Beetle (ASIC)
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Beetle (ASIC)
The Beetle ASIC is an analog readout chip. It is developed for the LHCb experiment at CERN. Overview The chip integrates 128 channels with low-noise charge-sensitive pre-amplifiers and shapers. The pulse shape can be chosen such that it complies with LHCb specifications: a peaking time of 25 ns with a remainder of the peak voltage after 25 ns of less than 30%. A comparator per channel with configurable polarity provides a binary signal. Four adjacent comparator channels are being ORed and brought off chip via LVDS drivers. Either the shaper or comparator output is sampled with the LHC bunch-crossing frequency of 40 MHz into an analog pipeline. This ring buffer has a programmable latency of a maximum of 160 sampling intervals and an integrated derandomising buffer of 16 stages. For analogue readout data is multiplexed with up to 40 MHz onto one or four ports. A binary readout mode operates at up to 80 MHz output rate on two ports. Current drivers bring t ...
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Beetle ASIC, Ver
Beetles are insects that form the Taxonomic rank, order Coleoptera (), in the superorder Endopterygota. Their front pair of wings are hardened into wing-cases, Elytron, elytra, distinguishing them from most other insects. The Coleoptera, with about 400,000 described species, is the largest of all orders, constituting almost 40% of described insects and 25% of all known animal life-forms; new species are discovered frequently, with estimates suggesting that there are between 0.9 and 2.1 million total species. Found in almost every habitat except the sea and the polar regions, they interact with their ecosystems in several ways: beetles often feed on plants and fungus, fungi, break down animal and plant debris, and eat other invertebrates. Some species are serious agricultural pests, such as the Colorado potato beetle, while others such as Coccinellidae (ladybirds or ladybugs) eat aphids, scale insects, thrips, and other plant-sucking insects that damage crops. Beetles typicall ...
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Application-specific Integrated Circuit
An application-specific integrated circuit (ASIC ) is an integrated circuit (IC) chip customized for a particular use, rather than intended for general-purpose use, such as a chip designed to run in a digital voice recorder or a high-efficiency video codec. Application-specific standard product (ASSP) chips are intermediate between ASICs and industry standard integrated circuits like the 7400 series or the 4000 series. ASIC chips are typically fabricated using metal-oxide-semiconductor (MOS) technology, as MOS integrated circuit chips. As feature sizes have shrunk and design tools improved over the years, the maximum complexity (and hence functionality) possible in an ASIC has grown from 5,000 logic gates to over 100 million. Modern ASICs often include entire microprocessors, memory blocks including ROM, RAM, EEPROM, flash memory and other large building blocks. Such an ASIC is often termed a SoC (system-on-chip). Designers of digital ASICs often use a hardware descrip ...
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LHCb
The LHCb (Large Hadron Collider beauty) experiment is one of eight particle physics detector experiments collecting data at the Large Hadron Collider at CERN. LHCb is a specialized b-physics experiment, designed primarily to measure the parameters of CP violation in the interactions of b-hadrons (heavy particles containing a bottom quark). Such studies can help to explain the matter-antimatter asymmetry of the Universe. The detector is also able to perform measurements of production cross sections, exotic hadron spectroscopy, charm physics and electroweak physics in the forward region. The LHCb collaboration, who built, operate and analyse data from the experiment, is composed of approximately 1260 people from 74 scientific institutes, representing 16 countries. Chris Parkes succeeded on July 1, 2020 as spokesperson for the collaboration to Giovanni Passaleva (spokesperson 2017-2020). The experiment is located at point 8 on the LHC tunnel close to Ferney-Voltaire, France just o ...
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CERN
The European Organization for Nuclear Research, known as CERN (; ; ), is an intergovernmental organization that operates the largest particle physics laboratory in the world. Established in 1954, it is based in a northwestern suburb of Geneva, on the France–Switzerland border. It comprises 23 member states, and Israel (admitted in 2013) is currently the only non-European country holding full membership. CERN is an official United Nations General Assembly observer. The acronym CERN is also used to refer to the laboratory; in 2019, it had 2,660 scientific, technical, and administrative staff members, and hosted about 12,400 users from institutions in more than 70 countries. In 2016, CERN generated 49 petabytes of data. CERN's main function is to provide the particle accelerators and other infrastructure needed for high-energy physics research — consequently, numerous experiments have been constructed at CERN through international collaborations. CERN is the site of the ...
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OR Gate
The OR gate is a digital logic gate that implements logical disjunction. The OR gate returns true if either or both of its inputs are true; otherwise it returns false. The input and output states are normally represented by different voltage levels. Description The gate accepts two inputs. It outputs a 1 if either or both of these inputs are 1, or outputs a 0 only if both inputs are 0. The inputs and outputs are binary digits (" bits") which have two possible logical states. In addition to 1 and 0, these states may be called true and false, high and low, active and inactive, or other such pairs of symbols. Thus it performs logical disjunction (∨) from mathematical logic. The gate can be represented with the plus sign (+) because it can be used for logical addition. Equivalently, an OR gate finds the ''maximum'' between two binary digits, just as the AND gate finds the ''minimum''. Together with the AND gate and the NOT gate, the OR gate is one of three basic logic gate ...
