Nano-FTIR Spectra Of Polyurethane Obtained Using NeaSNOM
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Nano-FTIR Spectra Of Polyurethane Obtained Using NeaSNOM
Nano-FTIR (nanoscale Fourier transform infrared spectroscopy) is a Scanning probe microscopy, scanning probe technique that utilizes as a combination of two techniques: Fourier transform infrared spectroscopy (FTIR) and near-field scanning optical microscope, scattering-type scanning near-field optical microscopy (s-SNOM). As s-SNOM, nano-FTIR is based on atomic-force microscopy (AFM), where a sharp tip is illuminated by an external light source and the tip-scattered light (typically back-scattered) is detected as a function of tip position. A typical nano-FTIR setup thus consists of an atomic force microscope, a broadband infrared light source used for tip illumination, and a Michelson interferometer acting as Fourier transform spectroscopy, Fourier transform spectrometer. In nano-FTIR, the sample stage is placed in one of the interferometer arms, which allows for recording both amplitude and phase of the detected light (unlike conventional FTIR that normally does not yield phase i ...
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Terahertz Radiation
Terahertz radiation – also known as submillimeter radiation, terahertz waves, tremendously high frequency (THF), T-rays, T-waves, T-light, T-lux or THz – consists of electromagnetic waves within the ITU-designated band of frequencies from 0.3 to 3  terahertz (THz), although the upper boundary is somewhat arbitrary and is considered by some sources as 30 THz. One terahertz is 1012  Hz or 1000 GHz. Wavelengths of radiation in the terahertz band correspondingly range from 1 mm to 0.1 mm = 100 µm. Because terahertz radiation begins at a wavelength of around 1 millimeter and proceeds into shorter wavelengths, it is sometimes known as the ''submillimeter band'', and its radiation as ''submillimeter waves'', especially in astronomy. This band of electromagnetic radiation lies within the transition region between microwave and far infrared, and can be regarded as either. Terahertz radiation is strongly absorbed by the gases o ...
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Globar
A Globar is used as thermal light source for infrared spectroscopy. The preffered material for making Globar is silicon carbide that is shaped as rods or arches of various sizes. When inserted into a circuit that provides it with electric current, it emits radiation from ~ 2 to 50 micrometres wavelength via the Joule heating phenomenon. Globars are used as infrared sources for spectroscopy because their spectral behavior corresponds approximately to that of a Planck radiator (i.e. a black body). Alternative infrared sources are Nernst lamps, coils of chrome–nickel alloy or high-pressure mercury lamps. The technical term ''Globar'' is an English portmanteau word consisting of ''glow'' and ''bar''. The term ''glowbar'' is sometimes used synonymously in English (which is an incorrect spelling in the strict sense). The ''American Resistor Company'' in Milwaukee, Wisconsin, had word and lettering ''Globar'' registered as a trademark (in a special decorative script font) with the Unite ...
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Fiber Laser
A fiber laser (or fibre laser in British English) is a laser in which the active gain medium is an optical fiber doped with rare-earth elements such as erbium, ytterbium, neodymium, dysprosium, praseodymium, thulium and holmium. They are related to doped fiber amplifiers, which provide light amplification without lasing. Fiber nonlinearities, such as stimulated Raman scattering or four-wave mixing can also provide gain and thus serve as gain media for a fiber laser. Advantages and applications An advantage of fiber lasers over other types of lasers is that the laser light is both generated and delivered by an inherently flexible medium, which allows easier delivery to the focusing location and target. This can be important for laser cutting, welding, and folding of metals and polymers. Another advantage is high output power compared to other types of laser. Fiber lasers can have active regions several kilometers long, and so can provide very high optical gain. They can support ...
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Absorption Spectroscopy
Absorption spectroscopy refers to spectroscopic techniques that measure the absorption of radiation, as a function of frequency or wavelength, due to its interaction with a sample. The sample absorbs energy, i.e., photons, from the radiating field. The intensity of the absorption varies as a function of frequency, and this variation is the absorption spectrum. Absorption spectroscopy is performed across the electromagnetic spectrum. Absorption spectroscopy is employed as an analytical chemistry tool to determine the presence of a particular substance in a sample and, in many cases, to quantify the amount of the substance present. Infrared and ultraviolet–visible spectroscopy are particularly common in analytical applications. Absorption spectroscopy is also employed in studies of molecular and atomic physics, astronomical spectroscopy and remote sensing. There is a wide range of experimental approaches for measuring absorption spectra. The most common arrangement is to direct ...
