Thermal Laser Stimulation
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Thermal laser stimulation represents a class of defect imaging techniques which employ a
laser A laser is a device that emits light through a process of optical amplification based on the stimulated emission of electromagnetic radiation. The word "laser" is an acronym for "light amplification by stimulated emission of radiation". The fir ...
to produce a thermal variation in a
semiconductor device A semiconductor device is an electronic component that relies on the electronic properties of a semiconductor material (primarily silicon, germanium, and gallium arsenide, as well as organic semiconductors) for its function. Its conductivity li ...
. This technique may be used for semiconductor
failure analysis Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective actions or liability. According to Bloch and Geitner, ”machinery failures reveal a reaction chain o ...
. There are four techniques associated with thermal laser stimulation: optical beam induced resistance change (OBIRCH), thermally induced voltage alteration (TIVA)), external induced voltage alteration (XIVA) and Seebeck effect imaging (SEI)


Optical beam induced resistance change

Optical beam induced resistance change (OBIRCH) is an imaging technique which uses a laser beam to induce a thermal change in the device. Laser stimulation highlights differences in thermal characteristics between areas containing defects and areas which are defect-free. As the laser locally heats a defective area on a
metal A metal (from Greek μέταλλον ''métallon'', "mine, quarry, metal") is a material that, when freshly prepared, polished, or fractured, shows a lustrous appearance, and conducts electricity and heat relatively well. Metals are typicall ...
line which is carrying a
current Currents, Current or The Current may refer to: Science and technology * Current (fluid), the flow of a liquid or a gas ** Air current, a flow of air ** Ocean current, a current in the ocean *** Rip current, a kind of water current ** Current (stre ...
, the resulting resistance changes can be detected by monitoring the input current to the device. OBIRCH is useful for detecting
electromigration Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direc ...
effects resulting in open metal lines. A constant
voltage Voltage, also known as electric pressure, electric tension, or (electric) potential difference, is the difference in electric potential between two points. In a static electric field, it corresponds to the work needed per unit of charge to m ...
is applied to the device-under-test (DUT). An area of interest is selected on the device, and a laser beam is used to scan the area. The input current being drawn by the device is monitored for changes during this process. When a change in current is noted, the position of the laser at the time that the change occurred is marked on the image of the device. When the laser beam strikes a location which does not contain a void, good thermal transmission exists and the change in electrical resistance is small. In areas containing voids, however, thermal transmission is impeded, resulting in a larger change in resistance. The degree of resistance change is displayed visually on an image of the device, with areas of higher resistance being displayed as bright spots.


Thermally induced voltage alteration

Thermally induced voltage alteration (TIVA) is an imaging technique which uses a laser beam to pinpoint the location of
electrical short A short circuit (sometimes abbreviated to short or s/c) is an electrical circuit that allows a current to travel along an unintended path with no or very low electrical impedance. This results in an excessive current flowing through the circuit ...
s on a device. The laser induces local
thermal gradient A temperature gradient is a physical quantity that describes in which direction and at what rate the temperature changes the most rapidly around a particular location. The temperature gradient is a Dimensional analysis, dimensional quantity express ...
s in the device, which result in changes to the amount of
power Power most often refers to: * Power (physics), meaning "rate of doing work" ** Engine power, the power put out by an engine ** Electric power * Power (social and political), the ability to influence people or events ** Abusive power Power may a ...
that the device uses. A laser is scanned over the surface of the device while it is under electrical bias. The device is biased using a constant current source, and the power supply pin voltage is monitored for changes. When the laser strikes an area containing a short circuit, localized heating occurs. This heating changes the resistance of the short, resulting in a change in power consumption of the device. These changes in power consumption are plotted onto an image of the device in locations corresponding to the position of the laser at the time that the change was detected.


External induced voltage alteration

External induced voltage alteration (XIVA) maintains a constant voltage bias and constant current sensing on the device under test. When the scanning laser passes over a defective location, a sudden change in impedance is created. This would normally result in a change in current, however, the constant current choke prevents this from happening. The detection of these events allows the position of the defect to be determined.


Seebeck effect imaging

Seebeck effect The thermoelectric effect is the direct conversion of temperature differences to electric voltage and vice versa via a thermocouple. A thermoelectric device creates a voltage when there is a different temperature on each side. Conversely, when ...
imaging (SEI) uses a laser to generate thermal gradients in conductors. The thermal gradients induced generate corresponding
electric potential The electric potential (also called the ''electric field potential'', potential drop, the electrostatic potential) is defined as the amount of work energy needed to move a unit of electric charge from a reference point to the specific point in ...
gradients. This correlation of thermal and electric gradients is known as the Seebeck effect. The SEI technique is used to locate electrically floating conductors. When the laser changes the thermal gradient of a floating conductor, its electrical potential changes. This change in potential will change the bias of any transistors connected to the floating conductor, which affects the
heat dissipation All electronic devices and circuitry generate excess heat and thus require thermal management to improve reliability and prevent premature failure. The amount of heat output is equal to the power input, if there are no other energy int ...
of the device. These changes are mapped to a visual image of the device in order to physically locate the floating conductors.


Key extraction

A proof-of-concept experiment was conducted at the
University of Florida The University of Florida (Florida or UF) is a public land-grant research university in Gainesville, Florida. It is a senior member of the State University System of Florida, traces its origins to 1853, and has operated continuously on its ...
which demonstrated the possibility of using thermal laser stimulation to peer into SRAM chips and extract sensitive information.


See also

*
List of laser articles This is a list of laser topics. A * 3D printing, additive manufacturing * Abnormal reflection * Above-threshold ionization * Absorption spectroscopy * Accelerator physics * Acoustic microscopy * Acousto-optic deflector * Acousto-optic modul ...


Notes


References

* . * . * . * {{Citation , last1=Nikawa , first1=K , last2=Tozaki , first2=S , title=Principles Novel OBIC Observation Method for Detecting Defects in Al Stripes Under Current Stressing , journal=Proceedings of the 19th International Symposium for Testing and Failure Analysis , pages= 303–310 , year=1993 , publisher=ASM International , location=Materials Park, Ohio , isbn=0-87170-498-6 . Semiconductor analysis