Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the

elemental analysis Elemental analysis is a process where a sample of some material (e.g., soil, waste or drinking water, bodily fluids, minerals, chemical compounds) is analyzed for its elemental and sometimes isotopic composition. Elemental analysis can be qualit ...

or chemical characterization of a sample. It relies on an interaction of some source of

X-ray An X-ray, or, much less commonly, X-radiation, is a penetrating form of high-energy electromagnetic radiation. Most X-rays have a wavelength ranging from 10 picometers to 10 nanometers, corresponding to frequencies in the range 30&nb ...

excitation and a

sample Sample or samples may refer to: Base meaning * Sample (statistics), a subset of a population – complete data set * Sample (signal), a digital discrete sample of a continuous analog signal * Sample (material), a specimen or small quantity of ...

. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic

emission spectrum The emission spectrum of a chemical element or chemical compound is the spectrum of frequencies of electromagnetic radiation emitted due to an electron making a transition from a high energy state to a lower energy state. The photon energy of ...

(which is the main principle of

spectroscopy Spectroscopy is the field of study that measures and interprets the electromagnetic spectra that result from the interaction between electromagnetic radiation and matter as a function of the wavelength or frequency of the radiation. Matter ...

). The peak positions are predicted by the

Moseley's law Moseley's law is an empirical law concerning the characteristic x-rays emitted by atoms. The law had been discovered and published by the English physicist Henry Moseley in 1913-1914. Until Moseley's work, "atomic number" was merely an element's ...

with accuracy much better than experimental resolution of a typical EDX instrument. To stimulate the emission of characteristic X-rays from a specimen a beam of electrons is focused into the sample being studied. At rest, an atom within the sample contains

ground state The ground state of a quantum-mechanical system is its stationary state of lowest energy; the energy of the ground state is known as the zero-point energy of the system. An excited state is any state with energy greater than the ground state. ...

(or unexcited) electrons in discrete energy levels or

electron shell In chemistry and atomic physics, an electron shell may be thought of as an orbit followed by electrons around an atom's nucleus. The closest shell to the nucleus is called the "1 shell" (also called the "K shell"), followed by the "2 shell" (or ...

s bound to the nucleus. The incident beam may excite an electron in an inner shell, ejecting it from the shell while creating an

electron hole In physics, chemistry, and electronic engineering, an electron hole (often simply called a hole) is a quasiparticle which is the lack of an electron at a position where one could exist in an atom or atomic lattice. Since in a normal atom or ...

where the electron was. An electron from an outer, higher-energy shell then fills the hole, and the difference in energy between the higher-energy shell and the lower energy shell may be released in the form of an X-ray. The number and energy of the X-rays emitted from a specimen can be measured by an energy-dispersive spectrometer. As the energies of the X-rays are characteristic of the difference in energy between the two shells and of the atomic structure of the emitting element, EDS allows the elemental composition of the specimen to be measured.

Equipment

Four primary components of the EDS setup are #the excitation source (electron beam or x-ray beam) #the

X-ray detector X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays. Detectors can be divided into two major categories: imaging detectors (such as photographic plates and X-ray film (photograp ...

#the pulse processor #the analyzer. Electron beam excitation is used in

electron microscope An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a hi ...

s, scanning electron microscopes (SEM) and scanning transmission electron microscopes (STEM). X-ray beam excitation is used in

X-ray fluorescence X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis ...

(XRF) spectrometers. A detector is used to convert X-ray energy into

voltage Voltage, also known as electric pressure, electric tension, or (electric) potential difference, is the difference in electric potential between two points. In a static electric field, it corresponds to the work needed per unit of charge to ...

signals; this information is sent to a pulse processor, which measures the signals and passes them onto an analyzer for data display and analysis. The most common detector used to be Si(Li) detector cooled to cryogenic temperatures with

liquid nitrogen Liquid nitrogen—LN2—is nitrogen in a liquid state at low temperature. Liquid nitrogen has a boiling point of about . It is produced industrially by fractional distillation of liquid air. It is a colorless, low viscosity liquid that is wid ...

. Now, newer systems are often equipped with

silicon drift detector Silicon drift detectors (SDDs) are X-ray radiation detectors used in x-ray spectrometry ( XRF and EDS) and electron microscopy. Their chief characteristics compared with other X-ray detectors are: *high count rates *comparatively high energy resolu ...

s (SDD) with

Peltier cooling Thermoelectric cooling uses the Peltier effect to create a heat flux at the junction of two different types of materials. A Peltier cooler, heater, or thermoelectric heat pump is a solid-state active heat pump which transfers heat from one side o ...

systems.

Technological variants

The excess energy of the electron that migrates to an inner shell to fill the newly created hole can do more than emit an X-ray. Often, instead of X-ray emission, the excess energy is transferred to a third electron from a further outer shell, prompting its ejection. This ejected species is called an Auger electron, and the method for its analysis is known as

Auger electron spectroscopy A Hanford scientist uses an Auger electron spectrometer to determine the elemental composition of surfaces. Auger electron spectroscopy (AES; pronounced in French) is a common analytical technique used specifically in the study of surfaces and, ...

(AES).

X-ray photoelectron spectroscopy X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, ...

