|
PBIST
Programmable Built-In Self-Test (PBIST) is a memory DFT feature that incorporates all the required test systems into the chip itself. The test systems implemented on-chip are as follows: * algorithmic address generator * algorithmic data generator * program storage unit * loop control mechanisms PBIST was originally adopted by large memory chips that have high pin counts and operate at high frequencies, thereby exceeding the capability of production testers. The purpose of PBIST is to avoid developing and buying more sophisticated and very expensive testers. The interface between PBIST, which is internal to the processor, and the external tester environment is through the standard JTAG TAP controller pins. Algorithms and controls are fed into the chip through the TAP controller's Test Data Input (TDI) pin. The final result of the PBIST test is read out through the Test Data Output (TDO) pin. PBIST supports the entire algorithmic memory testing requirements imposed by the productio ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Design For Testability
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
JTAG
JTAG (named after the Joint Test Action Group which codified it) is an Technical standard, industry standard for verifying designs and testing printed circuit boards after manufacture. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to logic simulation, digital simulation. It specifies the use of a dedicated debug port implementing a serial communications interface for low-overhead access without requiring direct external access to the system address and data buses. The interface connects to an on-chip Test Access Port (TAP) that implements a State (computer science), stateful protocol to access a set of test registers that present chip logic levels and device capabilities of various parts. The Joint Test Action Group formed in 1985 to develop a method of verifying designs and testing printed circuit boards after manufacture. In 1990 the Institute of Electrical and Electronics Engineers codified the results of th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Test Access Port
Test(s), testing, or TEST may refer to: * Test (assessment), an educational assessment intended to measure the respondents' knowledge or other abilities Arts and entertainment * ''Test'' (2013 film), an American film * ''Test'' (2014 film), a Russian film * ''Test'' (group), a jazz collective * ''Tests'' (album), a 1998 album by The Microphones Computing * .test, a reserved top-level domain * test (Unix), a Unix command for evaluating conditional expressions * TEST (x86 instruction), an x86 assembly language instruction People * Test (wrestler), ring name for Andrew Martin (1975–2009), Canadian professional wrestler * John Test (1771–1849), American politician * Zack Test (born 1989), American rugby union player Science and technology * Proof test * Stress testing * Test (biology), the shell of sea urchins and certain microorganisms * Test equipment Sports * Test cricket, a series of matches played by two national representative teams * Test match (rugby league), a m ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Built-in Self-test
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: *high reliability *lower repair cycle times or constraints such as: *limited technician accessibility *cost of testing during manufacture The main purpose of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment. BIST reduces cost in two ways: # reduces test-cycle duration # reduces the complexity of the test/probe setup, by reducing the number of I/O signals that must be driven/examined under tester control. Both lead to a reduction in hourly charges for automated test equipment (ATE) service. Applications BIST is commonly placed in weapons, avionics, medical devices, automotive electronics, complex machinery of all types, unattended machinery of all types, and integrated circuits. Automotive Automotive tests itself to enhance safety ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Design Automation
Electronic design automation (EDA), also referred to as electronic computer-aided design (ECAD), is a category of software tools for designing Electronics, electronic systems such as integrated circuits and printed circuit boards. The tools work together in a Design flow (EDA), design flow that chip designers use to design and analyze entire semiconductor chips. Since a modern semiconductor chip can have billions of components, EDA tools are essential for their design; this article in particular describes EDA specifically with respect to integrated circuits (ICs). History Early days Prior to the development of EDA, integrated circuits were designed by hand and manually laid out. Some advanced shops used geometric software to generate tapes for a Gerber format, Gerber photoplotter, responsible for generating a monochromatic exposure image, but even those copied digital recordings of mechanically drawn components. The process was fundamentally graphic, with the translation f ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