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LVDS
Low-voltage differential signaling (LVDS), also known as TIA/EIA-644, is a technical standard that specifies electrical characteristics of a differential, serial signaling standard. LVDS operates at low power and can run at very high speeds using inexpensive twisted-pair copper cables. LVDS is a physical layer specification only; many data communication standards and applications use it and add a data link layer as defined in the OSI model on top of it. LVDS was introduced in 1994, and has become popular in products such as LCD-TVs, in-car entertainment systems, industrial cameras and machine vision, notebook and tablet computers, and communications systems. The typical applications are high-speed video, graphics, video camera data transfers, and general purpose computer buses. Early on, the notebook computer and LCD display vendors commonly used the term LVDS instead of FPD-Link when referring to their protocol, and the term ''LVDS'' has mistakenly become synonymous with ' ...
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I²C
I2C (Inter-Integrated Circuit, ), alternatively known as I2C or IIC, is a synchronous, multi-controller/multi-target (master/slave), packet switched, single-ended, serial communication bus invented in 1982 by Philips Semiconductors. It is widely used for attaching lower-speed peripheral ICs to processors and microcontrollers in short-distance, intra-board communication. Several competitors, such as Siemens, NEC, Texas Instruments, STMicroelectronics, Motorola, Nordic Semiconductor and Intersil, have introduced compatible I2C products to the market since the mid-1990s. System Management Bus (SMBus), defined by Intel in 1995, is a subset of I2C, defining a stricter usage. One purpose of SMBus is to promote robustness and interoperability. Accordingly, modern I2C systems incorporate some policies and rules from SMBus, sometimes supporting both I2C and SMBus, requiring only minimal reconfiguration either by commanding or output pin use. Applications I2C is appropriate for peri ...
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Radiation Hardened
Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation (particle radiation and high-energy electromagnetic radiation), especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare. Most semiconductor electronic components are susceptible to radiation damage, and radiation-hardened (rad-hard) components are based on their non-hardened equivalents, with some design and manufacturing variations that reduce the susceptibility to radiation damage. Due to the extensive development and testing required to produce a radiation-tolerant design of a microelectronic chip, the technology of radiation-hardened chips tends to lag behind the most recent developments. Radiation-hardened products are typically tested to one or more resultant-effects tests, including total ion ...
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Rad (unit)
The rad is a unit of absorbed radiation dose, defined as 1 rad = 0.01 Gy = 0.01 J/kg. It was originally defined in CGS units in 1953 as the dose causing 100 ergs of energy to be absorbed by one gram of matter. The material absorbing the radiation can be human tissue or silicon microchips or any other medium (for example, air, water, lead shielding, etc.). It has been replaced by the gray (Gy) in SI derived units, but is still used in the United States, although this is "strongly discouraged" in Chapter 5.2 of the ''Guide to the SI'', which was written and published by the U.S. National Institute of Standards and Technology. However, the numerically equivalent SI unit, the centigray, is widely used to report absorbed doses within radiotherapy. The roentgen, used to quantify the radiation exposure, may be related to the corresponding absorbed dose by use of the F-factor. Health effects A dose of under 100 rad will typically produce no immediate symptoms other than blood ...
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Single Event Upset
A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). The error in device output or operation caused as a result of the strike is called an SEU or a soft error. The SEU itself is not considered permanently damaging to the transistor's or circuits' functionality unlike the case of single-event latch-up (SEL), single-event gate rupture (SEGR), or single-event burnout (SEB). These are all examples of a general class of radiation effects in electronic devices called ''single-event effects'' (SEEs). History Single-event upsets were first described during above-ground nuclear testing, from 1954 to 1957, wh ...
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Application-specific Integrated Circuits
An application-specific integrated circuit (ASIC ) is an integrated circuit (IC) chip customized for a particular use, rather than intended for general-purpose use, such as a chip designed to run in a digital voice recorder or a high-efficiency video codec. Application-specific standard product (ASSP) chips are intermediate between ASICs and industry standard integrated circuits like the 7400 series or the 4000 series. ASIC chips are typically fabricated using metal-oxide-semiconductor (MOS) technology, as MOS integrated circuit chips. As feature sizes have shrunk and design tools improved over the years, the maximum complexity (and hence functionality) possible in an ASIC has grown from 5,000 logic gates to over 100 million. Modern ASICs often include entire microprocessors, memory blocks including ROM, RAM, EEPROM, flash memory and other large building blocks. Such an ASIC is often termed a SoC (system-on-chip). Designers of digital ASICs often use a hardware descrip ...
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