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Nano-FTIR
Nano-FTIR (nanoscale Fourier transform infrared spectroscopy) is a scanning probe technique that utilizes as a combination of two techniques: Fourier transform infrared spectroscopy (FTIR) and scattering-type scanning near-field optical microscopy (s-SNOM). As s-SNOM, nano-FTIR is based on atomic-force microscopy (AFM), where a sharp tip is illuminated by an external light source and the tip-scattered light (typically back-scattered) is detected as a function of tip position. A typical nano-FTIR setup thus consists of an atomic force microscope, a broadband infrared light source used for tip illumination, and a Michelson interferometer acting as Fourier transform spectrometer. In nano-FTIR, the sample stage is placed in one of the interferometer arms, which allows for recording both amplitude and phase of the detected light (unlike conventional FTIR that normally does not yield phase information). Scanning the tip allows for performing hyperspectral imaging (i.e. complete spectrum ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Nano-FTIR Spectra Of Polyurethane Obtained Using NeaSNOM
Nano-FTIR (nanoscale Fourier transform infrared spectroscopy) is a Scanning probe microscopy, scanning probe technique that utilizes as a combination of two techniques: Fourier transform infrared spectroscopy (FTIR) and near-field scanning optical microscope, scattering-type scanning near-field optical microscopy (s-SNOM). As s-SNOM, nano-FTIR is based on atomic-force microscopy (AFM), where a sharp tip is illuminated by an external light source and the tip-scattered light (typically back-scattered) is detected as a function of tip position. A typical nano-FTIR setup thus consists of an atomic force microscope, a broadband infrared light source used for tip illumination, and a Michelson interferometer acting as Fourier transform spectroscopy, Fourier transform spectrometer. In nano-FTIR, the sample stage is placed in one of the interferometer arms, which allows for recording both amplitude and phase of the detected light (unlike conventional FTIR that normally does not yield phase i ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Near-field Scanning Optical Microscope
Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture. When the sample is scanned at a small distance below the aperture, the optical resolution of transmitted or reflected light is limited only by the diameter of the aperture. In particular, lateral resolution of 6 nm and vertical resolution of 2–5 nm have been demonstrated. As in optical microscopy, the contrast mechanism can be easily adapted to study different properties, such as refractive index, chemical structure and local stress. Dynamic properties can also be studied at a sub-wavelength scale using this technique. NSOM ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Near-field Scanning Optical Microscope
Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture. When the sample is scanned at a small distance below the aperture, the optical resolution of transmitted or reflected light is limited only by the diameter of the aperture. In particular, lateral resolution of 6 nm and vertical resolution of 2–5 nm have been demonstrated. As in optical microscopy, the contrast mechanism can be easily adapted to study different properties, such as refractive index, chemical structure and local stress. Dynamic properties can also be studied at a sub-wavelength scale using this technique. NSOM ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fourier Transform Spectroscopy
Fourier-transform spectroscopy is a measurement technique whereby spectra are collected based on measurements of the coherence of a radiative source, using time-domain or space-domain measurements of the radiation, electromagnetic or not. It can be applied to a variety of types of ''spectroscopy'' including optical spectroscopy, infrared spectroscopy ( FTIR, FT-NIRS), nuclear magnetic resonance (NMR) and magnetic resonance spectroscopic imaging (MRSI), mass spectrometry and electron spin resonance spectroscopy. There are several methods for measuring the temporal coherence of the light (see: field-autocorrelation), including the continuous-wave and the pulsed Fourier-transform spectrometer or Fourier-transform spectrograph. The term "Fourier-transform spectroscopy" reflects the fact that in all these techniques, a Fourier transform is required to turn the raw data into the actual spectrum, and in many of the cases in optics involving interferometers, is based on the Wiener– ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fourier Transform Infrared Spectroscopy
Fourier-transform infrared spectroscopy (FTIR) is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas. An FTIR spectrometer simultaneously collects high-resolution spectral data over a wide spectral range. This confers a significant advantage over a dispersive spectrometer, which measures intensity over a narrow range of wavelengths at a time. The term ''Fourier-transform infrared spectroscopy'' originates from the fact that a Fourier transform (a mathematical process) is required to convert the raw data into the actual spectrum. Conceptual introduction The goal of absorption spectroscopy techniques (FTIR, ultraviolet-visible ("UV-vis") spectroscopy, etc.) is to measure how much light a sample absorbs at each wavelength. The most straightforward way to do this, the "dispersive spectroscopy" technique, is to shine a monochromatic light beam at a sample, measure how much of the light is absorbed, and repeat for each different ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Atomic-force Microscopy