(XPS) is another close relative of EDS, utilizing ejected electrons in a manner similar to that of AES. Information on the quantity and

kinetic energy In physics, the kinetic energy of an object is the energy that it possesses due to its motion. It is defined as the work needed to accelerate a body of a given mass from rest to its stated velocity. Having gained this energy during its acce ...

of ejected electrons is used to determine the

binding energy In physics and chemistry, binding energy is the smallest amount of energy required to remove a particle from a system of particles or to disassemble a system of particles into individual parts. In the former meaning the term is predominantly use ...

of these now-liberated electrons, which is element-specific and allows chemical characterization of a sample. EDS is often contrasted with its spectroscopic counterpart, wavelength dispersive X-ray spectroscopy (WDS). WDS differs from EDS in that it uses the

diffraction Diffraction is defined as the interference or bending of waves around the corners of an obstacle or through an aperture into the region of geometrical shadow of the obstacle/aperture. The diffracting object or aperture effectively becomes a s ...

of X-rays on special crystals to separate its raw data into spectral components (wavelengths). WDS has a much finer spectral resolution than EDS. WDS also avoids the problems associated with artifacts in EDS (false peaks, noise from the amplifiers, and microphonics). A high-energy beam of charged particles such as

electron The electron ( or ) is a subatomic particle with a negative one elementary electric charge. Electrons belong to the first generation of the lepton particle family, and are generally thought to be elementary particles because they have n ...

s or

proton A proton is a stable subatomic particle, symbol , H+, or 1H+ with a positive electric charge of +1 ''e'' elementary charge. Its mass is slightly less than that of a neutron and 1,836 times the mass of an electron (the proton–electron mass ...

s can be used to excite a sample rather than X-rays. This is called

particle-induced X-ray emission Particle-induced X-ray emission or proton-induced X-ray emission (PIXE) is a technique used for determining the elemental composition of a material or a sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM ...

or PIXE.

Accuracy of EDS

EDS can be used to determine which chemical elements are present in a sample, and can be used to estimate their relative abundance. EDS also helps to measure multi-layer coating thickness of metallic coatings and analysis of various alloys. The accuracy of this quantitative analysis of sample composition is affected by various factors. Many elements will have overlapping X-ray emission peaks (e.g., Ti K_β and V K_α, Mn K_β and Fe K_α). The accuracy of the measured composition is also affected by the nature of the sample. X-rays are generated by any atom in the sample that is sufficiently excited by the incoming beam. These X-rays are emitted in all directions (isotropically), and so they may not all escape the sample. The likelihood of an X-ray escaping the specimen, and thus being available to detect and measure, depends on the energy of the X-ray and the composition, amount, and density of material it has to pass through to reach the detector. Because of this X-ray absorption effect and similar effects, accurate estimation of the sample composition from the measured X-ray emission spectrum requires the application of quantitative correction procedures, which are sometimes referred to as matrix corrections.

Emerging technology

There is a trend towards a newer EDS detector, called the

(SDD). The SDD consists of a high-resistivity silicon chip where electrons are driven to a small collecting anode. The advantage lies in the extremely low capacitance of this anode, thereby utilizing shorter processing times and allowing very high throughput. Benefits of the SDD include: #High count rates and processing, #Better resolution than traditional Si(Li) detectors at high count rates, #Lower dead time (time spent on processing X-ray event), #Faster analytical capabilities and more precise X-ray maps or particle data collected in seconds, #Ability to be stored and operated at relatively high temperatures, eliminating the need for

cooling. Because the capacitance of the SDD chip is independent of the active area of the detector, much larger SDD chips can be utilized (40 mm² or more). This allows for even higher count rate collection. Further benefits of large area chips include: #Minimizing SEM beam current allowing for optimization of imaging under analytical conditions, #Reduced sample damage and #Smaller beam interaction and improved spatial resolution for high speed maps. Where the X-ray energies of interest are in excess of ~ 30 keV, traditional silicon-based technologies suffer from poor quantum efficiency due to a reduction in the detector

stopping power Stopping power is the ability of a weapon – typically a ranged weapon such as a firearm – to cause a target (human or animal) to be incapacitated or immobilized. Stopping power contrasts with lethality in that it pertains only to a weapo ...

. Detectors produced from high density semiconductors such as cadmium telluride (CdTe) and cadmium zinc telluride (CdZnTe) have improved efficiency at higher X-ray energies and are capable of room temperature operation. Single element systems, and more recently pixelated imaging detectors such as the high energy X-ray imaging technology (HEXITEC) system, are capable of achieving energy resolutions of the order of 1% at 100 keV. In recent years, a different type of EDS detector, based upon a superconducting microcalorimeter, has also become commercially available. This new technology combines the simultaneous detection capabilities of EDS with the high spectral resolution of WDS. The EDS microcalorimeter consists of two components: an absorber, and a superconducting

transition-edge sensor A transition-edge sensor (TES) is a type of cryogenic energy sensor or cryogenic particle detector that exploits the strongly temperature-dependent resistance of the superconducting phase transition. History The first demonstrations of the super ...

(TES)

thermometer A thermometer is a device that measures temperature or a temperature gradient (the degree of hotness or coldness of an object). A thermometer has two important elements: (1) a temperature sensor (e.g. the bulb of a mercury-in-glass thermometer ...

. The former absorbs X-rays emitted from the sample and converts this energy into heat; the latter measures the subsequent change in temperature due to the influx of heat. The EDS microcalorimeter has historically suffered from a number of drawbacks, including low count rates and small detector areas. The count rate is hampered by its reliance on the

time constant In physics and engineering, the time constant, usually denoted by the Greek letter (tau), is the parameter characterizing the response to a step input of a first-order, linear time-invariant (LTI) system.Concretely, a first-order LTI system is a s ...

of the calorimeter's electrical circuit. The detector area must be small in order to keep the

heat capacity Heat capacity or thermal capacity is a physical property of matter, defined as the amount of heat to be supplied to an object to produce a unit change in its temperature. The SI unit of heat capacity is joule per kelvin (J/K). Heat cap ...

small and maximize thermal sensitivity ( resolution). However, the count rate and detector area have been improved by the implementation of arrays of hundreds of superconducting EDS microcalorimeters, and the importance of this technology is growing.

References

External links