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Semiconductor Characterization Techniques
{{Use mdy dates, date = March 2019 Semiconductor characterization techniques are used to characterize a semiconductor material or device ( p–n junction, Schottky diode, solar cell, etc.). Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states. Electrical characterization techniques Electrical characterization can be used to determine resistivity, carrier concentration, mobility, contact resistance, barrier height, depletion width, oxide charge, interface states, carrier lifetimes, and deep level impurities. * Two-point probe * Four-point probe * Differential Hall effect * Capacitance voltage profiling * Deep-level transient spectroscopy (DLTS) * Electron beam-induced current * Drive-level capacitance profiling (DLCP) * Current–voltage characteristic (I–V) * Suns–VOC (Pseudo I–V) * Photocondu ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Characterization (materials Science)
Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained. The scope of the term often differs; some definitions limit the term's use to techniques which study the microscopic structure and properties of materials, while others use the term to refer to any materials analysis process including macroscopic techniques such as mechanical testing, thermal analysis and density calculation. The scale of the structures observed in materials characterization ranges from angstroms, such as in the imaging of individual atoms and chemical bonds, up to centimeters, such as in the imaging of coarse grain structures in metals. While many characterization techniques have been practiced for centuries, such as basic optical microscopy, new techniqu ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Electron Microscopy
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the Intensity (physics), intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector (Everhart–Thornley detector). The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. Some SEMs can achieve resolutions better than 1 Nanometre, nanometer. Specimens are observed in high vacuum in a Convention (norm), conventional SEM, or in low vacuum or wet conditions in ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Beam
Since the mid-20th century, electron-beam technology has provided the basis for a variety of novel and specialized applications in semiconductor manufacturing, microelectromechanical systems, nanoelectromechanical systems, and microscopy. Mechanism Free electrons in a vacuum can be manipulated by Electric field, electric and magnetic fields to form a fine beam. Where the beam collides with solid-state matter, electrons are converted into heat or kinetic energy. This concentration of energy in a small volume of matter can be precisely controlled by the fields, which brings many advantages. Applications Electron beam techniques include electron probe microanalysis, transmission electron microscopy, auger spectroscopy, and scanning electron microscopy. The rapid increase of temperature at the location of impact can quickly melt a target material. In extreme working conditions, the rapid temperature increase can lead to evaporation, making an electron beam an excellent tool in heating ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Cathodoluminescence
Cathodoluminescence is an optical and electromagnetic phenomenon in which electrons impacting on a luminescent material such as a phosphor, cause the emission of photons which may have wavelengths in the visible spectrum. A familiar example is the generation of light by an electron beam scanning the phosphor-coated inner surface of the screen of a television that uses a cathode-ray tube. Cathodoluminescence is the inverse of the photoelectric effect, in which electron emission is induced by irradiation with photons. Origin Luminescence in a semiconductor results when an electron in the conduction band recombines with a hole in the valence band. The difference energy (band gap) of this transition can be emitted in form of a photon. The energy (color) of the photon, and the probability that a photon and not a phonon will be emitted, depends on the material, its purity, and the presence of defects. First, the electron has to be excited from the valence band into the con ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Reflectance
The reflectance of the surface of a material is its effectiveness in reflecting radiant energy. It is the fraction of incident electromagnetic power that is reflected at the boundary. Reflectance is a component of the response of the electronic structure of the material to the electromagnetic field of light, and is in general a function of the frequency, or wavelength, of the light, its polarization, and the angle of incidence. The dependence of reflectance on the wavelength is called a ''reflectance spectrum'' or ''spectral reflectance curve''. Mathematical definitions Hemispherical reflectance The ''hemispherical reflectance'' of a surface, denoted , is defined as R = \frac, where is the radiant flux ''reflected'' by that surface and is the radiant flux ''received'' by that surface. Spectral hemispherical reflectance The ''spectral hemispherical reflectance in frequency'' and ''spectral hemispherical reflectance in wavelength'' of a surface, denoted and respectively, are ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fourier-transform Infrared Spectroscopy
Fourier transform infrared spectroscopy (FTIR) is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas. An FTIR spectrometer simultaneously collects high-resolution spectral data over a wide spectral range. This confers a significant advantage over a dispersive spectrometer, which measures intensity over a narrow range of wavelengths at a time. The term ''Fourier transform infrared spectroscopy'' originates from the fact that a Fourier transform (a mathematical process) is required to convert the raw data into the actual spectrum. Conceptual introduction The goal of absorption spectroscopy techniques (FTIR, ultraviolet-visible ("UV-vis") spectroscopy, etc.) is to measure how much light a sample absorbs at each wavelength. The most straightforward way to do this, the "dispersive spectroscopy" technique, is to shine a monochromatic light beam at a sample, measure how much of the light is absorbed, and repeat for each different ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Raman Spectroscopy
Raman spectroscopy () (named after physicist C. V. Raman) is a Spectroscopy, spectroscopic technique typically used to determine vibrational modes of molecules, although rotational and other low-frequency modes of systems may also be observed. Raman spectroscopy is commonly used in chemistry to provide a structural fingerprint by which molecules can be identified. Raman spectroscopy relies upon inelastic scattering of photons, known as Raman scattering. A source of monochromatic light, usually from a laser in the visible spectrum, visible, near infrared, or ultraviolet, near ultraviolet range is used, although X-ray Raman scattering, X-rays can also be used. The laser light interacts with molecular vibrations, phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the vibrational modes in the system. Time-resolved spectroscopy and infrared spectroscopy typically yields similar y ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Absorption Spectroscopy
Absorption spectroscopy is spectroscopy that involves techniques that measure the absorption of electromagnetic radiation, as a function of frequency or wavelength, due to its interaction with a sample. The sample absorbs energy, i.e., photons, from the radiating field. The intensity of the absorption varies as a function of frequency, and this variation is the absorption spectrum. Absorption spectroscopy is performed across the electromagnetic spectrum. Absorption spectroscopy is employed as an analytical chemistry tool to determine the presence of a particular substance in a sample and, in many cases, to quantify the amount of the substance present. Infrared and ultraviolet–visible spectroscopy are particularly common in analytical applications. Absorption spectroscopy is also employed in studies of molecular and atomic physics, astronomical spectroscopy and remote sensing. There is a wide range of experimental approaches for measuring absorption spectra. The most commo ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electroluminescence
Electroluminescence (EL) is an optical phenomenon, optical and electrical phenomenon, in which a material emits light in response to the passage of an electric current or to a strong electric field. This is distinct from black body light emission resulting from heat (incandescence), chemical reactions (chemiluminescence), reactions in a liquid (electrochemiluminescence), sound (sonoluminescence), or other mechanical action (mechanoluminescence), or organic electroluminescence. Mechanism Electroluminescence is the result of radiative recombination of electrons and electron hole, holes in a material, usually a semiconductor. The excited electrons release their energy as photons – light. Prior to recombination, electrons and holes may be separated either by doping (semiconductors), doping the material to form a p-n junction (in semiconductor electroluminescent devices such as light-emitting diodes) or through excitation by impact of high-energy electrons accelerated by a strong e ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Photoluminescence
Photoluminescence (abbreviated as PL) is light emission from any form of matter after the absorption of photons (electromagnetic radiation). It is one of many forms of luminescence (light emission) and is initiated by photoexcitation (i.e. photons that excite electrons to a higher energy level in an atom), hence the prefix ''photo-''. Following excitation, various relaxation processes typically occur in which other photons are re-radiated. Time periods between absorption and emission may vary: ranging from short femtosecond-regime for emission involving free-carrier plasma in inorganic semiconductorsHayes, G.R.; Deveaud, B. (2002). "Is Luminescence from Quantum Wells Due to Excitons?". ''Physica Status Solidi A'' 190 (3): 637–640doi:10.1002/1521-396X(200204)190:33.0.CO;2-7/ref> up to milliseconds for phosphoresence processes in molecular systems; and under special circumstances delay of emission may even span to minutes or hours. Observation of photoluminescence at a certain ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Ellipsometry
Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model. It can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging. Etymology The name "ellipsometry" stems from the fact that elliptical polarization of light is used. The term " ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
