|
High-temperature Operating Life
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals. This reliability stress test is sometimes referred to as a ''lifetime test'', ''device life test'' or ''extended burn in test'' and is used to trigger potential failure modes and assess IC lifetime. There are several types of HTOL: * AEC Documents. * JEDEC Standards. * Mil standards.Mil standard Design considerations The main aim of the HTOL is to age the device such that a short experiment will allow the lifetime of the IC to be predicted (e.g. 1,000 HTOL hours sh ...[...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Integrated Circuits
An integrated circuit (IC), also known as a microchip or simply chip, is a set of electronic circuits, consisting of various electronic components (such as transistors, resistors, and capacitors) and their interconnections. These components are etched onto a small, flat piece ("chip") of semiconductor material, usually silicon. Integrated circuits are used in a wide range of electronic devices, including computers, smartphones, and televisions, to perform various functions such as processing and storing information. They have greatly impacted the field of electronics by enabling device miniaturization and enhanced functionality. Integrated circuits are orders of magnitude smaller, faster, and less expensive than those constructed of discrete components, allowing a large transistor count. The IC's mass production capability, reliability, and building-block approach to integrated circuit design have ensured the rapid adoption of standardized ICs in place of designs using discre ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Trimmer (electronics)
A trimmer, or preset, is a miniature adjustable electrical component. It is meant to be set correctly when installed in some device, and never seen or adjusted by the device's user. Trimmers can be variable resistors (potentiometers), variable capacitors, or trimmable inductors. They are common in precision circuitry like Audiovisual, A/V components, and may need to be adjusted when the equipment is serviced. Trimpots (trimmer potentiometers) are often used to initially calibrate equipment after manufacturing. Unlike many other variable controls, trimmers are mounted directly on circuit boards, turned with a small screwdriver and rated for many fewer adjustments over their lifetime. Trimmers like trimmable inductors and trimmable capacitors are usually found in superhet radio and television receivers, in the intermediate frequency (IF), oscillator and radio frequency (RF) circuits. They are adjusted into the right position during the alignment procedure of the receiver. General ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Data-driven
Data ( , ) are a collection of discrete or continuous value (semiotics), values that convey information, describing the quantity, qualitative property, quality, fact, statistics, other basic units of meaning, or simply sequences of symbols that may be further interpretation (logic), interpreted formally. A datum is an individual value in a collection of data. Data are usually organized into structures such as table (information), tables that provide additional context and meaning, and may themselves be used as data in larger structures. Data may be Data (computer science), used as variable (research), variables in a computational process. Data may represent abstract ideas or concrete measurements. Data are commonly used in scientific research, economics, and virtually every other form of human organizational activity. Examples of data sets include price indices (such as the consumer price index), unemployment rates, literacy rates, and census data. In this context, data repr ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Physics Of Failure
Physics of failure is a technique under the practice of reliability design that leverages the knowledge and understanding of the processes and mechanisms that induce failure to predict reliability and improve product performance. Other definitions of Physics of Failure include: * A science-based approach to reliability that uses modeling and simulation to design-in reliability. It helps to understand system performance and reduce decision risk during design and after the equipment is fielded. This approach models the root causes of failure such as fatigue, fracture, wear, and corrosion. * An approach to the design and development of reliable product to prevent failure, based on the knowledge of root cause failure mechanisms. The Physics of Failure (PoF) concept is based on the understanding of the relationships between requirements and the physical characteristics of the product and their variation in the manufacturing processes, and the reaction of product elements and materials t ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Extrapolation
In mathematics Mathematics is a field of study that discovers and organizes methods, Mathematical theory, theories and theorems that are developed and Mathematical proof, proved for the needs of empirical sciences and mathematics itself. There are many ar ..., extrapolation is a type of estimation, beyond the original observation range, of the value of a variable on the basis of its relationship with another variable. It is similar to interpolation, which produces estimates between known observations, but extrapolation is subject to greater uncertainty and a higher risk of producing meaningless results. Extrapolation may also mean extension of a wikt:method, method, assuming similar methods will be applicable. Extrapolation may also apply to human experience to project, extend, or expand known experience into an area not known or previously experienced. By doing so, one makes an assumption of the unknown [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Highly Accelerated Stress Test
