Fluctuation Electron Microscopy
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Fluctuation electron microscopy (FEM), originally called Variable Coherence Microscopy before decoherence effects in the sample rendered that naming moot, is a technique in electron microscopy that probes nanometer-scale or "medium-range" order in disordered materials. The first studies were performed on
amorphous In condensed matter physics and materials science, an amorphous solid (or non-crystalline solid, glassy solid) is a solid that lacks the long-range order that is characteristic of a crystal. Etymology The term comes from the Greek ''a'' ("wi ...
Si (Treacy and Gibson 1997) and later on hydrogenated amorphous silicon.


References

{{CMP-stub Electron microscopy