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Stigmator
A stigmator is a component of electron microscopes that reduces astigmatism of the beam by imposing a weak electric or magnetic quadrupole field on the electron beam. Background For early electron microscopes - between the 1940s and 1960s - astigmatism was one of the main performance limiting factors. Sources of this astigmatism include misaligned objectives, non-uniform magnetic fields of the lenses, which was especially hard to correct, lenses that aren't perfectly circular and contamination on the objective aperture.Batten, C. F. (2000). Autofocusing and astigmatism correction in the scanning electron microscope (Doctoral dissertation, Faculty of the Department of Engineering, University of Cambridge). Therefore, to improve the resolving resolution, the astigmatism had to be corrected. The first commercially used stigmators on electron microscopes were installed in the early 1960s. The stigmatic correction is done using an electric or magnetic field perpendicular to the beam. ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Transmission Electron Microscope
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device. Transmission electron microscopes are capable of imaging at a significantly higher resolution than light microscopes, owing to the smaller de Broglie wavelength of electrons. This enables the instrument to capture fine detail—even as small as a single column of atoms, which is thousands of times smaller than a resolvable object seen in a light microscope. Transmission electron microscopy is a major analytical method in ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Microscopy
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. A scanning transmission electron microscope has achieved better than 50 pm resolution in annular dark-field imaging mode and magnifications of up to about 10,000,000× whereas most light microscopes are limited by diffraction to about 200 nm resolution and useful magnifications below 2000×. Electron microscopes use shaped magnetic fields to form electron optical lens systems that are analogous to the glass lenses of an optical light microscope. Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Astigmatism (optical Systems)
An optical system with astigmatism is one where rays that propagate in two perpendicular planes have different foci. If an optical system with astigmatism is used to form an image of a cross, the vertical and horizontal lines will be in sharp focus at two different distances. The term comes from the Greek α- (''a-'') meaning "without" and στίγμα (''stigma''), "a mark, spot, puncture". Forms of astigmatism There are two distinct forms of astigmatism. The first is a third-order aberration, which occurs for objects (or parts of objects) away from the optical axis. This form of aberration occurs even when the optical system is perfectly symmetrical. This is often referred to as a "monochromatic aberration", because it occurs even for light of a single wavelength. This terminology may be misleading, however, as the ''amount'' of aberration can vary strongly with wavelength in an optical system. The second form of astigmatism occurs when the optical system is not symmetric a ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electric Field
An electric field (sometimes E-field) is the physical field that surrounds electrically charged particles and exerts force on all other charged particles in the field, either attracting or repelling them. It also refers to the physical field for a system of charged particles. Electric fields originate from electric charges and time-varying electric currents. Electric fields and magnetic fields are both manifestations of the electromagnetic field, one of the four fundamental interactions (also called forces) of nature. Electric fields are important in many areas of physics, and are exploited in electrical technology. In atomic physics and chemistry, for instance, the electric field is the attractive force holding the atomic nucleus and electrons together in atoms. It is also the force responsible for chemical bonding between atoms that result in molecules. The electric field is defined as a vector field that associates to each point in space the electrostatic ( Coulomb) for ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Magnetic Field
A magnetic field is a vector field that describes the magnetic influence on moving electric charges, electric currents, and magnetic materials. A moving charge in a magnetic field experiences a force perpendicular to its own velocity and to the magnetic field. A permanent magnet's magnetic field pulls on ferromagnetic materials such as iron, and attracts or repels other magnets. In addition, a nonuniform magnetic field exerts minuscule forces on "nonmagnetic" materials by three other magnetic effects: paramagnetism, diamagnetism, and antiferromagnetism, although these forces are usually so small they can only be detected by laboratory equipment. Magnetic fields surround magnetized materials, and are created by electric currents such as those used in electromagnets, and by electric fields varying in time. Since both strength and direction of a magnetic field may vary with location, it is described mathematically by a function assigning a vector to each point of space, cal ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Quadrupole
