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TDOA FDOA Animation
Time of arrival (TOA or ToA) is the absolute time instant when a radio signal emanating from a transmitter reaches a remote receiver. The time span elapsed since the time of transmission (TOT or ToT) is the ''time of flight'' (TOF or ToF). Time difference of arrival (TDOA) is the difference between TOAs. Usage Many radiolocation systems use TOA measurements to perform geopositioning via true-range multilateration. The true range or distance can be directly calculated from the TOA as signals travel with a known velocity. TOA from two base stations will narrow a position to a position circle; data from a third base station is required to resolve the precise position to a single point. TDOA techniques such as pseudorange multilateration use the measured time difference between TOAs. Ways of synchronization As with TDOA, synchronization of the network base station with the locating reference stations is important. This synchronization can be done in different ways: * With exact synch ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Time Of Flight
Time of flight (ToF) is the measurement of the time taken by an object, particle or wave (be it acoustic, electromagnetic, etc.) to travel a distance through a medium. This information can then be used to measure velocity or path length, or as a way to learn about the particle or medium's properties (such as composition or flow rate). The traveling object may be detected directly (direct time of flight, dToF, e.g., via an ion detector in mass spectrometry) or indirectly (indirect time of flight, iToF, e.g., by light scattered from an object in laser doppler velocimetry). Overview In electronics, one of the earliest devices using the principle are ultrasonic distance-measuring devices, which emit an ultrasonic pulse and are able to measure the distance to a solid object based on the time taken for the wave to bounce back to the emitter. The ToF method is also used to estimate the electron mobility. Originally, it was designed for measurement of low-conductive thin films, later adju ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
