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Counter-scanning
Counter-scanning (CS) is a scanning method that allows correcting raster distortions caused by drift of the probe of scanning microscope relative to the measured surface. During counter-scanning two surface scans, viz., direct scan and counter scan are obtained (see Fig. 1). The counter scan starts in the point where the direct scan ends. This point is called the coincidence point (CP). With the counter scan, the probe movement along the raster line and the probe movement from one raster line to the other raster line are carried out along the directions that are opposite to the movements in the direct scan. The obtained pair of images is called counter-scanned images (CSIs). Principles When the raster distortions are linear, i. e., when the drift velocity is constant, to correct drift, it is sufficient to measure coordinates of only one common feature in the direct and the counter scans. In case of nonlinear distortion, when the drift velocity varies during the scan, the ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Counter-scanned Images
Counter-scanning (CS) is a scanning method that allows correcting raster distortions caused by drift of the probe of scanning microscope relative to the measured surface. During counter-scanning two surface scans, viz., direct scan and counter scan are obtained (see Fig. 1). The counter scan starts in the point where the direct scan ends. This point is called the coincidence point (CP). With the counter scan, the probe movement along the raster line and the probe movement from one raster line to the other raster line are carried out along the directions that are opposite to the movements in the direct scan. The obtained pair of images is called counter-scanned images (CSIs). Principles When the raster distortions are linear, i. e., when the drift velocity is constant, to correct drift, it is sufficient to measure coordinates of only one common feature in the direct and the counter scans. In case of nonlinear distortion, when the drift velocity varies during the scan, the ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Probe Microscopy
Scan may refer to: Acronyms * Schedules for Clinical Assessment in Neuropsychiatry (SCAN), a psychiatric diagnostic tool developed by WHO * Shared Check Authorization Network (SCAN), a database of bad check writers and collection agency for bad checks * Space Communications and Navigation Program (SCaN) * Social Cognitive and Affective Neuroscience (journal) * Scientific content analysis (SCAN), also known as statement analysis Businesses * Scan Furniture, Washington, D.C., US chain * SCAN Health Plan, not-for-profit health care company based in Long Beach, California * Scan AB or Scan Foods UK Ltd, the Swedish and UK subsidiaries of the Finnish HKScan Oyj * Seattle Community Access Network, Seattle, Washington, US TV channel * Scan (company), a software company based in Provo, Utah, US Electronics or computer related * 3D scanning * Counter-scanning, in physical micro and nanotopography measuring instruments like scanning probe microscope * Elevator algorithm (also SC ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Feature-oriented Scanning
Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS). __TOC__ Topography Any topography element that looks like a hill or a pit in wide sense may be taken as a surface feature. Examples of surface features (objects) are: atoms, interstices, molecules, grains, nanoparticles, clusters, crystallites, quantum dots, nanoislets, pillars, pores, short nanowires, short nanorods, short nanotubes, viruses, bact ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Creep (deformation)
In materials science, creep (sometimes called cold flow) is the tendency of a solid material to move slowly or deform permanently under the influence of persistent mechanical stresses. It can occur as a result of long-term exposure to high levels of stress that are still below the yield strength of the material. Creep is more severe in materials that are subjected to heat for long periods and generally increases as they near their melting point. The rate of deformation is a function of the material's properties, exposure time, exposure temperature and the applied structural load. Depending on the magnitude of the applied stress and its duration, the deformation may become so large that a component can no longer perform its function – for example creep of a turbine blade could cause the blade to contact the casing, resulting in the failure of the blade. Creep is usually of concern to engineers and metallurgists when evaluating components that operate under high stresses or hig ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Logarithm
In mathematics, the logarithm is the inverse function to exponentiation. That means the logarithm of a number to the base is the exponent to which must be raised, to produce . For example, since , the ''logarithm base'' 10 of is , or . The logarithm of to ''base'' is denoted as , or without parentheses, , or even without the explicit base, , when no confusion is possible, or when the base does not matter such as in big O notation. The logarithm base is called the decimal or common logarithm and is commonly used in science and engineering. The natural logarithm has the number as its base; its use is widespread in mathematics and physics, because of its very simple derivative. The binary logarithm uses base and is frequently used in computer science. Logarithms were introduced by John Napier in 1614 as a means of simplifying calculations. They were rapidly adopted by navigators, scientists, engineers, surveyors and others to perform high-a ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Journal Of Vacuum Science And Technology B
The ''Journal of Vacuum Science and Technology'' is a peer-reviewed scientific journal published in two parts, ''A'' and ''B'', by the American Institute of Physics on behalf of the American Vacuum Society. It was established in 1964 and the editor-in-chief is Eray Aydil (University of Minnesota). History *1964–1982 ''Journal of Vacuum Science and Technology'' *1983–present ''Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films'' *1983–1990 ''Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena'' *1991–present ''Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures'' Part ''A'' Part ''A'' covers applied surface science, electronic materials and processing, fusion technology, plasma technology, surface science, thin films, vacuum metallurgy, and vacuum technology. According to the ''Journal Citation Reports'', the journal has a 2015 impact factor of 1.724. Part ''B'' Part ''B'' covers vacuum and ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Atomic Force Microscope
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the diffraction-limited system, optical diffraction limit. Overview Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the diffraction limited, optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force. Abilities The AFM has three major abilities: force measurement, topographic imaging, and manipulation. In force measurement, AFMs can be used to measure the ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Microscopes
A microscope () is a laboratory instrument used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope. Microscopic means being invisible to the eye unless aided by a microscope. There are many types of microscopes, and they may be grouped in different ways. One way is to describe the method an instrument uses to interact with a sample and produce images, either by sending a beam of light or electrons through a sample in its optical path, by detecting photon emissions from a sample, or by scanning across and a short distance from the surface of a sample using a probe. The most common microscope (and the first to be invented) is the optical microscope, which uses lenses to refract visible light that passed through a thinly sectioned sample to produce an observable image. Other major types of microscopes are the fluorescence microscope, electron microscope (both the transmi ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
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