A quadrupole or quadrapole is one of a sequence of configurations of things like electric charge or current, or gravitational mass that can exist in ideal form, but it is usually just part of a multipole expansion of a more complex structure reflecting various orders of complexity. Mathematical definition The quadrupole moment tensor ''Q'' is a rank-two tensor—3×3 matrix. There are several definitions, but it is normally stated in the traceless form (i.e. Q_ + Q_ + Q_ = 0). The quadrupole moment tensor has thus nine components, but because of transposition symmetry and Trace (linear algebra), zero-trace property, in this form only five of these are independent. For a discrete system of \ell point charges or masses in the case of a Quadrupole#Gravitational quadrupole, gravitational quadrupole, each with charge q_\ell, or mass m_\ell, and position \vec_\ell = \left(r_, r_, r_\right) relative to the coordinate system origin, the components of the ''Q'' matrix are defined by: : ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Azimuth
An azimuth (; from ar, اَلسُّمُوت, as-sumūt, the directions) is an angular measurement in a spherical coordinate system. More specifically, it is the horizontal angle from a cardinal direction, most commonly north. Mathematically, the relative position vector from an observer (origin) to a point of interest is projected perpendicularly onto a reference plane (the horizontal plane); the angle between the projected vector and a reference vector on the reference plane is called the azimuth. When used as a celestial coordinate, the azimuth is the horizontal direction of a star or other astronomical object in the sky. The star is the point of interest, the reference plane is the local area (e.g. a circular area with a 5 km radius at sea level) around an observer on Earth's surface, and the reference vector points to true north. The azimuth is the angle between the north vector and the star's vector on the horizontal plane. Azimuth is usually measured in d ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fourier Transform
A Fourier transform (FT) is a mathematical transform that decomposes functions into frequency components, which are represented by the output of the transform as a function of frequency. Most commonly functions of time or space are transformed, which will output a function depending on temporal frequency or spatial frequency respectively. That process is also called ''analysis''. An example application would be decomposing the waveform of a musical chord into terms of the intensity of its constituent pitches. The term ''Fourier transform'' refers to both the frequency domain representation and the mathematical operation that associates the frequency domain representation to a function of space or time. The Fourier transform of a function is a complex-valued function representing the complex sinusoids that comprise the original function. For each frequency, the magnitude (absolute value) of the complex value represents the amplitude of a constituent complex sinusoid with that ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Anastigmat
An anastigmat or anastigmatic lens is a photographic lens completely corrected for the three main optical aberrations: spherical aberration, coma, and astigmatism. Early lenses often included the word ''Anastigmat'' in their name to advertise this new feature (''Doppel-Anastigmat'', ''Voigtländer Anastigmat Skopar'', etc.). The first Anastigmat was designed by Paul Rudolph for the German firm Carl Zeiss AG in 1890. All modern photographic lenses are close to being anastigmatic, meaning that they can create extremely sharp images for all objects across their field of view; the underlying limitation is that the lens can deliver the anastigmatic performance only up to a maximum aperture (i.e., it has a minimum F-number) and only within a given working distance (focusing range). Note that all optical aberrations (except spherical aberration) become more pronounced towards the edges of the field of view, even with high-grade anastigmatic lenses. Anastigmatic performance is accomplis ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Microscopy
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. A scanning transmission electron microscope has achieved better than 50 pm resolution in annular dark-field imaging mode and magnifications of up to about 10,000,000× whereas most light microscopes are limited by diffraction to about 200 nm resolution and useful magnifications below 2000×. Electron microscopes use shaped magnetic fields to form electron optical lens systems that are analogous to the glass lenses of an optical light microscope. Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Beam
Cathode rays or electron beam (e-beam) are streams of electrons observed in discharge tubes. If an evacuated glass tube is equipped with two electrodes and a voltage is applied, glass behind the positive electrode is observed to glow, due to electrons emitted from the cathode (the electrode connected to the negative terminal of the voltage supply). They were first observed in 1859 by German physicist Julius Plücker and Johann Wilhelm Hittorf, and were named in 1876 by Eugen Goldstein ''Kathodenstrahlen'', or cathode rays. In 1897, British physicist J. J. Thomson showed that cathode rays were composed of a previously unknown negatively charged particle, which was later named the ''electron''. Cathode-ray tubes (CRTs) use a focused beam of electrons deflected by electric or magnetic fields to render an image on a screen. Description Cathode rays are so named because they are emitted by the negative electrode, or cathode, in a vacuum tube. To release electrons into the tube, th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
