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Scanning Quantum Dot Microscopy
Scanning quantum dot microscopy (SQDM) is a scanning probe microscopy (SPM) that is used to image nanoscale electric potential distributions on surfaces. The method quantifies surface potential variations via their influence on the potential of a quantum dot (QD) attached to the apex of the scanned probe. SQDM allows, for example, the quantification of surface dipoles originating from individual adatoms, molecules, or nanostructures. This gives insights into surface and interface mechanisms such as reconstruction or relaxation, mechanical distortion, charge transfer and chemical interaction. Measuring electric potential distributions is also relevant for characterizing organic and inorganic semiconductor devices which feature electric dipole layers at the relevant interfaces. The probe to surface distance in SQDM ranges from 2 nm to 10 nm and therefore allows imaging on non-planar surfaces or, e.g., of biomolecules with a distinct 3D structure. Related imaging techniqu ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Probe Microscopy
Scan may refer to: Acronyms * Schedules for Clinical Assessment in Neuropsychiatry (SCAN), a psychiatric diagnostic tool developed by WHO * Shared Check Authorization Network (SCAN), a database of bad check writers and collection agency for bad checks * Space Communications and Navigation Program (SCaN) * Social Cognitive and Affective Neuroscience (journal) * Scientific content analysis (SCAN), also known as statement analysis Businesses * Scan Furniture, Washington, D.C., US chain * SCAN Health Plan, not-for-profit health care company based in Long Beach, California * Scan AB or Scan Foods UK Ltd, the Swedish and UK subsidiaries of the Finnish HKScan Oyj * Seattle Community Access Network, Seattle, Washington, US TV channel * Scan (company), a software company based in Provo, Utah, US Electronics or computer related * 3D scanning * Counter-scanning, in physical micro and nanotopography measuring instruments like scanning probe microscope * Elevator algorithm (also S ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electrostatic Force Microscope
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-range force and can be detected 100 nm or more from the sample. Force measurement For example, consider a conductive cantilever tip and sample which are separated a distance ''z'' usually by a vacuum. A bias voltage between tip and sample is applied by an external battery forming a capacitor, ''C'', between the two. The capacitance of the system depends on the geometry of the tip and sample. The total energy stored in that capacitor is ''U = ½ C⋅ΔV2''. The work done by the battery to maintain a constant voltage, ''ΔV'', between the capacitor plates (tip and sample) is ''-2U''. By definition, taking the negative gradient of the total energy ''Uto ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Stark Effect
The Stark effect is the shifting and splitting of spectral lines of atoms and molecules due to the presence of an external electric field. It is the electric-field analogue of the Zeeman effect, where a spectral line is split into several components due to the presence of the magnetic field. Although initially coined for the static case, it is also used in the wider context to describe the effect of time-dependent electric fields. In particular, the Stark effect is responsible for the pressure broadening (Stark broadening) of spectral lines by charged particles in plasmas. For most spectral lines, the Stark effect is either linear (proportional to the applied electric field) or quadratic with a high accuracy. The Stark effect can be observed both for emission and absorption lines. The latter is sometimes called the inverse Stark effect, but this term is no longer used in the modern literature. History The effect is named after the German physicist Johannes Stark, who discov ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electric Field
An electric field (sometimes E-field) is the physical field that surrounds electrically charged particles and exerts force on all other charged particles in the field, either attracting or repelling them. It also refers to the physical field for a system of charged particles. Electric fields originate from electric charges and time-varying electric currents. Electric fields and magnetic fields are both manifestations of the electromagnetic field, one of the four fundamental interactions (also called forces) of nature. Electric fields are important in many areas of physics, and are exploited in electrical technology. In atomic physics and chemistry, for instance, the electric field is the attractive force holding the atomic nucleus and electrons together in atoms. It is also the force responsible for chemical bonding between atoms that result in molecules. The electric field is defined as a vector field that associates to each point in space the electrostatic ( Coulomb) for ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Non-contact Atomic Force Microscopy
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance (amplitude modulation) or by measuring the change in resonant frequency directly using a feedback circuit (usually a phase-locked loop) to always drive the sensor on resonance (frequency modulation). Modes of operation The two most common modes of nc-AFM operation, frequency modulation (F ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Dirichlet Boundary Condition
