DUT boards are used in automated
integrated circuit testing where the term DUT stands for
device under test A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibra ...
, referring to the circuit being tested.
A DUT board is a
printed circuit board, and is the interface between the integrated circuit and a test head, which in turn attaches to
automatic test equipment (ATE).
DUT boards are designed to meet both the mechanical and electrical requirements of the particular chip and the specific test equipment to be used. One type of DUT board is used in testing the individual die (or dice) of a
silicon
Silicon is a chemical element with the symbol Si and atomic number 14. It is a hard, brittle crystalline solid with a blue-grey metallic luster, and is a tetravalent metalloid and semiconductor. It is a member of group 14 in the periodic ta ...
wafer before they are
cut free and
packaged, and another type is used for testing packaged IC's.
Synonyms
DUT boards are occasionally known as ''DIBs'' (Device Interface Boards), ''probecards'', or ''PIBs'' (Probecard Interface Boards).
See also
*
Probe Card
A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober and electrically connected to a tester. Its purpose is to provide an electrical path between ...
References
Semiconductor fabrication equipment
Hardware testing
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