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Logic Built-in Self-test
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment. Advantages The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product. Disadvantages LBIST that requires additional circuitry (or read-only memory) increases the cost of the integrated circuit. LBIST that only requires temporary changes to programmable logic or rewritable memory avoids this extra cost, but requires more time to first program in the BIST and then to remove it and program in the final configuration. Another disadvantage of LBIST is the possibility tha ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Built-in Self-test
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: *high reliability *lower repair cycle times or constraints such as: *limited technician accessibility *cost of testing during manufacture The main purpose of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment. BIST reduces cost in two ways: # reduces test-cycle duration # reduces the complexity of the test/probe setup, by reducing the number of I/O signals that must be driven/examined under tester control. Both lead to a reduction in hourly charges for automated test equipment (ATE) service. Applications BIST is commonly placed in weapons, avionics, medical devices, automotive electronics, complex machinery of all types, unattended machinery of all types, and integrated circuits. Automotive Automotive tests itself to enhance safety ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Integrated Circuit
An integrated circuit (IC), also known as a microchip or simply chip, is a set of electronic circuits, consisting of various electronic components (such as transistors, resistors, and capacitors) and their interconnections. These components are etched onto a small, flat piece ("chip") of semiconductor material, usually silicon. Integrated circuits are used in a wide range of electronic devices, including computers, smartphones, and televisions, to perform various functions such as processing and storing information. They have greatly impacted the field of electronics by enabling device miniaturization and enhanced functionality. Integrated circuits are orders of magnitude smaller, faster, and less expensive than those constructed of discrete components, allowing a large transistor count. The IC's mass production capability, reliability, and building-block approach to integrated circuit design have ensured the rapid adoption of standardized ICs in place of designs using discre ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Equipment
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled Multimeter, digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test avionics and the electronic modules in automobiles. It is used in military applications like radar and wireless communication. In the semiconductor industry Semiconductor ATE, named for testing se ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Read-only Memory
Read-only memory (ROM) is a type of non-volatile memory used in computers and other electronic devices. Data stored in ROM cannot be electronically modified after the manufacture of the memory device. Read-only memory is useful for storing software that is rarely changed during the life of the system, also known as firmware. Software applications, such as video games, for programmable devices can be distributed as ROM cartridge, plug-in cartridges containing ROM. Strictly speaking, ''read-only memory'' refers to hard-wired memory, such as diode matrix or a #Solid-state ROM, mask ROM integrated circuit (IC), that cannot be electronically changed after manufacture. Although discrete circuits can be altered in principle, through the addition of Jump wire, bodge wires and the removal or replacement of components, ICs cannot. Correction of errors, or updates to the software, require new devices to be manufactured and to replace the installed device. Floating-gate ROM semiconductor ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Programmable Logic Device
A programmable logic device (PLD) is an electronic component used to build reconfigurable digital circuits. Unlike digital logic constructed using discrete logic gates with fixed functions, the function of a PLD is undefined at the time of manufacture. Before the PLD can be used in a circuit it must be programmed to implement the desired function. Compared to fixed logic devices, programmable logic devices simplify the design of complex logic and may offer superior performance. Unlike for microprocessors, programming a PLD changes the connections made between the gates in the device. PLDs can broadly be categorised into, in increasing order of complexity, simple programmable logic devices (SPLDs), comprising programmable array logic, programmable logic array and generic array logic; complex programmable logic devices (CPLDs); and field-programmable gate arrays (FPGAs). History In 1969, Motorola offered the XC157, a mask-programmed gate array with 12 gates and 30 uncom ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Flash Memory
Flash memory is an Integrated circuit, electronic Non-volatile memory, non-volatile computer memory storage medium that can be electrically erased and reprogrammed. The two main types of flash memory, NOR flash and NAND flash, are named for the NOR gate, NOR and NAND gate, NAND logic gates. Both use the same cell design, consisting of floating-gate MOSFETs. They differ at the circuit level, depending on whether the state of the bit line or word lines is pulled high or low; in NAND flash, the relationship between the bit line and the word lines resembles a NAND gate; in NOR flash, it resembles a NOR gate. Flash memory, a type of floating-gate memory, was invented by Fujio Masuoka at Toshiba in 1980 and is based on EEPROM technology. Toshiba began marketing flash memory in 1987. EPROMs had to be erased completely before they could be rewritten. NAND flash memory, however, may be erased, written, and read in blocks (or pages), which generally are much smaller than the entire devi ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
