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Photoelectron Spectrometer
Photoemission spectroscopy (PES), also known as photoelectron spectroscopy, refers to energy measurement of electrons emitted from solids, gases or liquids by the photoelectric effect, in order to determine the binding energies of electrons in the substance. The term refers to various techniques, depending on whether the ionization energy is provided by X-ray, EUV or UV photons. Regardless of the incident photon beam, however, all photoelectron spectroscopy revolves around the general theme of surface analysis by measuring the ejected electrons. Types X-ray photoelectron spectroscopy (XPS) was developed by Kai Siegbahn starting in 1957 and is used to study the energy levels of atomic core electrons, primarily in solids. Siegbahn referred to the technique as "electron spectroscopy for chemical analysis" (ESCA), since the core levels have small chemical shifts depending on the chemical environment of the atom that is ionized, allowing chemical structure to be determined. Siegbah ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
ARPES Analyzer Cross Section
Angle-resolved photoemission spectroscopy (ARPES) is an experimental technique used in condensed matter physics to probe the allowed energies and momenta of the electrons in a material, usually a crystalline solid. It is based on the photoelectric effect, in which an incoming photon of sufficient energy ejects an electron from the surface of a material. By directly measuring the kinetic energy and emission angle distributions of the emitted photoelectrons, the technique can map the electronic band structure and Fermi surfaces. ARPES is best suited for the study of one- or two-dimensional materials. It has been used by physicists to investigate high-temperature superconductors, graphene, topological materials, quantum well states, and materials exhibiting charge density waves. ARPES systems consist of a monochromatic light source to deliver a narrow beam of photons, a sample holder connected to a manipulator used to position the sample of a material, and an electron spectrome ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
