Nanometrology
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Nanometrology
Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Nanometrology has a crucial role in order to produce nanomaterials and devices with a high degree of accuracy and reliability in nanomanufacturing. A challenge in this field is to develop or create new measurement techniques and standards to meet the needs of next-generation advanced manufacturing, which will rely on nanometer scale materials and technologies. The needs for measurement and characterization of new sample structures and characteristics far exceed the capabilities of current measurement science. Anticipated advances in emerging U.S. nanotechnology industries will require revolutionary metrology with higher resolution and accuracy than has previously been envisioned. Introduction Control of the critical dimensions are the most important factors in nanotechnology. Nanometrology today, is to a large extent based on the development in semiconductor technology. Nan ...
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Nanomaterials
* Nanomaterials describe, in principle, materials of which a single unit is sized (in at least one dimension) between 1 and 100 nm (the usual definition of nanoscale). Nanomaterials research takes a materials science-based approach to nanotechnology, leveraging advances in materials metrology and synthesis which have been developed in support of microfabrication research. Materials with structure at the nanoscale often have unique optical, electronic, thermo-physical or mechanical properties. Nanomaterials are slowly becoming commercialized and beginning to emerge as commodities. Definition In ISO/TS 80004, ''nanomaterial'' is defined as the "material with any external dimension in the nanoscale or having internal structure or surface structure in the nanoscale", with ''nanoscale'' defined as the "length range approximately from 1 nm to 100 nm". This includes both ''nano-objects'', which are discrete pieces of material, and ''nanostructured materials'', which have inte ...
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NIST Next-Generation Nanometrology Research
The National Institute of Standards and Technology (NIST) is an agency of the United States Department of Commerce whose mission is to promote American innovation and industrial competitiveness. NIST's activities are organized into physical science laboratory programs that include nanoscale science and technology, engineering, information technology, neutron research, material measurement, and physical measurement. From 1901 to 1988, the agency was named the National Bureau of Standards. History Background The Articles of Confederation, ratified by the colonies in 1781, provided: The United States in Congress assembled shall also have the sole and exclusive right and power of regulating the alloy and value of coin struck by their own authority, or by that of the respective states—fixing the standards of weights and measures throughout the United States. Article 1, section 8, of the Constitution of the United States, ratified in 1789, granted these powers to the new Congre ...
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Standard (metrology)
In metrology (the science of measurement), a standard (or etalon) is an object, system, or experiment that bears a defined relationship to a unit of measurement of a physical quantity. Standards are the fundamental reference for a system of weights and measures, against which all other measuring devices are compared. Historical standards for length, volume, and mass were defined by many different authorities, which resulted in confusion and inaccuracy of measurements. Modern measurements are defined in relationship to internationally standardized reference objects, which are used under carefully controlled laboratory conditions to define the units of length, mass, electrical potential, and other physical quantities. Hierarchy of standards There is a three-level hierarchy of physical measurement standards. At the top of the tree are the master standards – these are known as ''primary standards''. Primary standards are made to the highest metrological quality and are the definit ...
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Thermal Drift
A thermal column (or thermal) is a rising mass of buoyant air, a convective current in the atmosphere, that transfers heat energy vertically. Thermals are created by the uneven heating of Earth's surface from solar radiation, and are an example of convection, specifically atmospheric convection. Thermals on Earth The Sun warms the ground, which in turn warms the air directly above. The warm air near the surface expands, becoming less dense than the surrounding air. The lighter air rises and cools due to its expansion in the lower pressure at higher altitudes. It stops rising when it has cooled to the same temperature, thus density, as the surrounding air. Associated with a thermal is a downward flow surrounding the thermal column. The downward-moving exterior is caused by colder air being displaced at the top of the thermal. The size and strength of thermals are influenced by the properties of the lower atmosphere (the ''troposphere''). When the air is cold, bubbles of warm ...
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Noise
Noise is unwanted sound considered unpleasant, loud or disruptive to hearing. From a physics standpoint, there is no distinction between noise and desired sound, as both are vibrations through a medium, such as air or water. The difference arises when the brain receives and perceives a sound. Acoustic noise is any sound in the acoustic domain, either deliberate (e.g., music or speech) or unintended. In contrast, Noise (electronics), noise in electronics may not be audible to the human ear and may require instruments for detection. In audio engineering, noise can refer to the unwanted residual electronic noise signal that gives rise to acoustic noise heard as a Hiss (electromagnetic), hiss. This signal noise is commonly measured using A-weighting or ITU-R 468 noise weighting, ITU-R 468 weighting. In experimental sciences, noise can refer to any random fluctuations of data that hinders perception of a signal. Measurement Sound is measured based on the amplitude and frequency ...
