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Device Under Test
A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification. Electronics testing In the electronics industry a DUT is any electronic assembly under test. For example, cell phones coming off of an assembly line may be given a final test in the same way as the individual chips were earlier tested. Each cell phone under test is, briefly, the DUT. For circuit boards, the DUT is often connected to the test equipment using a bed of nails tester of pogo pins. Semiconductor testing In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Printed Circuit Board
A printed circuit board (PCB; also printed wiring board or PWB) is a medium used in Electrical engineering, electrical and electronic engineering to connect electronic components to one another in a controlled manner. It takes the form of a Lamination, laminated sandwich structure of conductive and insulating layers: each of the conductive layers is designed with an artwork pattern of traces, planes and other features (similar to wires on a flat surface) Chemical milling, etched from one or more sheet layers of copper Lamination, laminated onto and/or between sheet layers of a Insulator (electricity), non-conductive substrate. Electrical components may be fixed to conductive pads on the outer layers in the shape designed to accept the component's terminals, generally by means of soldering, to both electrically connect and mechanically fasten them to it. Another manufacturing process adds Via (electronics), vias: plated-through holes that allow interconnections between layers. ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Equipment
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. Where it is used ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test avionics and the electronic modules in automobiles. It is used in military applications like radar and wireless communication. In the semiconductor industry Semiconductor ATE, named for testing se ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Engineering
Electronics engineering is a sub-discipline of electrical engineering which emerged in the early 20th century and is distinguished by the additional use of active components such as semiconductor devices to amplify and control electric current flow. Previously electrical engineering only used passive devices such as mechanical switches, resistors, inductors and capacitors. It covers fields such as: analog electronics, digital electronics, consumer electronics, embedded systems and power electronics. It is also involved in many related fields, for example solid-state physics, radio engineering, telecommunications, control systems, signal processing, systems engineering, computer engineering, instrumentation engineering, electric power control, robotics. The Institute of Electrical and Electronics Engineers (IEEE) is one of the most important professional bodies for electronics engineers in the US; the equivalent body in the UK is the Institution of Engineering and Technology ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Semiconductor Device Fabrication
Semiconductor device fabrication is the process used to manufacture semiconductor devices, typically integrated circuit (IC) chips such as modern computer processors, microcontrollers, and memory chips such as NAND flash and DRAM that are present in everyday electrical and electronics, electronic devices. It is a multiple-step sequence of Photolithography, photolithographic and chemical processing steps (such as surface passivation, thermal oxidation, planar process, planar diffusion and p–n junction isolation, junction isolation) during which electronic circuits are gradually created on a wafer (electronics), wafer made of pure semiconducting material. Silicon is almost always used, but various compound semiconductors are used for specialized applications. The entire manufacturing process takes time, from start to packaged chips ready for shipment, at least six to eight weeks (tape-out only, not including the circuit design) and is performed in highly specialized semiconduct ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Test Bench
A test bench or testing workbench is an environment used to verify the correctness or soundness of a design or model. The term has its roots in the testing of electronic devices, where an engineer would sit at a lab bench with tools for measurement and manipulation, such as oscilloscopes, multimeters, soldering irons, wire cutters, and so on, and manually verify the correctness of the device under test (DUT). In the context of software or firmware or hardware engineering, a test bench is an environment in which the product under development is tested with the aid of software and hardware tools. The software may need to be modified slightly in some cases to work with the test bench but careful coding can ensure that the changes can be undone easily and without introducing bugs. The term "test bench" is used in digital design with a hardware description language to describe the test code, which instantiates the DUT and runs the test. An additional meaning for "test bench" is an i ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
System Under Test
System under test (SUT) refers to a system that is being tested for correct operation. According to ISTQB it is the test object. From a Unit Testing perspective, the SUT represents all of the classes in a test that are not predefined pieces of code like stubs or even mocks. Each one of this can have its own configuration (a name and a version), making it scalable for a series of tests to get more and more precise, according to the quantity of quality of the system in test. See also * Device under test * Test harness In software testing, a test harness or automated test framework is a collection of software and test data configured to test a program unit by running it under varying conditions and monitoring its behavior and outputs. It has two main parts: the te ... References External links xUnit Patterns SUT6 goldene Regeln der Testautomatisierung im Softwaretest(in German) Test Procedure for §170.314(c) Clinical quality measures Software testing Systems engineering ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Product Testing
