A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification.
Electronics testing
In the electronics industry a DUT is any electronic assembly under test.
For example, cell phones coming off of an assembly line may be given a final test in the same way as the individual chips were earlier tested. Each cell phone under test is, briefly, the DUT.
For
circuit boards
A printed circuit board (PCB; also printed wiring board or PWB) is a medium used in electrical and electronic engineering to connect electronic components to one another in a controlled manner. It takes the form of a laminated sandwich struc ...
, the DUT is often connected to the test equipment using a
bed of nails tester
A bed of nails tester is a traditional electronic test fixture used for in-circuit testing. It has numerous pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact wi ...
of
pogo pin
A pogo pin or spring-loaded pin is a type of electrical connector mechanism that is used in many modern electronic applications and in the electronics testing industry. They are used for their improved durability over other electrical contacts, a ...
s.
Semiconductor testing
In semiconductor testing, the device under test is a
die
Die, as a verb, refers to death, the cessation of life.
Die may also refer to:
Games
* Die, singular of dice, small throwable objects used for producing random numbers
Manufacturing
* Die (integrated circuit), a rectangular piece of a semicondu ...
on a
wafer
A wafer is a crisp, often sweet, very thin, flat, light and dry biscuit, often used to decorate ice cream, and also used as a garnish on some sweet dishes. Wafers can also be made into cookies with cream flavoring sandwiched between them. They ...
or the resulting
packaged part. A connection system is used, connecting the part to
automatic or
manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device. In this way, the tester determines whether the particular device under test meets the device specifications.
While packaged as a wafer,
automatic test equipment (ATE) can connect to the individual units using a set of microscopic needles. Once the chips are sawn apart and packaged, test equipment can connect to the chips using
ZIF sockets (sometimes called ''contactors'').
See also
*
Automatic test equipment
*
DUT board
DUT boards are used in automated integrated circuit testing where the term DUT stands for device under test, referring to the circuit being tested.
A DUT board is a printed circuit board, and is the interface between the integrated circuit and ...
*
Product testing
File:Consumer Reports - product testing - electric light longevity and brightness testing.tif, Testing electric light longevity and brightness testing
File:Consumer Reports - product testing - television testing laboratory.tif, Television testin ...
*
System under test System under test (SUT) refers to a system that is being tested for correct operation. According to ISTQB it is the test object.
From a Unit Testing perspective, the SUT represents all of the classes in a test that are not predefined pieces of co ...
*
Test bench
A test bench or testing workbench is an environment used to verify the correctness or soundness of a design or model.
The term has its roots in the testing of electronic devices, where an engineer would sit at a lab bench with tools for measurem ...
References
Semiconductor device fabrication
Electronic engineering
Hardware testing
Product testing
Automatic test equipment
Environmental testing
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