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Stigmator
A stigmator is a component of electron microscopes that reduces astigmatism of the beam by imposing a weak electric or magnetic quadrupole field on the electron beam. Background For early electron microscopes - between the 1940s and 1960s - astigmatism was one of the main performance limiting factors. Sources of this astigmatism include misaligned objectives, non-uniform magnetic fields of the lenses, which was especially hard to correct, lenses that aren't perfectly circular and contamination on the objective aperture.Batten, C. F. (2000). Autofocusing and astigmatism correction in the scanning electron microscope (Doctoral dissertation, Faculty of the Department of Engineering, University of Cambridge). Therefore, to improve the resolving resolution, the astigmatism had to be corrected. The first commercially used stigmators on electron microscopes were installed in the early 1960s. The stigmatic correction is done using an electric or magnetic field perpendicular to the beam. B ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Transmission Electron Microscope
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a detector such as a scintillator attached to a charge-coupled device or a direct electron detector. Transmission electron microscopes are capable of imaging at a significantly higher resolution than light microscopes, owing to the smaller de Broglie wavelength of electrons. This enables the instrument to capture fine detail—even as small as a single column of atoms, which is thousands of times smaller than a resolvable object seen in a light microscope. Transmission electron micro ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Microscopy
An electron microscope is a microscope that uses a beam of electrons as a source of illumination. It uses electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing it to produce magnified images or electron diffraction patterns. As the wavelength of an electron can be up to 100,000 times smaller than that of visible light, electron microscopes have a much higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes. ''Electron microscope'' may refer to: * Transmission electron microscope (TEM) where swift electrons go through a thin sample * Scanning transmission electron microscope (STEM) which is similar to TEM with a scanned electron probe * Scanning electron microscope (SEM) which is similar to STEM, but with thick samples * Electron microprobe similar to a SEM, but more for chemical analysis * Low-energy electron microscope (LEEM), used to image surfaces * ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Astigmatism (optical Systems)
An optical system with astigmatism is one where rays that propagate in two perpendicular planes have different foci. If an optical system with astigmatism is used to form an image of a cross, the vertical and horizontal lines will be in sharp focus at two different distances. The term comes from the Greek α- (''a-'') meaning "without" and στίγμα (''stigma''), "a mark, spot, puncture". Forms of astigmatism There are two distinct forms of astigmatism. The first is a third-order aberration, which occurs for objects (or parts of objects) away from the optical axis. This form of aberration occurs even when the optical system is perfectly symmetrical. This is often referred to as a "monochromatic aberration", because it occurs even for light of a single wavelength. This terminology may be misleading, however, as the ''amount'' of aberration can vary strongly with wavelength in an optical system. The second form of astigmatism occurs when the optical system is not symmetri ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electric Field
An electric field (sometimes called E-field) is a field (physics), physical field that surrounds electrically charged particles such as electrons. In classical electromagnetism, the electric field of a single charge (or group of charges) describes their capacity to exert attractive or repulsive forces on another charged object. Charged particles exert attractive forces on each other when the sign of their charges are opposite, one being positive while the other is negative, and repel each other when the signs of the charges are the same. Because these forces are exerted mutually, two charges must be present for the forces to take place. These forces are described by Coulomb's law, which says that the greater the magnitude of the charges, the greater the force, and the greater the distance between them, the weaker the force. Informally, the greater the charge of an object, the stronger its electric field. Similarly, an electric field is stronger nearer charged objects and weaker f ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Magnetic Field
A magnetic field (sometimes called B-field) is a physical field that describes the magnetic influence on moving electric charges, electric currents, and magnetic materials. A moving charge in a magnetic field experiences a force perpendicular to its own velocity and to the magnetic field. A permanent magnet's magnetic field pulls on ferromagnetic materials such as iron, and attracts or repels other magnets. In addition, a nonuniform magnetic field exerts minuscule forces on "nonmagnetic" materials by three other magnetic effects: paramagnetism, diamagnetism, and antiferromagnetism, although these forces are usually so small they can only be detected by laboratory equipment. Magnetic fields surround magnetized materials, electric currents, and electric fields varying in time. Since both strength and direction of a magnetic field may vary with location, it is described mathematically by a function (mathematics), function assigning a Euclidean vector, vector to each point of space, ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Quadrupole
