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High-resolution Transmission Electron Microscopy
High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp2-bonded carbon (e.g., graphene, C nanotubes). While this term is often also used to refer to high resolution scanning transmission electron microscopy, mostly in high angle annular dark field mode, this article describes mainly the imaging of an object by recording the two-dimensional spatial wave amplitude distribution in the image plane, in analogy to a "classic" light microscope. For disambiguation, the technique is also often referred to as phase contrast transmission electron microscopy. At present, the highest point resolution realised in phase contrast transmission electron microscopy is around . At these small scales, individual atoms of a crystal and its defects can ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
National Center For Electron Microscopy
The National Center for Electron Microscopy (NCEM) was a U.S. Department of Energy national user facility at Lawrence Berkeley National Laboratory in Berkeley, California, for unclassified scientific research using advanced electron microscopy. It has since been merged with the Molecular Foundry The Molecular Foundry is a nanoscience user facility located at the Lawrence Berkeley National Laboratory in Berkeley, California, and is one of five Nanoscale Science Research Centers sponsored by the United States Department of Energy. Overv ..., also located at Berkeley Lab. External links Official National Center for Electron Microscopy website Lawrence Berkeley National Laboratory United States Department of Energy national laboratories Laboratories in California University and college laboratories in the United States Research institutes in the San Francisco Bay Area {{Tech-stub ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Talbot Effect
The Talbot effect is a diffraction effect first observed in 1836 by Henry Fox Talbot. When a plane wave is incident upon a periodic diffraction grating, the image of the grating is repeated at regular distances away from the grating plane. The regular distance is called the Talbot length, and the repeated images are called self images or Talbot images. Furthermore, at half the Talbot length, a self-image also occurs, but phase-shifted by half a period (the physical meaning of this is that it is laterally shifted by half the width of the grating period). At smaller regular fractions of the Talbot length, sub-images can also be observed. At one quarter of the Talbot length, the self-image is halved in size, and appears with half the period of the grating (thus twice as many images are seen). At one eighth of the Talbot length, the period and size of the images is halved again, and so forth creating a fractal pattern of sub images with ever-decreasing size, often referred to as a Talbo ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Transmission Electron Microscope
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is tÉ›mor ›sti:i:É›m As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data. A typical STEM is a conventional transmission el ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Confocal Electron Microscopy
Scanning confocal electron microscopy (SCEM) is an electron microscopy technique analogous to confocal microscopy, scanning confocal optical microscopy (SCOM). In this technique, the studied sample is illuminated by a focussed electron beam, as in other scanning microscopy techniques, such as scanning transmission electron microscopy or scanning electron microscopy. However, in SCEM, the collection optics is arranged symmetrically to the illumination optics to gather only the electrons that pass the beam focus. This results in superior depth resolution of the imaging. The technique is relatively new and is being actively developed. History The idea of SCEM logically follows from SCOM and thus is rather old. However, practical design and construction of scanning confocal electron microscope is a complex problem first solved by Nestor J. Zaluzec. His first scanning confocal electron microscope demonstrated the 3D properties of the SCEM, but have not realized the sub-nanometer latera ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Energy Filtered Transmission Electron Microscopy
Energy-filtered transmission electron microscopy (EFTEM) is a technique used in transmission electron microscopy, in which only electrons of particular kinetic energies are used to form the image or diffraction pattern. The technique can be used to aid chemical analysis of the sample in conjunction with complementary techniques such as electron crystallography. Principle If a very thin sample is illuminated with a beam of high-energy electrons, then a majority of the electrons will pass unhindered through the sample but some will interact with the sample, being scattered elastically or inelastically (phonon scattering, plasmon scattering or inner shell ionisation). Inelastic scattering results in both a loss of energy and a change in momentum, which in the case of inner shell ionisation is characteristic of the element in the sample. If the electron beam emerging from the sample is passed through a magnetic prism, then the flight path of the electrons will vary depending on their ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Microscope
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. A scanning transmission electron microscope has achieved better than 50 pm resolution in annular dark-field imaging mode and magnifications of up to about 10,000,000Ă— whereas most light microscopes are limited by diffraction to about 200 nm resolution and useful magnifications below 2000Ă—. Electron microscopes use shaped magnetic fields to form electron optical lens systems that are analogous to the glass lenses of an optical light microscope. Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Energy Loss Spectroscopy
In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their paths slightly and randomly deflected. The amount of energy loss can be measured via an electron spectrometer and interpreted in terms of what caused the energy loss. Inelastic interactions include phonon excitations, inter- and intra-band transitions, plasmon excitations, inner shell ionizations, and Cherenkov radiation. The inner-shell ionizations are particularly useful for detecting the elemental components of a material. For example, one might find that a larger-than-expected number of electrons comes through the material with 285 eV less energy than they had when they entered the material. This is approximately the amount of energy needed to remove an inner-shell electron from a carbon atom, which can be taken as evidence ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Diffraction
Electron diffraction refers to the bending of electron beams around atomic structures. This behaviour, typical for waves, is applicable to electrons due to the wave–particle duality stating that electrons behave as both particles and waves. Since the diffracted beams interfere, they generate diffraction patterns widely used for analysis of the objects which caused the diffraction. Therefore, electron diffraction can also refer to derived experimental techniques used for material characterization. This technique is similar to X-ray and neutron diffraction. Electron diffraction is most frequently used in solid state physics and chemistry to study crystalline, quasi-crystalline and amorphous materials using electron microscopes. In these instruments, electrons are accelerated by an electrostatic potential in order to gain energy and shorten their wavelength. With the wavelength sufficiently short, the atomic structure acts as a diffraction grating generating diffraction patte ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Beam Induced Deposition
The electron ( or ) is a subatomic particle with a negative one elementary electric charge. Electrons belong to the first generation of the lepton particle family, and are generally thought to be elementary particles because they have no known components or substructure. The electron's mass is approximately 1/1836 that of the proton. Quantum mechanical properties of the electron include an intrinsic angular momentum (spin) of a half-integer value, expressed in units of the reduced Planck constant, . Being fermions, no two electrons can occupy the same quantum state, in accordance with the Pauli exclusion principle. Like all elementary particles, electrons exhibit properties of both particles and waves: They can collide with other particles and can be diffracted like light. The wave properties of electrons are easier to observe with experiments than those of other particles like neutrons and protons because electrons have a lower mass and hence a longer de Broglie wavelen ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Dennis Gabor
Dennis Gabor ( ; hu, Gábor Dénes, ; 5 June 1900 – 9 February 1979) was a Hungarian-British electrical engineer and physicist, most notable for inventing holography, for which he later received the 1971 Nobel Prize in Physics. He obtained British citizenship in 1934, and spent most of his life in England. Life and career Gabor was born as Günszberg Dénes, into a Jewish family in Budapest, Hungary. In 1918, his family converted to Lutheranism. Dennis was the first-born son of Günszberg Bernát and Jakobovits Adél. Despite having a religious background, religion played a minor role in his later life and he considered himself agnostic. In 1902, the family received permission to change their surname from Günszberg to Gábor. He served with the Hungarian artillery in northern Italy during World War I. He began his studies in engineering at the Technical University of Budapest in 1918, later in Germany, at the Charlottenburg Technical University in Berlin, now known as t ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
