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Electrostatic Force Microscope
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-range force and can be detected 100 nm or more from the sample. Force measurement For example, consider a conductive cantilever tip and sample which are separated a distance ''z'' usually by a vacuum. A bias voltage between tip and sample is applied by an external battery forming a capacitor, ''C'', between the two. The capacitance of the system depends on the geometry of the tip and sample. The total energy stored in that capacitor is ''U = ½ C⋅ΔV2''. The work done by the battery to maintain a constant voltage, ''ΔV'', between the capacitor plates (tip and sample) is ''-2U''. By definition, taking the negative gradient of the total energy ''Uto ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Atomic Force Microscopy
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Overview Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force. Abilities The AFM has three major abilities: force measurement, topographic imaging, and manipulation. In force measurement, AFMs can be used to measure the forces between the probe and the sample as ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Cantilever
A cantilever is a rigid structural element that extends horizontally and is supported at only one end. Typically it extends from a flat vertical surface such as a wall, to which it must be firmly attached. Like other structural elements, a cantilever can be formed as a beam, plate, truss, or slab. When subjected to a structural load at its far, unsupported end, the cantilever carries the load to the support where it applies a shear stress and a bending moment. Cantilever construction allows overhanging structures without additional support. In bridges, towers, and buildings Cantilevers are widely found in construction, notably in cantilever bridges and balconies (see corbel). In cantilever bridges, the cantilevers are usually built as pairs, with each cantilever used to support one end of a central section. The Forth Bridge in Scotland is an example of a cantilever truss bridge. A cantilever in a traditionally timber framed building is called a jetty or forebay. In the southe ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Oscillating
Oscillation is the repetitive or periodic variation, typically in time, of some measure about a central value (often a point of equilibrium) or between two or more different states. Familiar examples of oscillation include a swinging pendulum and alternating current. Oscillations can be used in physics to approximate complex interactions, such as those between atoms. Oscillations occur not only in mechanical systems but also in dynamic systems in virtually every area of science: for example the beating of the human heart (for circulation), business cycles in economics, predator–prey population cycles in ecology, geothermal geysers in geology, vibration of strings in guitar and other string instruments, periodic firing of nerve cells in the brain, and the periodic swelling of Cepheid variable stars in astronomy. The term ''vibration'' is precisely used to describe a mechanical oscillation. Oscillation, especially rapid oscillation, may be an undesirable phenomenon in proce ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Coulomb's Law
Coulomb's inverse-square law, or simply Coulomb's law, is an experimental law of physics that quantifies the amount of force between two stationary, electrically charged particles. The electric force between charged bodies at rest is conventionally called ''electrostatic force'' or Coulomb force. Although the law was known earlier, it was first published in 1785 by French physicist Charles-Augustin de Coulomb, hence the name. Coulomb's law was essential to the development of the theory of electromagnetism, maybe even its starting point, as it made it possible to discuss the quantity of electric charge in a meaningful way. The law states that the magnitude of the electrostatic force of attraction or repulsion between two point charges is directly proportional to the product of the magnitudes of charges and inversely proportional to the square of the distance between them. Coulomb studied the repulsive force between bodies having electrical charges of the same sign: Coulomb also ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Charge (physics)
In physics, a charge is any of many different quantities, such as the electric charge in electromagnetism or the color charge in quantum chromodynamics. Charges correspond to the time-invariant generators of a symmetry group, and specifically, to the generators that commute with the Hamiltonian. Charges are often denoted by the letter ''Q'', and so the invariance of the charge corresponds to the vanishing commutator ,H0, where H is the Hamiltonian. Thus, charges are associated with conserved quantum numbers; these are the eigenvalues ''q'' of the generator ''Q''. Abstract definition Abstractly, a charge is any generator of a continuous symmetry of the physical system under study. When a physical system has a symmetry of some sort, Noether's theorem implies the existence of a conserved current. The thing that "flows" in the current is the "charge", the charge is the generator of the (local) symmetry group. This charge is sometimes called the Noether charge. Thus, for exampl ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Nanometer
