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Test Compression
Test compression is a technique used to reduce the time and cost of testing integrated circuits. The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design. These techniques were very successful at creating high-quality vectors for manufacturing test, with excellent test coverage. However, as chips got bigger and more complex the ratio of logic to be tested per pin increased dramatically, and the volume of scan test data started causing a significant increase in test time, and required tester memory. This raised the cost of testing. Test compression was developed to help address this problem. When an ATPG tool generates a test for a fault, or a set of faults, only a small percentage of scan cells need to take specific values. The rest of the scan chain is ' ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Integrated Circuit
An integrated circuit or monolithic integrated circuit (also referred to as an IC, a chip, or a microchip) is a set of electronic circuits on one small flat piece (or "chip") of semiconductor material, usually silicon. Large numbers of tiny MOSFETs (metal–oxide–semiconductor field-effect transistors) integrate into a small chip. This results in circuits that are orders of magnitude smaller, faster, and less expensive than those constructed of discrete electronic components. The IC's mass production capability, reliability, and building-block approach to integrated circuit design has ensured the rapid adoption of standardized ICs in place of designs using discrete transistors. ICs are now used in virtually all electronic equipment and have revolutionized the world of electronics. Computers, mobile phones and other home appliances are now inextricable parts of the structure of modern societies, made possible by the small size and low cost of ICs such as modern computer ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Design For Test
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Pattern Generation
ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (Scan chain, full scan, synchronous sequential, or asynchron ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Design For Test
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Pattern Generation
ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (Scan chain, full scan, synchronous sequential, or asynchron ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Design Automation
Electronic design automation (EDA), also referred to as electronic computer-aided design (ECAD), is a category of software tools for designing Electronics, electronic systems such as integrated circuits and printed circuit boards. The tools work together in a Design flow (EDA), design flow that chip designers use to design and analyze entire semiconductor chips. Since a modern semiconductor chip can have billions of components, EDA tools are essential for their design; this article in particular describes EDA specifically with respect to integrated circuits (ICs). History Early days Prior to the development of EDA, integrated circuits were designed by hand and manually laid out. Some advanced shops used geometric software to generate tapes for a Gerber format, Gerber photoplotter, responsible for generating a monochromatic exposure image, but even those copied digital recordings of mechanically drawn components. The process was fundamentally graphic, with the translation f ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Integrated Circuit Design
Integrated circuit design, or IC design, is a sub-field of electronics engineering, encompassing the particular logic and circuit design techniques required to design integrated circuits, or ICs. ICs consist of miniaturized electronic components built into an electrical network on a monolithic semiconductor substrate by photolithography. IC design can be divided into the broad categories of digital and analog IC design. Digital IC design is to produce components such as microprocessors, FPGAs, memories (RAM, ROM, and flash) and digital ASICs. Digital design focuses on logical correctness, maximizing circuit density, and placing circuits so that clock and timing signals are routed efficiently. Analog IC design also has specializations in power IC design and RF IC design. Analog IC design is used in the design of op-amps, linear regulators, phase locked loops, oscillators and active filters. Analog design is more concerned with the physics of the semiconductor devices such as ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
IEEE
The Institute of Electrical and Electronics Engineers (IEEE) is a 501(c)(3) professional association for electronic engineering and electrical engineering (and associated disciplines) with its corporate office in New York City and its operations center in Piscataway, New Jersey. The mission of the IEEE is ''advancing technology for the benefit of humanity''. The IEEE was formed from the amalgamation of the American Institute of Electrical Engineers and the Institute of Radio Engineers in 1963. Due to its expansion of scope into so many related fields, it is simply referred to by the letters I-E-E-E (pronounced I-triple-E), except on legal business documents. , it is the world's largest association of technical professionals with more than 423,000 members in over 160 countries around the world. Its objectives are the educational and technical advancement of electrical and electronic engineering, telecommunications, computer engineering and similar disciplines. History Origin ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
IEEE Council On Electronic Design Automation
The Institute of Electrical and Electronics Engineers (IEEE) is a 501(c)(3) professional association for electronic engineering and electrical engineering (and associated disciplines) with its corporate office in New York City and its operations center in Piscataway, New Jersey. The mission of the IEEE is ''advancing technology for the benefit of humanity''. The IEEE was formed from the amalgamation of the American Institute of Electrical Engineers and the Institute of Radio Engineers in 1963. Due to its expansion of scope into so many related fields, it is simply referred to by the letters I-E-E-E (pronounced I-triple-E), except on legal business documents. , it is the world's largest association of technical professionals with more than 423,000 members in over 160 countries around the world. Its objectives are the educational and technical advancement of electrical and electronic engineering, telecommunications, computer engineering and similar disciplines. History Origins ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Design
''Electronic Design'' magazine, founded in 1952, is an electronics and electrical engineering trade magazine and website. History Hayden Publishing Company began publishing the bi-weekly magazine Electronic Design in December 1952, and was later published by InformaUSA, Inc. In 1986, Verenigde Nederlandse Uitgeverijen, purchased Hayden Publishing Inc. In June 1988, Verenigde Nederlandse Uitgeverijen, purchased ''Electronic Design'' from McGraw-Hill. In July 1989, Penton Media, purchased ''Electronic Design'', then in Hasbrouck, N.J., from Verenigde Nederlandse Uitgeverijen. In July 2007, Penton Media's OEM electronics publication, ''EE Product News'', merged with Penton Media's "Electronic Design" magazine. ''EE Product News'' was founded in 1941, as a monthly publication. In September 2016, Informa, purchased Penton Media, including ''Electronic Design''. In November 2019, Endeavor Business Media purchased ''Electronic Design'' from Informa. Content Sections i ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Engineering
Electronics engineering is a sub-discipline of electrical engineering which emerged in the early 20th century and is distinguished by the additional use of active components such as semiconductor devices to amplify and control electric current flow. Previously electrical engineering only used passive devices such as mechanical switches, resistors, inductors and capacitors. It covers fields such as: analog electronics, digital electronics, consumer electronics, embedded systems and power electronics. It is also involved in many related fields, for example solid-state physics, radio engineering, telecommunications, control systems, signal processing, systems engineering, computer engineering, instrumentation engineering, electric power control, robotics. The Institute of Electrical and Electronics Engineers (IEEE) is one of the most important professional bodies for electronics engineers in the US; the equivalent body in the UK is the Institution of Engineering and Technology ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
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