering with over 150 indexed publications in the field. Career Randle entered Cardiff University at the age of 27 to study chemistry, and found that the metallurgy module sparked her interest in materials. She then did a PhD and eventually was awarded a Royal Society Research Fellowship which took her to Swansea Univ ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Hough Transform
The Hough transform is a feature extraction technique used in image analysis, computer vision, and digital image processing. The purpose of the technique is to find imperfect instances of objects within a certain class of shapes by a voting procedure. This voting procedure is carried out in a parameter space, from which object candidates are obtained as local maxima in a so-called accumulator space that is explicitly constructed by the algorithm for computing the Hough transform. The classical Hough transform was concerned with the identification of lines in the image, but later the Hough transform has been extended to identifying positions of arbitrary shapes, most commonly circles or ellipses. The Hough transform as it is universally used today was invented by Richard Duda and Peter Hart in 1972, who called it a "generalized Hough transform" after the related 1962 patent of Paul Hough. The transform was popularized in the computer vision community by Dana H. Ballard thro ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Structure Factor
In condensed matter physics and crystallography, the static structure factor (or structure factor for short) is a mathematical description of how a material scatters incident radiation. The structure factor is a critical tool in the interpretation of scattering patterns (interference patterns) obtained in X-ray, electron and neutron diffraction experiments. Confusingly, there are two different mathematical expressions in use, both called 'structure factor'. One is usually written S(\mathbf); it is more generally valid, and relates the observed diffracted intensity per atom to that produced by a single scattering unit. The other is usually written F or F_ and is only valid for systems with long-range positional order — crystals. This expression relates the amplitude and phase of the beam diffracted by the (hk\ell) planes of the crystal ((hk\ell) are the Miller indices of the planes) to that produced by a single scattering unit at the vertices of the primitive unit cell. F_ is ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
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