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Charged-device Model
The charged-device model (CDM) is a model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge (ESD). The model is an alternative to the human-body model (HBM). Devices that are classified according to CDM are exposed to a charge at a standardized voltage level, and then tested for survival. If it withstands this voltage level, it is tested at the next level and so on, until the device fails. CDM is standardized as ANSI/ESDA/JEDEC joint standard JS-002. See also * Human-body model * Transmission-line pulse Transmission-Line Pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic-discharge (ESD) events. The concept was described shortly after WWII in pp. 175–189 oPulse ... External links JEDEC standard JS-002-2014 ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level Electrical bre ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electrostatic Discharge
Electrostatic discharge (ESD) is a sudden and momentary flow of electric current between two electrically charged objects caused by contact, an short circuit, electrical short or dielectric breakdown. A buildup of static electricity can be caused by tribocharging or by electrostatic induction. The ESD occurs when differently-charged objects are brought close together or when the dielectric between them breaks down, often creating a visible electric spark, spark. ESD can create spectacular electric sparks (lightning, with the accompanying sound of thunder, is a large-scale ESD event), but also less dramatic forms which may be neither seen nor heard, yet still be large enough to cause damage to sensitive electronic devices. Electric sparks require a field strength above approximately 40 kV/cm in air, as notably occurs in lightning strikes. Other forms of ESD include corona discharge from sharp electrodes and brush discharge from blunt electrodes. ESD can cause harmful effects of imp ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Human-body Model
The human-body model (HBM) is the most commonly used model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge (ESD). The model is a simulation of the discharge which might occur when a human touches an electronic device. The HBM definition most widely used is the test model defined in the United States military standard, MIL-STD-883, Method 3015.9, Electrostatic Discharge Sensitivity Classification. This method establishes a simplified equivalent electrical circuit and the necessary test procedures required to model an HBM ESD event. An internationally widely used standard iJEDEC standard JS-001 HBM is used primarily for manufacturing environments to quantify an integrated circuit to survive the manufacturing process. A similar standard, IEC 61000-4-2, is used for system level testing and quantifies protection levels for a real world ESD event in an uncontrolled environment. Model In both JS-001-2012 and MIL-STD-883H the charged ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Human-body Model
The human-body model (HBM) is the most commonly used model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge (ESD). The model is a simulation of the discharge which might occur when a human touches an electronic device. The HBM definition most widely used is the test model defined in the United States military standard, MIL-STD-883, Method 3015.9, Electrostatic Discharge Sensitivity Classification. This method establishes a simplified equivalent electrical circuit and the necessary test procedures required to model an HBM ESD event. An internationally widely used standard iJEDEC standard JS-001 HBM is used primarily for manufacturing environments to quantify an integrated circuit to survive the manufacturing process. A similar standard, IEC 61000-4-2, is used for system level testing and quantifies protection levels for a real world ESD event in an uncontrolled environment. Model In both JS-001-2012 and MIL-STD-883H the charged ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Transmission-line Pulse
Transmission-Line Pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic-discharge (ESD) events. The concept was described shortly after WWII in pp. 175–189 oPulse Generators Vol. 5 of the MIT Radiation Lab Series. Also, D. Bradley, J. Higgins, M. Key, and S. Majumdar realized a TLP-based laser-triggered spark gap for kilovolt pulses of accurately variable timing in 1969. For investigation of ESD and electrical-overstress (EOS) effects a measurement system using a TLP generator has been introduced first bT. Maloney and N. Khurana in 1985 Since then, the technique has become indispensable for integrated circuit ESD protection development. The TLP technique is based on charging a long, floating cable to a pre-determined voltage, and discharging it into a Device-Under-Test (DUT). The cable discharge emulates an electro-static discharge event, but employing time-domain reflectometry (TDR), the ch ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electrical Breakdown
Electrical breakdown or dielectric breakdown is a process that occurs when an electrical insulating material, subjected to a high enough voltage, suddenly becomes an electrical conductor and electric current flows through it. All insulating materials undergo breakdown when the electric field caused by an applied voltage exceeds the material's dielectric strength. The voltage at which a given insulating object becomes conductive is called its breakdown voltage and in addition to its dielectric strength depends on its size and shape, and the location on the object at which the voltage is applied. Under sufficient electrical potential, electrical breakdown can occur within solids, liquids, or gases (and theoretically even in a vacuum). However, the specific breakdown mechanisms are different for each kind of dielectric medium. Electrical breakdown may be a momentary event (as in an electrostatic discharge), or may lead to a continuous electric arc if protective devices fail to int ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electrical Safety
Electrical safety testing is essential to make sure electrical products and electrical installations are safe. To meet this goal, governments and various technical bodies have developed electrical safety standards. All countries have their own electrical safety standards that must be complied with. To meet to these standards, electrical products and electrical installations must pass electrical safety tests. Some types of electrical safety tests include: *dielectric withstand test (also called a hipot test) *insulation resistance test (IR test) *earth continuity test *leakage current test Electrical safety tests are described in IEC 60335, IEC 61010, AS/NZS 3000, NFPA 70, BS 7671, and other national and international standards.\ Electrical Safety tests Dielectric voltage withstand test A dielectric voltage withstand test (also known as a hipot test) is done by applying a voltage higher than operating voltage to the device or installation under test. In this test, the el ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
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