The highly accelerated stress test (HAST) method was first proposed by Jeffrey E. Gunn, Sushil K. Malik, and Purabi M. Mazumdar of IBM. The acceleration factor for elevated humidity is empirically derived to be :AF_\text = e^, :\text is a value which normally goes from 0.1 to 0.15 where ''RH''s is the stressed humidity, ''RH''o is the operating-environment humidity, and ''n'' is an empirically derived constant (usually 1 < ''n'' < 5). The acceleration factor for elevated temperature is derived to be : where ''E''a is the activation energy for the temperature-induced failure (most often 0.7 eV for electronics), ''k'' is the , ''T''o is the |
Sampling (statistics)
In this statistics, quality assurance, and survey methodology, sampling is the selection of a subset or a statistical sample (termed sample for short) of individuals from within a population (statistics), statistical population to estimate characteristics of the whole population. The subset is meant to reflect the whole population, and statisticians attempt to collect samples that are representative of the population. Sampling has lower costs and faster data collection compared to recording data from the entire population (in many cases, collecting the whole population is impossible, like getting sizes of all stars in the universe), and thus, it can provide insights in cases where it is infeasible to measure an entire population. Each observation measures one or more properties (such as weight, location, colour or mass) of independent objects or individuals. In survey sampling, weights can be applied to the data to adjust for the sample design, particularly in stratified samplin ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Activation Energy
In the Arrhenius model of reaction rates, activation energy is the minimum amount of energy that must be available to reactants for a chemical reaction to occur. The activation energy (''E''a) of a reaction is measured in kilojoules per mole (kJ/mol) or kilocalories per mole (kcal/mol). Activation energy can be thought of as a magnitude of the potential barrier (sometimes called the energy barrier) separating minima of the potential energy surface pertaining to the initial and final thermodynamic state. For a chemical reaction to proceed at a reasonable rate, the temperature of the system should be high enough such that there exists an appreciable number of molecules with translational energy equal to or greater than the activation energy. The term "activation energy" was introduced in 1889 by the Swedish scientist Svante Arrhenius. Other uses Although less commonly used, activation energy also applies to nuclear reactions and various other physical phenomena. Temperature ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Arrhenius Equation
In physical chemistry, the Arrhenius equation is a formula for the temperature dependence of reaction rates. The equation was proposed by Svante Arrhenius in 1889, based on the work of Dutch chemist Jacobus Henricus van 't Hoff who had noted in 1884 that the Van 't Hoff equation for the temperature dependence of equilibrium constants suggests such a formula for the rates of both forward and reverse reactions. This equation has a vast and important application in determining the rate of chemical reactions and for calculation of Activation energy, energy of activation. Arrhenius provided a physical justification and interpretation for the formula.Keith J. Laidler, Laidler, K. J. (1987) ''Chemical Kinetics'', Third Edition, Harper & Row, p. 42 Currently, it is best seen as an empirical relationship.Kenneth Connors, Chemical Kinetics, 1990, VCH Publishers It can be used to model the temperature variation of Mass diffusivity, diffusion coefficients, population of Vacancy defect, crystal ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Failure Analysis
Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective actions or liability. According to Bloch and Geitner, ”machinery failures reveal a reaction chain of cause and effect… usually a deficiency commonly referred to as the symptom…”. Failure analysis can save money, lives, and resources if done correctly and acted upon. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of new products and for the improvement of existing products. The failure analysis process relies on collecting failed components for subsequent examination of the cause or causes of failure using a wide array of methods, especially microscopy and spectroscopy. Nondestructive testing (NDT) methods (such as industrial computed tomography scanning) are valuable because the failed products are unaffected by analysis ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Boundary Scan
Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit (IC). Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990. In 1994, a supplement that contains a description of the boundary scan description language (BSDL) was added which describes the boundary-scan logic content of IEEE Std 1149.1 compliant devices. Since then, this standard has been adopted by electronic device companies all over the world. Boundary scan is now mostly synonymous with JTAG.IEEE Std 1149.1 (JTAG) Testability ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
