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Detectors For Transmission Electron Microscopy
There are a variety of technologies available for detecting and recording the images, diffraction patterns, and electron energy loss spectra produced using transmission electron microscopy (TEM). Traditional detection techniques Traditionally,TEM image or diffraction pattern could be observed using a fluorescent viewing screen, consisting of powdered ZnS or ZnS/CdS, which is excited by the electron beam via cathodoluminescence. Once the microscopist could see a suitable image on their viewing screen, images could then be recorded using photographic film. For electron microscopes, film typically consisted of a gelatin and silver halide emulsion layer on a plastic support base. The silver halide would be converted to silver upon exposure to the electron beam, and the film could then be chemically developed to form an image, which could be digitized for analysis using a film scanner. In modern TEMs, film has largely been replaced by electronic detectors. CCD cameras Charge couple ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Diffraction
Electron diffraction refers to the bending of electron beams around atomic structures. This behaviour, typical for waves, is applicable to electrons due to the wave–particle duality stating that electrons behave as both particles and waves. Since the diffracted beams interfere, they generate diffraction patterns widely used for analysis of the objects which caused the diffraction. Therefore, electron diffraction can also refer to derived experimental techniques used for material characterization. This technique is similar to X-ray and neutron diffraction. Electron diffraction is most frequently used in solid state physics and chemistry to study crystalline, quasi-crystalline and amorphous materials using electron microscopes. In these instruments, electrons are accelerated by an electrostatic potential in order to gain energy and shorten their wavelength. With the wavelength sufficiently short, the atomic structure acts as a diffraction grating generating diffraction patte ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Complementary Metal Oxide Semiconductor
Complementary metal–oxide–semiconductor (CMOS, pronounced "sea-moss", ) is a type of metal–oxide–semiconductor field-effect transistor (MOSFET) fabrication process that uses complementary and symmetrical pairs of p-type and n-type MOSFETs for logic functions. CMOS technology is used for constructing integrated circuit (IC) chips, including microprocessors, microcontrollers, memory chips (including CMOS BIOS), and other digital logic circuits. CMOS technology is also used for analog circuits such as image sensors (CMOS sensors), data converters, RF circuits (RF CMOS), and highly integrated transceivers for many types of communication. The CMOS process was originally conceived by Frank Wanlass at Fairchild Semiconductor and presented by Wanlass and Chih-Tang Sah at the International Solid-State Circuits Conference in 1963. Wanlass later filed US patent 3,356,858 for CMOS circuitry and it was granted in 1967. commercialized the technology with the trademark "C ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
4D Scanning Transmission Electron Microscopy (4D STEM)
4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point as the beam rasters across a 2 dimensional region in real space, hence the name 4D STEM. Its development was enabled by evolution in STEM detectors and improvements computational power. The technique has applications in visual diffraction imaging, phase orientation and strain mapping, phase contrast analysis, among others. The name 4D STEM is common in literature, however it is known by other names: 4D STEM EELS, ND STEM (N- since the number of dimensions could be higher than 4), position resolved diffraction (PRD), spatial resolved diffractometry, momentum-resolved STEM, "nanobeam precision electron diffraction", scanning electron nano diffr ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Photomultiplier
A photomultiplier is a device that converts incident photons into an electrical signal. Kinds of photomultiplier include: * Photomultiplier tube, a vacuum tube converting incident photons into an electric signal. Photomultiplier tubes (PMTs for short) are members of the class of vacuum tubes, and more specifically vacuum phototubes, which are extremely sensitive detectors of light in the ultraviolet, visible, and near-infrared ranges of the electromagnetic spectrum. ** Magnetic photomultiplier, developed by the Soviets in the 1930s. ** Electrostatic photomultiplier, a kind of photomultiplier tube demonstrated by Jan Rajchman of RCA Laboratories in Princeton, NJ in the late 1930s which became the standard for all future commercial photomultipliers. The first mass-produced photomultiplier, the Type 931, was of this design and is still commercially produced today. * Silicon photomultiplier, a solid-state device converting incident photons into an electric signal. Silicon photomultiplie ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Annular Dark-field Imaging
Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector. Conventional TEM dark-field imaging uses an objective aperture in order to only collect scattered electrons that pass through. In contrast, STEM dark-field imaging does not use an aperture to differentiate the scattered electrons from the main beam, but uses an annular detector to collect only the scattered electrons. Consequently, the contrast mechanisms are different between conventional dark field imaging and STEM dark field. An annular dark field detector collects electrons from an annulus around the beam, sampling far more scattered electrons than can pass through an objective aperture. This gives an advantage in terms of signal collection efficiency and allows the main beam to pass to an electron energy loss spectroscopy (EELS) detector, allowing both types of mea ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Transmission Electron Microscopy
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is tɛmor sti:i:ɛm As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data. A typical STEM is a conventional transmission el ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Transmission Electron Microscopy Srtio3 Compare Adf Abf
