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EBSD
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material. These types of studies have been carried out using X-ray diffraction (XRD), neutron diffraction and/or electron diffraction in a Transmission electron microscope and spatially resolved acoustic spectroscopy ( SRAS) which analyses elastic waves instead of analysing a diffraction event.  The choice of which technique is adopted depends upon various factors, including spatial resolution, area/volume analysed, and whether the measurements are static or dynamical. Geometry For an EBSD measurement a flat/polished crystalline specimen is placed in the SEM chamber at a highly tilted angle (~70° from horizontal) towards the diffraction camera, to increase the ...
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Ebsd
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material. These types of studies have been carried out using X-ray diffraction (XRD), neutron diffraction and/or electron diffraction in a Transmission electron microscope and spatially resolved acoustic spectroscopy ( SRAS) which analyses elastic waves instead of analysing a diffraction event.  The choice of which technique is adopted depends upon various factors, including spatial resolution, area/volume analysed, and whether the measurements are static or dynamical. Geometry For an EBSD measurement a flat/polished crystalline specimen is placed in the SEM chamber at a highly tilted angle (~70° from horizontal) towards the diffraction camera, to increase the ...
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EBSD Si
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material. These types of studies have been carried out using X-ray diffraction (XRD), neutron diffraction and/or electron diffraction in a Transmission electron microscope and spatially resolved acoustic spectroscopy ( SRAS) which analyses elastic waves instead of analysing a diffraction event.  The choice of which technique is adopted depends upon various factors, including spatial resolution, area/volume analysed, and whether the measurements are static or dynamical. Geometry For an EBSD measurement a flat/polished crystalline specimen is placed in the SEM chamber at a highly tilted angle (~70° from horizontal) towards the diffraction camera, to increase the co ...
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EBSD In Process
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure, crystal orientation, phase, or strain in the material. These types of studies have been carried out using X-ray diffraction (XRD), neutron diffraction and/or electron diffraction in a Transmission electron microscope and spatially resolved acoustic spectroscopy ( SRAS) which analyses elastic waves instead of analysing a diffraction event.  The choice of which technique is adopted depends upon various factors, including spatial resolution, area/volume analysed, and whether the measurements are static or dynamical. Geometry For an EBSD measurement a flat/polished crystalline specimen is placed in the SEM chamber at a highly tilted angle (~70° from horizontal) towards the diffraction camera, to increase the co ...
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Electron Diffraction
Electron diffraction refers to the bending of electron beams around atomic structures. This behaviour, typical for waves, is applicable to electrons due to the wave–particle duality stating that electrons behave as both particles and waves. Since the diffracted beams interfere, they generate diffraction patterns widely used for analysis of the objects which caused the diffraction. Therefore, electron diffraction can also refer to derived experimental techniques used for material characterization. This technique is similar to X-ray and neutron diffraction. Electron diffraction is most frequently used in solid state physics and chemistry to study crystalline, quasi-crystalline and amorphous materials using electron microscopes. In these instruments, electrons are accelerated by an electrostatic potential in order to gain energy and shorten their wavelength. With the wavelength sufficiently short, the atomic structure acts as a diffraction grating generating diffraction patte ...
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Texture (crystalline)
In physical chemistry and materials science, texture is the distribution of crystallographic orientations of a polycrystalline sample (it is also part of the geological fabric). A sample in which these orientations are fully random is said to have no distinct texture. If the crystallographic orientations are not random, but have some preferred orientation, then the sample has a weak, moderate or strong texture. The degree is dependent on the percentage of crystals having the preferred orientation. Texture is seen in almost all engineered materials, and can have a great influence on materials properties. The texture forms in materials during thermo-mechanical processes, for example during production processes e.g. rolling. Consequently, the rolling process is often followed by a heat treatment to reduce the amount of unwanted texture. Controlling the production process in combination with the characterization of texture and the material's microstructure help to determine the materi ...
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Kikuchi Band
Kikuchi lines are patterns of electrons formed by scattering. They pair up to form bands in electron diffraction from single crystal specimens, there to serve as "roads in orientation-space" for microscopists uncertain of what they are looking at. In transmission electron microscopes, they are easily seen in diffraction from regions of the specimen thick enough for multiple scattering. Unlike diffraction spots, which blink on and off as one tilts the crystal, Kikuchi bands mark orientation space with well-defined intersections (called zones or poles) as well as paths connecting one intersection to the next. Experimental and theoretical maps of Kikuchi band geometry, as well as their direct-space analogs e.g. bend contours, electron channeling patterns, and fringe visibility maps are increasingly useful tools in electron microscopy of crystalline and nanocrystalline materials. Because each Kikuchi line is associated with Bragg diffraction from one side of a single set of lattice pl ...