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Nano-FTIR Spectra Of Polyurethane Obtained Using NeaSNOM
Nano-FTIR (nanoscale Fourier transform infrared spectroscopy) is a Scanning probe microscopy, scanning probe technique that utilizes as a combination of two techniques: Fourier transform infrared spectroscopy (FTIR) and near-field scanning optical microscope, scattering-type scanning near-field optical microscopy (s-SNOM). As s-SNOM, nano-FTIR is based on atomic-force microscopy (AFM), where a sharp tip is illuminated by an external light source and the tip-scattered light (typically back-scattered) is detected as a function of tip position. A typical nano-FTIR setup thus consists of an atomic force microscope, a broadband infrared light source used for tip illumination, and a Michelson interferometer acting as Fourier transform spectroscopy, Fourier transform spectrometer. In nano-FTIR, the sample stage is placed in one of the interferometer arms, which allows for recording both amplitude and phase of the detected light (unlike conventional FTIR that normally does not yield phase i ...
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Fourier Transform
A Fourier transform (FT) is a mathematical transform that decomposes functions into frequency components, which are represented by the output of the transform as a function of frequency. Most commonly functions of time or space are transformed, which will output a function depending on temporal frequency or spatial frequency respectively. That process is also called ''analysis''. An example application would be decomposing the waveform of a musical chord into terms of the intensity of its constituent pitches. The term ''Fourier transform'' refers to both the frequency domain representation and the mathematical operation that associates the frequency domain representation to a function of space or time. The Fourier transform of a function is a complex-valued function representing the complex sinusoids that comprise the original function. For each frequency, the magnitude (absolute value) of the complex value represents the amplitude of a constituent complex sinusoid with that ...
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Interferogram
In physics, interference is a phenomenon in which two waves combine by adding their displacement together at every single point in space and time, to form a resultant wave of greater, lower, or the same amplitude. Constructive and destructive interference result from the interaction of waves that are correlated or coherent with each other, either because they come from the same source or because they have the same or nearly the same frequency. Interference effects can be observed with all types of waves, for example, light, radio, acoustic, surface water waves, gravity waves, or matter waves. Etymology The word ''interference'' is derived from the Latin words ''inter'' which means "between" and ''fere'' which means "hit or strike", and was coined by Thomas Young in 1801. Mechanisms The principle of superposition of waves states that when two or more propagating waves of the same type are incident on the same point, the resultant amplitude at that point is equal to th ...
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Near-field Probing
Near field may refer to: * Near-field (mathematics), an algebraic structure * Near-field region, part of an electromagnetic field * Near field (electromagnetism) ** Magnetoquasistatic field, the magnetic component of the electromagnetic near field ** Near-field communication (NFC) using the magnetic component of the electromagnetic near field (magnetoquasistatic field) See also * Near-field magnetic induction communication, a technique for deliberately limited-range communication between devices ** Near-field communication (NFC), a set of application protocols based on this * Near-field optics * Near-field scanning optical microscope Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves ...
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Vibrational Analysis With Scanning Probe Microscopy
The technique of vibrational analysis with scanning probe microscopy allows probing vibrational properties of materials at the submicrometer scale, and even of individual molecules. This is accomplished by integrating scanning probe microscopy (SPM) and vibrational spectroscopy (Raman scattering or/and Fourier transform infrared spectroscopy, FTIR). This combination allows for much higher spatial resolution than can be achieved with conventional Raman/FTIR instrumentation. The technique is also nondestructive, requires non-extensive sample preparation, and provides more contrast such as intensity contrast, polarization contrast and wavelength contrast, as well as providing specific chemical information and topography images simultaneously. History Raman-NSOM Near-field scanning optical microscopy (NSOM) was described in 1984, and used in many applications since then. The combination of Raman scattering and NSOM techniques was first realized in 1995, when it was used for imaging a ...
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AFM-IR
AFM-IR (atomic force microscope-infrared spectroscopy) or infrared nanospectroscopy is one of a family of techniques (published online, Feb 2008) with erratum, 19(5), 14 May 2004 that are derived from a combination of two parent instrumental techniques. AFM-IR combines the chemical analysis power of infrared spectroscopy and the high-spatial resolution of scanning probe microscopy (SPM). The term was first used to denote a method that combined a tuneable free electron laser with an atomic force microscope (AFM, a type of SPM) equipped with a sharp probe that measured the local absorption of infrared light by a sample with nanoscale spatial resolution. Originally the technique required the sample to be deposited on an infrared-transparent prism and be less than 1μm thick. This early setup improved the spatial resolution and sensitivity of photothermal AFM-based techniques from microns to circa 100 nm. Then, the use of modern pulsed optical parametric oscillators and quantum cascade ...
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Near-field Scanning Optical Microscope
Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture. When the sample is scanned at a small distance below the aperture, the optical resolution of transmitted or reflected light is limited only by the diameter of the aperture. In particular, lateral resolution of 6 nm and vertical resolution of 2–5 nm have been demonstrated. As in optical microscopy, the contrast mechanism can be easily adapted to study different properties, such as refractive index, chemical structure and local stress. Dynamic properties can also be studied at a sub-wavelength scale using this technique. NSOM ...
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