MBIST
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: *high reliability *lower repair cycle times or constraints such as: *limited technician accessibility *cost of testing during manufacture The main purpose of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment. BIST reduces cost in two ways: # reduces test-cycle duration # reduces the complexity of the test/probe setup, by reducing the number of I/O signals that must be driven/examined under tester control. Both lead to a reduction in hourly charges for automated test equipment (ATE) service. Applications BIST is commonly placed in weapons, avionics, medical devices, automotive electronics, complex machinery of all types, unattended machinery of all types, and integrated circuits. Automotive Automotive tests itself to enhance safety ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Memory
Memory is the faculty of the mind by which data or information is encoded, stored, and retrieved when needed. It is the retention of information over time for the purpose of influencing future action. If past events could not be remembered, it would be impossible for language, relationships, or personal identity to develop. Memory loss is usually described as forgetfulness or amnesia. Memory is often understood as an informational processing system with explicit and implicit functioning that is made up of a sensory processor, short-term (or working) memory, and long-term memory. This can be related to the neuron. The sensory processor allows information from the outside world to be sensed in the form of chemical and physical stimuli and attended to various levels of focus and intent. Working memory serves as an encoding and retrieval processor. Information in the form of stimuli is encoded in accordance with explicit or implicit functions by the working memory p ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Array Data Structure
In computer science, an array is a data structure consisting of a collection of ''elements'' (value (computer science), values or variable (programming), variables), of same memory size, each identified by at least one ''array index'' or ''key'', a collection of which may be a tuple, known as an index tuple. An array is stored such that the position (memory address) of each element can be computed from its index tuple by a mathematical formula. The simplest type of data structure is a linear array, also called a one-dimensional array. For example, an array of ten 32-bit (4-byte) integer variables, with indices 0 through 9, may be stored as ten Word (data type), words at memory addresses 2000, 2004, 2008, ..., 2036, (in hexadecimal: 0x7D0, 0x7D4, 0x7D8, ..., 0x7F4) so that the element with index ''i'' has the address 2000 + (''i'' × 4). The memory address of the first element of an array is called first address, foundation address, or base address. Because the mathematical conc ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Analogue Electronics
Analogue electronics () are electronic systems with a continuously variable signal, in contrast to digital electronics where signals usually take only two levels. The term ''analogue'' describes the proportional relationship between a signal and a voltage or current that represents the signal. The word ''analogue'' is derived from the Greek word meaning ''proportional''. Analogue signals An analogue signal uses some attribute of the medium to convey the signal's information. For example, an aneroid barometer uses the angular position of a needle on top of a contracting and expanding box as the signal to convey the information of changes in atmospheric pressure. Electrical signals may represent information by changing their voltage, current, frequency, or total charge. Information is converted from some other physical form (such as sound, light, temperature, pressure, position) to an electrical signal by a transducer which converts one type of energy into another (e.g. ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Built-in Self-test
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: *high reliability *lower repair cycle times or constraints such as: *limited technician accessibility *cost of testing during manufacture The main purpose of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment. BIST reduces cost in two ways: # reduces test-cycle duration # reduces the complexity of the test/probe setup, by reducing the number of I/O signals that must be driven/examined under tester control. Both lead to a reduction in hourly charges for automated test equipment (ATE) service. Applications BIST is commonly placed in weapons, avionics, medical devices, automotive electronics, complex machinery of all types, unattended machinery of all types, and integrated circuits. Automotive Automotive tests itself to enhance safety ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Built-in Test Equipment
Built-in test equipment (BITE) for avionics primarily refers to passive fault management and diagnosis equipment built into airborne systems to support maintenance processes. Built-in test equipment includes multimeter A multimeter (also known as a multi-tester, volt-ohm-milliammeter, volt-ohmmeter or VOM, avometer or ampere-volt-ohmmeter) is a measuring instrument that can measure multiple electrical properties. A typical multimeter can measure voltage, elec ...s, oscilloscopes, discharge probes, and frequency generators that are provided as part of the system to enable testing and perform diagnostics. The acronym BIT is often used for this same function or, more specifically, in reference to the individual tests. BIT often includes: * The detection of the fault * The accommodation of the fault (how the system actively responds to the fault) * The annunciation or logging of the fault to warn of possible effects and/or aid in troubleshooting the faulty equipment. Functiona ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
