Fault Grading

	Fault Grading Fault grading is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults. It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained.{{citation, title = Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication, first = Hubert, last = Kaeslin, page = 24, publisher = Cambridge University Press, url = https://books.google.com/books?id=gdRStcYgf2oC&dq=%22fault+grading%22&pg=PA24, isbn = 9780521882675, date = 2008-04-28 See also * Automatic test pattern generation * Design for Test Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. Th ... References Hardware ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu]
	Testability Testability is a primary aspect of Science and the Scientific Method and is a property applying to an empirical hypothesis, involves two components: #Falsifiability or defeasibility, which means that counterexamples to the hypothesis are logically possible. #The practical feasibility of observing a reproducible series of such counterexamples if they do exist. In short, a hypothesis is testable if there is a possibility of deciding whether it is true or false based on experimentation by anyone. This allows anyone to decide whether a theory can be supported or refuted by data. However, the interpretation of experimental data may be also inconclusive or uncertain. Karl Popper introduced the concept that scientific knowledge had the property of Falsifiability.as published in ''The Logic of Scientific Discovery.Karl Popper "The Logic of Scientific Discovery", 1934 (as Logik der Forschung, English translation 1959)'', ISBN 0415278449 and 2002 ISBN 9780415278447, 0415278449 See also ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu]
	Design For Test Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu]
	Automatic Test Pattern Generation ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (Scan chain, full scan, synchronous sequential, or asynchron ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu]
	Design For Test Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate th ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu]