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Focus Variation
Focus variation is a method used to sharpen images and to measure surface irregularities by means of optics with limited depth of field. Algorithm The algorithm works as follows: # At first images with difference focus are captured. This is done by moving the sample or the optics in relation to each other. # Then for each position the focus over each plane is calculated # The plane with the best focus is used to get a sharp image. the corresponding depth gives the depth at this position- Optics Focus variation requires an optics with very little depth of field. This can be realized if a microscopy like optics and a microscope objective is used. These objectives have a high numerical aperture which gives a small depth of field. Usage The use of this method is for optical surface metrology and coordinate-measuring machine. This means measuring form, waviness and roughness on samples.{{cite web , last1=Bermudez , first1=Carlos , title=Active illumination focus variation , url=http ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Depth Of Field
The depth of field (DOF) is the distance between the nearest and the farthest objects that are in acceptably sharp focus (optics), focus in an image captured with a camera. See also the closely related depth of focus. Factors affecting depth of field For cameras that can only focus on one object distance at a time, depth of field is the distance between the nearest and the farthest objects that are in acceptably sharp focus in the image. "Acceptably sharp focus" is defined using a property called the "circle of confusion". The depth of field can be determined by focal length, distance to subject (object to be imaged), the acceptable circle of confusion size, and aperture. Limitations of depth of field can sometimes be overcome with various techniques and equipment. The approximate depth of field can be given by: \text \approx \frac for a given maximum acceptable circle of confusion , focal length , f-number , and distance to subject . As distance or the size of the acc ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Optics
Optics is the branch of physics that studies the behaviour and properties of light, including its interactions with matter and the construction of optical instruments, instruments that use or Photodetector, detect it. Optics usually describes the behaviour of visible light, visible, ultraviolet, and infrared light. Light is a type of electromagnetic radiation, and other forms of electromagnetic radiation such as X-rays, microwaves, and radio waves exhibit similar properties. Most optical phenomena can be accounted for by using the Classical electromagnetism, classical electromagnetic description of light, however complete electromagnetic descriptions of light are often difficult to apply in practice. Practical optics is usually done using simplified models. The most common of these, geometric optics, treats light as a collection of Ray (optics), rays that travel in straight lines and bend when they pass through or reflect from surfaces. Physical optics is a more comprehensive mo ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Microscopy
Microscopy is the technical field of using microscopes to view subjects too small to be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of microscopy: optical microscope, optical, electron microscope, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy. Optical microscopy and electron microscopy involve the diffraction, reflection (physics), reflection, or refraction of electromagnetic radiation/electron beams interacting with the Laboratory specimen, specimen, and the collection of the scattered radiation or another signal in order to create an image. This process may be carried out by wide-field irradiation of the sample (for example standard light microscopy and transmission electron microscope, transmission electron microscopy) or by scanning a fine beam over the sample (for example confocal laser scanning microscopy and scanning electron microscopy). Scan ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Numerical Aperture
In optics, the numerical aperture (NA) of an optical system is a dimensionless number that characterizes the range of angles over which the system can accept or emit light. By incorporating index of refraction in its definition, has the property that it is constant for a beam as it goes from one material to another, provided there is no refractive power at the interface (e.g., a flat interface). The exact definition of the term varies slightly between different areas of optics. Numerical aperture is commonly used in microscopy to describe the acceptance cone of an Objective (optics), objective (and hence its light-gathering ability and Optical resolution, resolution), and in fiber optics, in which it describes the range of angles within which light that is incident on the fiber will be transmitted along it. General optics In most areas of optics, and especially in microscopy, the numerical aperture of an optical system such as an objective lens is defined by \mathrm = n \sin \t ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Surface Metrology
Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision parts and assemblies which contain mating surfaces or which must operate with high internal pressures. Surface finish may be measured in two ways: ''contact'' and ''non-contact'' methods. Contact methods involve dragging a measurement stylus across the surface; these instruments are called profilometers. Non-contact methods include: interferometry, digital holography, confocal microscopy, focus variation, structured light, electrical capacitance, electron microscopy, photogrammetry and non-contact profilometers. Overview The most common method is to use a diamond stylus profilometer. The stylus is run perpendicular to the lay of the surfa ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Coordinate-measuring Machine
A coordinate-measuring machine (CMM) is a device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe. Various types of probes are used in CMMs, the most common being mechanical and laser sensors, though optical and white light sensors do exist. Depending on the machine, the probe position may be manually controlled by an operator, or it may be computer controlled. CMMs (coordinate-measuring machine) specify a probe's position in terms of its displacement from a reference position in a three-dimensional Cartesian coordinate system (i.e., with XYZ axes). In addition to moving the probe along the X, Y, and Z axes, many machines also allow the probe angle to be controlled to allow measurement of surfaces that would otherwise be unreachable. Description The typical 3D "bridge" CMM allows probe movement along three axes, X, Y, and Z, which are orthogonal to each other in a three-dimensional Cartesian coordinate system. ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Waviness
Waviness is the measurement of the more widely spaced component of surface texture. It is a broader view of roughness because it is more strictly defined as "the irregularities whose spacing is greater than the roughness sampling length". It can occur from machine or work deflections, chatter, residual stress, vibrations, or heat treatment.. Waviness should also be distinguished from flatness, both by its shorter spacing and its characteristic of being typically periodic in nature. Parameters There are several parameters for expressing waviness height, the most common being Wa & Wt, for ''average waviness'' and ''total waviness'', respectively. In the lateral direction along the surface, the ''waviness spacing'', Wsm, is another parameter that describes the mean spacing between periodic waviness peaks. There are numerous measurement settings which influence these resultant parameter values, which are mentioned below. One of the most important is the ''waviness evaluation l ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Surface Roughness
Surface roughness or simply roughness is the quality of a surface of not being smooth and it is hence linked to human ( haptic) perception of the surface texture. From a mathematical perspective it is related to the spatial variability structure of surfaces, and inherently it is a multiscale property. It has different interpretations and definitions depending on the disciplines considered. In surface metrology, surface roughness is a component of surface finish (surface texture). It is quantified by the deviations in the direction of the normal vector of a real surface from its ideal form. If these deviations are large, the surface is rough; if they are small, the surface is smooth. Roughness is typically assumed to be the high-frequency, short-wavelength component of a measured surface. However, in practice it is often necessary to know both the amplitude and frequency to ensure that a surface is fit for a purpose. Role and effect Roughness plays an important role in determin ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Lateral Resolution
Lateral is a geometric term of location which may also refer to: Biology and healthcare * Lateral (anatomy), a term of location meaning "towards the side" * Lateral cricoarytenoid muscle, an intrinsic muscle of the larynx * Lateral release (surgery), a surgical procedure to release tight capsular structures Other uses * ''Lateral'', a digital journal and production of the Cultural Studies Association * ''Lateral'', a podcast by English YouTuber and web developer Tom Scott * Lateral canal, a canal built along the same right-of-way as an existing stream * Lateral consonant, a consonant in which the airstream proceeds along one or both of the sides of the tongue * Lateral mark, a sea mark used in maritime pilotage to indicate the edge of a channel * Lateral modes, an aspect of dynamic stability and control in the field of aircraft flight dynamics * Lateral pass, a non-advancing move in gridiron football * Lateral release (phonetics), the release of a plosive consonant into a lat ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
International Organization For Standardization
The International Organization for Standardization (ISO ; ; ) is an independent, non-governmental, international standard development organization composed of representatives from the national standards organizations of member countries. Membership requirements are given in Article 3 of the ISO Statutes. ISO was founded on 23 February 1947, and () it has published over 25,000 international standards covering almost all aspects of technology and manufacturing. It has over 800 technical committees (TCs) and subcommittees (SCs) to take care of standards development. The organization develops and publishes international standards in technical and nontechnical fields, including everything from manufactured products and technology to food safety, transport, IT, agriculture, and healthcare. More specialized topics like electrical and electronic engineering are instead handled by the International Electrotechnical Commission.Editors of Encyclopedia Britannica. 3 June 2021.Inte ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
ISO 25178
ISO 25178: Geometrical Product Specifications (GPS) – Surface texture: areal is an International Organization for Standardization collection of international standards relating to the analysis of 3D areal surface texture. Structure of the standard Documents constituting the standard: * Part 1: Indication of surface texture * Part 2: Terms, definitions and surface texture parameters * Part 3: Specification operators * Part 6: Classification of methods for measuring surface texture * Part 70: Material measures * Part 71: Software measurement standards * Part 72: XML file format x3p * Part 600: Metrological characteristics for areal-topography measuring methods * Part 601: Nominal characteristics of contact (stylus) instruments * Part 602: Nominal characteristics of non-contact (confocal chromatic probe) instruments * Part 603: Nominal characteristics of non-contact (phase-shifting interferometric microscopy) instruments * Part 604: Nominal characteristics of non-contact ( coh ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Surface Metrology
Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision parts and assemblies which contain mating surfaces or which must operate with high internal pressures. Surface finish may be measured in two ways: ''contact'' and ''non-contact'' methods. Contact methods involve dragging a measurement stylus across the surface; these instruments are called profilometers. Non-contact methods include: interferometry, digital holography, confocal microscopy, focus variation, structured light, electrical capacitance, electron microscopy, photogrammetry and non-contact profilometers. Overview The most common method is to use a diamond stylus profilometer. The stylus is run perpendicular to the lay of the surfa ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