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Overview Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force. Abilities The AFM has three major abilities: force measurement, topographic imaging, and manipulation. In force measurement, AFMs can be used to measure the forces between the probe and the sample as a f ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
AFM-IR
AFM-IR (atomic force microscope-infrared spectroscopy) or infrared nanospectroscopy is one of a family of techniques (published online, Feb 2008) with erratum, 19(5), 14 May 2004 that are derived from a combination of two parent instrumental techniques. AFM-IR combines the chemical analysis power of infrared spectroscopy and the high-spatial resolution of scanning probe microscopy (SPM). The term was first used to denote a method that combined a tuneable free electron laser with an atomic force microscope (AFM, a type of SPM) equipped with a sharp probe that measured the local absorption of infrared light by a sample with nanoscale spatial resolution. Originally the technique required the sample to be deposited on an infrared-transparent prism and be less than 1μm thick. This early setup improved the spatial resolution and sensitivity of photothermal AFM-based techniques from microns to circa 100 nm. Then, the use of modern pulsed optical parametric oscillators and quantum cascade ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Near-field Probing
{{disambiguation ...
Near field may refer to: * Near-field (mathematics), an algebraic structure * Near-field region, part of an electromagnetic field * Near field (electromagnetism) ** Magnetoquasistatic field, the magnetic component of the electromagnetic near field ** Near-field communication (NFC) using the magnetic component of the electromagnetic near field (magnetoquasistatic field) See also * Near-field magnetic induction communication, a technique for deliberately limited-range communication between devices ** Near-field communication (NFC), a set of application protocols based on this * Near-field optics * Near-field scanning optical microscope Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Vibrational Analysis With Scanning Probe Microscopy
The technique of vibrational analysis with scanning probe microscopy allows probing vibrational properties of materials at the submicrometer scale, and even of individual molecules. This is accomplished by integrating scanning probe microscopy (SPM) and vibrational spectroscopy (Raman scattering or/and Fourier transform infrared spectroscopy, FTIR). This combination allows for much higher spatial resolution than can be achieved with conventional Raman/FTIR instrumentation. The technique is also nondestructive, requires non-extensive sample preparation, and provides more contrast such as intensity contrast, polarization contrast and wavelength contrast, as well as providing specific chemical information and topography images simultaneously. History Raman-NSOM Near-field scanning optical microscopy (NSOM) was described in 1984, and used in many applications since then. The combination of Raman scattering and NSOM techniques was first realized in 1995, when it was used for imaging a ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Absorption Spectroscopy
Absorption spectroscopy refers to spectroscopic techniques that measure the absorption of radiation, as a function of frequency or wavelength, due to its interaction with a sample. The sample absorbs energy, i.e., photons, from the radiating field. The intensity of the absorption varies as a function of frequency, and this variation is the absorption spectrum. Absorption spectroscopy is performed across the electromagnetic spectrum. Absorption spectroscopy is employed as an analytical chemistry tool to determine the presence of a particular substance in a sample and, in many cases, to quantify the amount of the substance present. Infrared and ultraviolet–visible spectroscopy are particularly common in analytical applications. Absorption spectroscopy is also employed in studies of molecular and atomic physics, astronomical spectroscopy and remote sensing. There is a wide range of experimental approaches for measuring absorption spectra. The most common arrangement is to direct ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Interferogram
In physics, interference is a phenomenon in which two waves combine by adding their displacement together at every single point in space and time, to form a resultant wave of greater, lower, or the same amplitude. Constructive and destructive interference result from the interaction of waves that are correlated or coherent with each other, either because they come from the same source or because they have the same or nearly the same frequency. Interference effects can be observed with all types of waves, for example, light, radio, acoustic, surface water waves, gravity waves, or matter waves. Etymology The word ''interference'' is derived from the Latin words ''inter'' which means "between" and ''fere'' which means "hit or strike", and was coined by Thomas Young in 1801. Mechanisms The principle of superposition of waves states that when two or more propagating waves of the same type are incident on the same point, the resultant amplitude at that point is equal to th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
