Fault grading is a procedure that rates
testability
Testability is a primary aspect of Science and the Scientific Method and is a property applying to an empirical hypothesis, involves two components:
#Falsifiability or defeasibility, which means that counterexamples to the hypothesis are logicall ...
by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults.
It is used for refining both the
test circuitry and the
test patterns iteratively, until a satisfactory fault coverage is obtained.
[{{citation, title = Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication, first = Hubert, last = Kaeslin, page = 24, publisher = Cambridge University Press, url = https://books.google.com/books?id=gdRStcYgf2oC&dq=%22fault+grading%22&pg=PA24, isbn = 9780521882675, date = 2008-04-28]
See also
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Automatic test pattern generation ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic t ...
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Design for Test Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. Th ...
References
Hardware testing