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Calibration
In measurement technology and metrology, calibration is the comparison of measurement values delivered by a device under test with those of a calibration standard of known accuracy. Such a standard could be another measurement device of known accuracy, a device generating the quantity to be measured such as a voltage, a sound tone, or a physical artifact, such as a meter ruler. The outcome of the comparison can result in one of the following: * no significant error being noted on the device under test * a significant error being noted but no adjustment made * an adjustment made to correct the error to an acceptable level Strictly speaking, the term "calibration" means just the act of comparison and does not include any subsequent adjustment. The calibration standard is normally traceable to a national or international standard held by a metrology body. BIPM Definition The formal definition of calibration by the International Bureau of Weights and Measures (BIPM) is the fo ...
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Magnification
Magnification is the process of enlarging the apparent size, not physical size, of something. This enlargement is quantified by a calculated number also called "magnification". When this number is less than one, it refers to a reduction in size, sometimes called ''minification'' or ''de-magnification''. Typically, magnification is related to scaling up visuals or images to be able to see more detail, increasing resolution, using microscope, printing techniques, or digital processing. In all cases, the magnification of the image does not change the perspective of the image. Examples of magnification Some optical instruments provide visual aid by magnifying small or distant subjects. * A magnifying glass, which uses a positive (convex) lens to make things look bigger by allowing the user to hold them closer to their eye. * A telescope, which uses its large objective lens or primary mirror to create an image of a distant object and then allows the user to examine the image clo ...
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Surface Roughness
Surface roughness, often shortened to roughness, is a component of surface finish (surface texture). It is quantified by the deviations in the direction of the normal vector of a real surface from its ideal form. If these deviations are large, the surface is rough; if they are small, the surface is smooth. In surface metrology, roughness is typically considered to be the high-frequency, short-wavelength component of a measured surface. However, in practice it is often necessary to know both the amplitude and frequency to ensure that a surface is fit for a purpose. Roughness plays an important role in determining how a real object will interact with its environment. In tribology, rough surfaces usually wear more quickly and have higher friction coefficients than smooth surfaces. Roughness is often a good predictor of the performance of a mechanical component, since irregularities on the surface may form nucleation sites for cracks or corrosion. On the other hand, roughness may pr ...
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National Institute Of Standards And Technology
The National Institute of Standards and Technology (NIST) is an agency of the United States Department of Commerce whose mission is to promote American innovation and industrial competitiveness. NIST's activities are organized into physical science laboratory programs that include nanoscale science and technology, engineering, information technology, neutron research, material measurement, and physical measurement. From 1901 to 1988, the agency was named the National Bureau of Standards. History Background The Articles of Confederation, ratified by the colonies in 1781, provided: The United States in Congress assembled shall also have the sole and exclusive right and power of regulating the alloy and value of coin struck by their own authority, or by that of the respective states—fixing the standards of weights and measures throughout the United States. Article 1, section 8, of the Constitution of the United States, ratified in 1789, granted these powers to the new Congr ...
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International Electrotechnical Commission
The International Electrotechnical Commission (IEC; in French: ''Commission électrotechnique internationale'') is an international standards organization that prepares and publishes international standards for all electrical, electronic and related technologies – collectively known as "electrotechnology". IEC standards cover a vast range of technologies from power generation, transmission and distribution to home appliances and office equipment, semiconductors, fibre optics, batteries, solar energy, nanotechnology and marine energy as well as many others. The IEC also manages four global conformity assessment systems that certify whether equipment, system or components conform to its international standards. All electrotechnologies are covered by IEC Standards, including energy production and distribution, electronics, magnetics and electromagnetics, electroacoustics, multimedia, telecommunication and medical technology, as well as associated general disciplines such as t ...
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Interferometer
Interferometry is a technique which uses the ''interference'' of superimposed waves to extract information. Interferometry typically uses electromagnetic waves and is an important investigative technique in the fields of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, spectroscopy (and its applications to chemistry), quantum mechanics, nuclear and particle physics, plasma physics, remote sensing, biomolecular interactions, surface profiling, microfluidics, mechanical stress/strain measurement, velocimetry, optometry, and making holograms. Interferometers are devices that extract information from interference. They are widely used in science and industry for the measurement of microscopic displacements, refractive index changes and surface irregularities. In the case with most interferometers, light from a single source is split into two beams that travel in different optical paths, which are then combined again to produce in ...
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