Dark-field X-ray Microscopy
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Dark-field X-ray Microscopy
Dark-field X-ray microscopy (DFXM or DFXRM) is an imaging technique used for multiscale Characterization (materials science), structural characterisation. It is capable of mapping deeply embedded structural elements with nm-resolution using synchrotron X-ray diffraction-based imaging. The technique works by using scattered X-rays to create a high degree of Diffraction contrast tomography, contrast, and by measuring the intensity and spatial distribution of the diffracted beams, it is possible to obtain a three-dimensional map of the sample's Crystal structure, structure, Orientation (geometry), orientation, and local Strain (mechanics), strain. History The first experimental demonstration of dark-field X-ray microscopy was reported in 2006 by a group at the European Synchrotron Radiation Facility in Grenoble, France. Since then, the technique has been rapidly evolving and has shown great promise in multiscale structural characterization. Its development is largely due to advance ...
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Characterization (materials Science)
Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained. The scope of the term often differs; some definitions limit the term's use to techniques which study the microscopic structure and properties of materials, while others use the term to refer to any materials analysis process including macroscopic techniques such as mechanical testing, thermal analysis and density calculation. The scale of the structures observed in materials characterization ranges from angstroms, such as in the imaging of individual atoms and chemical bonds, up to centimeters, such as in the imaging of coarse grain structures in metals. While many characterization techniques have been practiced for centuries, such as basic optical microscopy, new techniqu ...
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