In the mathematical study of differential equations, the Dirichlet (or first-type) boundary condition is a type of boundary condition, named after Peter Gustav Lejeune Dirichlet (1805–1859). When imposed on an ordinary or a partial differential equation, it specifies the values that a solution needs to take along the boundary of the domain. In finite element method (FEM) analysis, ''essential'' or Dirichlet boundary condition is defined by weighted-integral form of a differential equation. The dependent unknown ''u in the same form as the weight function w'' appearing in the boundary expression is termed a ''primary variable'', and its specification constitutes the ''essential'' or Dirichlet boundary condition. The question of finding solutions to such equations is known as the Dirichlet problem. In applied sciences, a Dirichlet boundary condition may also be referred to as a fixed boundary condition. Examples ODE For an ordinary differential equation, for instance, y'' + y ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Boundary Value Problem
In mathematics, in the field of differential equations, a boundary value problem is a differential equation together with a set of additional constraints, called the boundary conditions. A solution to a boundary value problem is a solution to the differential equation which also satisfies the boundary conditions. Boundary value problems arise in several branches of physics as any physical differential equation will have them. Problems involving the wave equation, such as the determination of normal modes, are often stated as boundary value problems. A large class of important boundary value problems are the Sturm–Liouville problems. The analysis of these problems involves the eigenfunctions of a differential operator. To be useful in applications, a boundary value problem should be well posed. This means that given the input to the problem there exists a unique solution, which depends continuously on the input. Much theoretical work in the field of partial differentia ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Laplace's Equation
In mathematics and physics, Laplace's equation is a second-order partial differential equation named after Pierre-Simon Laplace, who first studied its properties. This is often written as \nabla^2\! f = 0 or \Delta f = 0, where \Delta = \nabla \cdot \nabla = \nabla^2 is the Laplace operator,The delta symbol, Δ, is also commonly used to represent a finite change in some quantity, for example, \Delta x = x_1 - x_2. Its use to represent the Laplacian should not be confused with this use. \nabla \cdot is the divergence operator (also symbolized "div"), \nabla is the gradient operator (also symbolized "grad"), and f (x, y, z) is a twice-differentiable real-valued function. The Laplace operator therefore maps a scalar function to another scalar function. If the right-hand side is specified as a given function, h(x, y, z), we have \Delta f = h. This is called Poisson's equation, a generalization of Laplace's equation. Laplace's equation and Poisson's equation are the simplest exa ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Green's Function
In mathematics, a Green's function is the impulse response of an inhomogeneous linear differential operator defined on a domain with specified initial conditions or boundary conditions. This means that if \operatorname is the linear differential operator, then * the Green's function G is the solution of the equation \operatorname G = \delta, where \delta is Dirac's delta function; * the solution of the initial-value problem \operatorname y = f is the convolution (G \ast f). Through the superposition principle, given a linear ordinary differential equation (ODE), \operatorname y = f, one can first solve \operatorname G = \delta_s, for each , and realizing that, since the source is a sum of delta functions, the solution is a sum of Green's functions as well, by linearity of . Green's functions are named after the British mathematician George Green, who first developed the concept in the 1820s. In the modern study of linear partial differential equations, Green's functions ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Boundary Value Problem
In mathematics, in the field of differential equations, a boundary value problem is a differential equation together with a set of additional constraints, called the boundary conditions. A solution to a boundary value problem is a solution to the differential equation which also satisfies the boundary conditions. Boundary value problems arise in several branches of physics as any physical differential equation will have them. Problems involving the wave equation, such as the determination of normal modes, are often stated as boundary value problems. A large class of important boundary value problems are the Sturm–Liouville problems. The analysis of these problems involves the eigenfunctions of a differential operator. To be useful in applications, a boundary value problem should be well posed. This means that given the input to the problem there exists a unique solution, which depends continuously on the input. Much theoretical work in the field of partial differentia ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Kelvin Probe Force Microscope
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings. With KPFM, the work function of surfaces can be observed at atomic or molecular scales. The work function relates to many surface phenomena, including catalytic activity, reconstruction of surfaces, doping and band-bending of semiconductors, charge trapping in dielectrics and corrosion. The map of the work function produced by KPFM gives information about the composition and electronic state of the local structures on the surface of a solid. History The SKP technique is based on parallel plate capacitor experiments performed ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