File:Consumer Reports - product testing - electric light longevity and brightness testing.tif, Testing electric light longevity and brightness testing File:Consumer Reports - product testing - television testing laboratory.tif, Television testing laboratory File:Consumer Reports - product testing - headphones in anechoic chamber.tif, Product testing headphones in an anechoic chamber Product testing, also called consumer testing or comparative testing, is a process of measuring the properties or performance of products. The theory is that since the advent of mass production, manufacturers produce branded products which they assert and advertise to be identical within some technical standard. Product testing seeks to ensure that consumers can understand what products will do for them and which products are the best value. Product testing is a strategy to increase consumer protection by checking the claims made during marketing strategies such as advertising, which by their nature ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
DUT Board
DUT boards are used in automated integrated circuit testing where the term DUT stands for device under test, referring to the circuit being tested. A DUT board is a printed circuit board, and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE). DUT boards are designed to meet both the mechanical and electrical requirements of the particular chip and the specific test equipment to be used. One type of DUT board is used in testing the individual die (or dice) of a silicon wafer before they are cut free and packaged, and another type is used for testing packaged IC's. Synonyms DUT boards are occasionally known as ''DIBs'' (Device Interface Boards), ''probecards'', or ''PIBs'' (Probecard Interface Boards). See also * Probe Card A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober and electrically connec ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Zero Insertion Force
Zero insertion force (ZIF) is a type of IC socket or electrical connector that requires very little (but not literally zero) force for insertion. With a ZIF socket, before the IC is inserted, a lever or slider on the side of the socket is moved, pushing all the sprung contacts apart so that the IC can be inserted with very little force - generally the weight of the IC itself is sufficient and no external downward force is required. The lever is then moved back, allowing the contacts to close and grip the pins of the IC. ZIF sockets are much more expensive than standard IC sockets and also tend to take up a larger board area due to the space taken up by the lever mechanism. Typically, they are only used when there is a good reason to do so. Design A normal integrated circuit (IC) socket requires the IC to be pushed into sprung contacts which then grip by friction. For an IC with hundreds of pins, the total insertion force can be very large (hundreds of newtons), leading ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Bed Of Nails Tester
A bed of nails tester is a traditional electronic test fixture used for in-circuit testing. It has numerous pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires. Named by analogy with a real-world bed of nails, these devices contain an array of small, spring-loaded pogo pins; each pogo pin makes contact with one node in the circuitry of the DUT (device under test). By pressing the DUT down against the bed of nails, reliable contact can be quickly and simultaneously made with hundreds or even thousands of individual test points within the circuitry of the DUT. The hold-down force may be provided manually or by means of a vacuum or a mechanical presser, thus pulling the DUT downwards onto the nails. Devices that have been tested on a bed of nails tester may show evidence of this after the process: small dimp ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Semiconductor Curve Tracer
A semiconductor curve tracer (also known as a semiconductor parameter analyzer) is a specialised piece of electronic test equipment used to analyze the characteristics of discrete semiconductor devices such as diodes, transistors, and thyristors. Based on an oscilloscope, the device also contains voltage and current sources that can be used to stimulate the device under test (DUT). Operation The function is to apply a swept (automatically continuously varying with time) voltage to two terminals of the device under test, and measuring the amount of current that the device permits to flow at each voltage. This so-called V-I (voltage versus current) graph is displayed on an oscilloscope screen. Configuration includes the maximum voltage applied, the polarity of the voltage applied (including the automatic application of both positive and negative polarities), and the resistance inserted in series with the device. The main terminal voltage can often be swept up to several thousand ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Equipment
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. Where it is used ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test avionics and the electronic modules in automobiles. It is used in military applications like radar and wireless communication. In the semiconductor industry Semiconductor ATE, named for testing se ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