A quadrupole or quadrapole is one of a sequence of configurations of things like electric charge or current, or gravitational mass that can exist in ideal form, but it is usually just part of a multipole expansion of a more complex structure reflecting various orders of complexity. Mathematical definition The quadrupole moment tensor ''Q'' is a rank-two tensor—3×3 matrix. There are several definitions, but it is normally stated in the traceless form (i.e. Q_ + Q_ + Q_ = 0). The quadrupole moment tensor has thus nine components, but because of transposition symmetry and zero-trace property, in this form only five of these are independent. For a discrete system of \ell point charges or masses in the case of a gravitational quadrupole, each with charge q_\ell, or mass m_\ell, and position \mathbf_\ell = \left(r_, r_, r_\right) relative to the coordinate system origin, the components of the ''Q'' matrix are defined by: Q_ = \sum_\ell q_\ell\left(3r_ r_ - \left\, \mathbf_\el ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Azimuth
An azimuth (; from ) is the horizontal angle from a cardinal direction, most commonly north, in a local or observer-centric spherical coordinate system. Mathematically, the relative position vector from an observer ( origin) to a point of interest is projected perpendicularly onto a reference plane (the horizontal plane); the angle between the projected vector and a reference vector on the reference plane is called the azimuth. When used as a celestial coordinate, the azimuth is the horizontal direction of a star or other astronomical object in the sky. The star is the point of interest, the reference plane is the local area (e.g. a circular area with a 5 km radius at sea level) around an observer on Earth's surface, and the reference vector points to true north. The azimuth is the angle between the north vector and the star's vector on the horizontal plane. Azimuth is usually measured in degrees (°), in the positive range 0° to 360° or in the signed ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fourier Transform
In mathematics, the Fourier transform (FT) is an integral transform that takes a function as input then outputs another function that describes the extent to which various frequencies are present in the original function. The output of the transform is a complex-valued function of frequency. The term ''Fourier transform'' refers to both this complex-valued function and the mathematical operation. When a distinction needs to be made, the output of the operation is sometimes called the frequency domain representation of the original function. The Fourier transform is analogous to decomposing the sound of a musical chord into the intensities of its constituent pitches. Functions that are localized in the time domain have Fourier transforms that are spread out across the frequency domain and vice versa, a phenomenon known as the uncertainty principle. The critical case for this principle is the Gaussian function, of substantial importance in probability theory and statist ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Anastigmat
An anastigmat or anastigmatic lens is a photographic lens completely corrected for the three main optical aberrations: spherical aberration, coma (optics), coma, and Astigmatism (optical systems), astigmatism. Early lenses often included the word ''Anastigmat'' in their name to advertise this new feature (''Doppel-Anastigmat'', ''Voigtländer Anastigmat Skopar'', etc.). History Early designs The first ''Anastigmat'' was designed by Paul Rudolph (physicist), Paul Rudolph for the German firm Carl Zeiss AG in 1890 and marketed as the ''Protar''; it consisted of four elements in two groups, as an asymmetric arrangement of two cemented achromatic lens doublets and was improved to a five-element, two-group design in 1891, substituting a cemented triplet for the rear group. In 1892, the Swiss mathematician Emil von Höegh designed the ''Dagor'' (aka ''Double Anastigmatic Goerz'') for Goerz (company), Goerz, a symmetric lens with six elements in two groups, made of two cemented triple ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Microscopy
An electron microscope is a microscope that uses a beam of electrons as a source of illumination. It uses electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing it to produce magnified images or electron diffraction patterns. As the wavelength of an electron can be up to 100,000 times smaller than that of visible light, electron microscopes have a much higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes. ''Electron microscope'' may refer to: * Transmission electron microscope (TEM) where swift electrons go through a thin sample * Scanning transmission electron microscope (STEM) which is similar to TEM with a scanned electron probe * Scanning electron microscope (SEM) which is similar to STEM, but with thick samples * Electron microprobe similar to a SEM, but more for chemical analysis * Low-energy electron microscope (LEEM), used to image surfaces * ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Beam
Since the mid-20th century, electron-beam technology has provided the basis for a variety of novel and specialized applications in semiconductor manufacturing, microelectromechanical systems, nanoelectromechanical systems, and microscopy. Mechanism Free electrons in a vacuum can be manipulated by Electric field, electric and magnetic fields to form a fine beam. Where the beam collides with solid-state matter, electrons are converted into heat or kinetic energy. This concentration of energy in a small volume of matter can be precisely controlled by the fields, which brings many advantages. Applications Electron beam techniques include electron probe microanalysis, transmission electron microscopy, auger spectroscopy, and scanning electron microscopy. The rapid increase of temperature at the location of impact can quickly melt a target material. In extreme working conditions, the rapid temperature increase can lead to evaporation, making an electron beam an excellent tool in heating ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