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Crystallography
Crystallography is the experimental science of determining the arrangement of atoms in crystalline solids. Crystallography is a fundamental subject in the fields of materials science and solid-state physics (condensed matter physics). The word "crystallography" is derived from the Greek word κρύσταλλος (''krystallos'') "clear ice, rock-crystal", with its meaning extending to all solids with some degree of transparency, and γράφειν (''graphein'') "to write". In July 2012, the United Nations recognised the importance of the science of crystallography by proclaiming that 2014 would be the International Year of Crystallography. denote a direction vector (in real space). * Coordinates in ''angle brackets'' or ''chevrons'' such as <100> denote a ''family'' of directions which are related by symmetry operations. In the cubic crystal system for example, would mean 00 10 01/nowiki> or the negative of any of those directions. * Miller indices in ''parentheses'' ...
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SRAS
SRAS (spatially resolved acoustic spectroscopy) a non-destructive acoustic microscopy microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure and crystallographic orientation of the material. Traditionally, the information provided by SRAS has been acquired by using diffraction techniques in electron microscopy - such as EBSD. The technique was patented in 2005, . SRAS measures the surface acoustic wave velocity across a specimen, the surface acoustic wave (SAW) velocity is in turn a function of the material state, including parameters such as crystallographic orientation, elastic constants, temperature and stress. Measurement In a SRAS measurement, as in most laser ultrasound techniques, two lasers are used, one for the generation of acoustic waves and one for the subsequent detection of these waves.  Considering first the generation of acou ...
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Nanometers
330px, Different lengths as in respect to the molecular scale. The nanometre (international spelling as used by the International Bureau of Weights and Measures; SI symbol: nm) or nanometer (American and British English spelling differences#-re, -er, American spelling) is a units of measurement, unit of length in the International System of Units (SI), equal to one billionth (short scale) of a metre () and to 1000 picometres. One nanometre can be expressed in scientific notation as , and as  metres. History The nanometre was formerly known as the millimicrometre – or, more commonly, the millimicron for short – since it is of a micron (micrometre), and was often denoted by the symbol mμ or (more rarely and confusingly, since it logically should refer to a ''millionth'' of a micron) as μμ. Etymology The name combines the SI prefix ''nano-'' (from the Ancient Greek , ', "dwarf") with the parent unit name ''metre'' (from Greek , ', "unit of measurement"). ...
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Micrometre
The micrometre ( international spelling as used by the International Bureau of Weights and Measures; SI symbol: μm) or micrometer (American spelling), also commonly known as a micron, is a unit of length in the International System of Units (SI) equalling (SI standard prefix "micro-" = ); that is, one millionth of a metre (or one thousandth of a millimetre, , or about ). The nearest smaller common SI unit is the nanometre, equivalent to one thousandth of a micrometre, one millionth of a millimetre or one billionth of a metre (). The micrometre is a common unit of measurement for wavelengths of infrared radiation as well as sizes of biological cells and bacteria, and for grading wool by the diameter of the fibres. The width of a single human hair ranges from approximately 20 to . The longest human chromosome, chromosome 1, is approximately in length. Examples Between 1 μm and 10 μm: * 1–10 μm – length of a typical bacterium * 3–8 μm – width of ...
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Energy-dispersive X-ray Spectroscopy
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum (which is the main principle of spectroscopy). The peak positions are predicted by the Moseley's law with accuracy much better than experimental resolution of a typical EDX instrument. To stimulate the emission of characteristic X-rays from a specimen a beam of electrons is focused into the sample being studied. At rest, an atom within the sample contains ground state (or unexcited) electrons in discrete energy levels or electron ...
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Misorientation
In materials science, misorientation is the difference in crystallographic orientation between two crystallites in a polycrystalline material. In crystalline materials, the orientation of a crystallite is defined by a transformation from a sample reference frame (i.e. defined by the direction of a rolling or extrusion process and two orthogonal directions) to the local reference frame of the crystalline lattice, as defined by the basis of the unit cell. In the same way, misorientation is the transformation necessary to move from one local crystal frame to some other crystal frame. That is, it is the distance in orientation space between two distinct orientations. If the orientations are specified in terms of matrices of direction cosines and , then the misorientation operator going from to can be defined as follows: :\begin & g_B = \Delta g_ g_A \\ & \Delta g_ = g_B g_A^ \end where the term is the reverse operation of , that is, transformation from crystal frame back t ...
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