330px, Different lengths as in respect to the molecular scale. The nanometre (international spelling as used by the International Bureau of Weights and Measures; SI symbol: nm) or nanometer (American and British English spelling differences#-re, -er, American spelling) is a units of measurement, unit of length in the International System of Units (SI), equal to one billionth (short scale) of a metre () and to 1000 picometres. One nanometre can be expressed in scientific notation as , and as metres. History The nanometre was formerly known as the millimicrometre – or, more commonly, the millimicron for short – since it is of a micron (micrometre), and was often denoted by the symbol mμ or (more rarely and confusingly, since it logically should refer to a ''millionth'' of a micron) as μμ. Etymology The name combines the SI prefix ''nano-'' (from the Ancient Greek , ', "dwarf") with the parent unit name ''metre'' (from Greek , ', "unit of measurement"). ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Work Function
In solid-state physics, the work function (sometimes spelt workfunction) is the minimum thermodynamic work (i.e., energy) needed to remove an electron from a solid to a point in the vacuum immediately outside the solid surface. Here "immediately" means that the final electron position is far from the surface on the atomic scale, but still too close to the solid to be influenced by ambient electric fields in the vacuum. The work function is not a characteristic of a bulk material, but rather a property of the surface of the material (depending on crystal face and contamination). Definition The work function for a given surface is defined by the difference :W = -e\phi - E_, where is the charge of an electron, is the electrostatic potential in the vacuum nearby the surface, and is the Fermi level (electrochemical potential of electrons) inside the material. The term is the energy of an electron at rest in the vacuum nearby the surface. In practice, one directly controls by ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Millivolt
The volt (symbol: V) is the unit of electric potential, electric potential difference (voltage), and electromotive force in the International System of Units (SI). It is named after the Italian physicist Alessandro Volta (1745–1827). Definition One volt is defined as the electric potential between two points of a conducting wire when an electric current of one ampere dissipates one watt of power between those points. Equivalently, it is the potential difference between two points that will impart one joule of energy per coulomb of charge that passes through it. It can be expressed in terms of SI base units ( m, kg, s, and A) as : \text = \frac = \frac = \frac. It can also be expressed as amperes times ohms (current times resistance, Ohm's law), webers per second (magnetic flux per time), watts per ampere (power per current), or joules per coulomb (energy per charge), which is also equivalent to electronvolts per elementary charge: : \text = \text\Omega = \frac = \f ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Piconewton
The newton (symbol: N) is the unit of force in the International System of Units (SI). It is defined as 1 kg⋅m/s, the force which gives a mass of 1 kilogram an acceleration of 1 metre per second per second. It is named after Isaac Newton in recognition of his work on classical mechanics, specifically Newton's second law of motion. Definition A newton is defined as 1 kg⋅m/s (it is a derived unit which is defined in terms of the SI base units). One newton is therefore the force needed to accelerate one kilogram of mass at the rate of one metre per second squared in the direction of the applied force. The units "metre per second squared" can be understood as measuring a rate of change in velocity per unit of time, i.e. an increase in velocity by 1 metre per second every second. In 1946, Conférence Générale des Poids et Mesures (CGPM) Resolution 2 standardized the unit of force in the MKS system of units to be the amount needed to accelerate 1 kilogram of mass at the rate of ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Non-contact Atomic Force Microscopy
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance (amplitude modulation) or by measuring the change in resonant frequency directly using a feedback circuit (usually a phase-locked loop) to always drive the sensor on resonance (frequency modulation). Modes of operation The two most common modes of nc-AFM operation, frequency modulation (F ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Atomic Force Microscope
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the diffraction-limited system, optical diffraction limit. Overview Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the diffraction limited, optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force. Abilities The AFM has three major abilities: force measurement, topographic imaging, and manipulation. In force measurement, AFMs can be used to measure the ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Kelvin Probe Force Microscopy
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings. With KPFM, the work function of surfaces can be observed at atomic or molecular scales. The work function relates to many surface phenomena, including catalytic activity, reconstruction of surfaces, doping and band-bending of semiconductors, charge trapping in dielectrics and corrosion. The map of the work function produced by KPFM gives information about the composition and electronic state of the local structures on the surface of a solid. History The SKP technique is based on parallel plate capacitor experiments performed by ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