Scan may refer to: Acronyms * Schedules for Clinical Assessment in Neuropsychiatry (SCAN), a psychiatric diagnostic tool developed by WHO * Shared Check Authorization Network (SCAN), a database of bad check writers and collection agency for bad checks * Space Communications and Navigation Program (SCaN) * Social Cognitive and Affective Neuroscience (journal) * Scientific content analysis (SCAN), also known as statement analysis Businesses * Scan Furniture, Washington, D.C., US chain * SCAN Health Plan, not-for-profit health care company based in Long Beach, California * Scan AB or Scan Foods UK Ltd, the Swedish and UK subsidiaries of the Finnish HKScan Oyj * Seattle Community Access Network, Seattle, Washington, US TV channel * Scan (company), a software company based in Provo, Utah, US Electronics or computer related * 3D scanning * Counter-scanning, in physical micro and nanotopography measuring instruments like scanning probe microscope * Elevator algorithm (also SCAN ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Active Pixel Sensor
An active-pixel sensor (APS) is an image sensor where each pixel sensor unit cell has a photodetector (typically a pinned photodiode) and one or more active transistors. In a metal–oxide–semiconductor (MOS) active-pixel sensor, MOS field-effect transistors (MOSFETs) are used as amplifiers. There are different types of APS, including the early NMOS APS and the now much more common complementary MOS (CMOS) APS, also known as the CMOS sensor. CMOS sensors are used in digital camera technologies such as cell phone cameras, web cameras, most modern digital pocket cameras, most digital single-lens reflex cameras (DSLRs), and mirrorless interchangeable-lens cameras (MILCs). CMOS sensors emerged as an alternative to charge-coupled device (CCD) image sensors and eventually outsold them by the mid-2000s decade. The term ''active pixel sensor'' is also used to refer to the individual pixel sensor itself, as opposed to the image sensor. In this case, the image sensor is sometimes c ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Hybrid Pixel Detector
Hybrid pixel detectors are a type of ionizing radiation detector consisting of an array of diodes based on semiconductor technology and their associated electronics. The term “hybrid” stems from the fact that the two main elements from which these devices are built, the semiconductor sensor and the readout chip (also known as application-specific integrated circuit or ASIC), are manufactured independently and later electrically coupled by means of a bump-bonding process. Ionizing particles are detected as they produce electron-hole pairs through their interaction with the sensor element, usually made of doped silicon or cadmium telluride. The readout ASIC is segmented into pixels containing the necessary electronics to amplify and measure the electrical signals induced by the incoming particles in the sensor layer. Hybrid pixel detectors made to operate in single-photon mode are known as Hybrid Photon Counting Detectors (HPCDs). These detectors are designed to count the number o ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Thermoelectric Cooling
Thermoelectric cooling uses the Peltier effect to create a heat flux at the junction of two different types of materials. A Peltier cooler, heater, or thermoelectric heat pump is a solid-state active heat pump which transfers heat from one side of the device to the other, with consumption of electrical energy, depending on the direction of the current. Such an instrument is also called a Peltier device, Peltier heat pump, solid state refrigerator, or thermoelectric cooler (TEC) and occasionally a thermoelectric battery. It can be used either for heating or for cooling, although in practice the main application is cooling. It can also be used as a temperature controller that either heats or cools. This technology is far less commonly applied to refrigeration than vapor-compression refrigeration is. The primary advantages of a Peltier cooler compared to a vapor-compression refrigerator are its lack of moving parts or circulating liquid, very long life, invulnerability to leaks, smal ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Energy Loss Spectroscopy
In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their paths slightly and randomly deflected. The amount of energy loss can be measured via an electron spectrometer and interpreted in terms of what caused the energy loss. Inelastic interactions include phonon excitations, inter- and intra-band transitions, plasmon excitations, inner shell ionizations, and Cherenkov radiation. The inner-shell ionizations are particularly useful for detecting the elemental components of a material. For example, one might find that a larger-than-expected number of electrons comes through the material with 285 eV less energy than they had when they entered the material. This is approximately the amount of energy needed to remove an inner-shell electron from a carbon atom, which can be taken as evidence ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Yttrium Aluminium Garnet
Yttrium aluminium garnet (YAG, Y3 Al5 O12) is a synthetic crystalline material of the garnet group. It is a cubic yttrium aluminium oxide phase, with other examples being YAlO3 (YAP) in a hexagonal or an orthorhombic, perovskite-like form, and the monoclinic Y4Al2O9 (YAM). Due to its broad optical transparency, low internal stress, high hardness, chemical and heat resistance, YAG is used for a variety of optics. Its lack of birefringence (unlike sapphire) makes it an interesting material for high-energy/high-power laser systems. Laser damage levels of YAG ranged from 1.1 to 2.2 kJ/cm² (1064 nm, 10 ns). YAG, like garnet and sapphire, has no uses as a laser medium when pure. However, after being doped with an appropriate ion, YAG is commonly used as a host material in various solid-state lasers. Rare earth elements such as neodymium and erbium can be doped into YAG as active laser ions, yielding Nd:YAG and Er:YAG lasers, respectively. Cerium-doped YAG (Ce:YAG ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
