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Scan Chain
Scan chain is a technique used in design for testing. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC.The basic structure of scan include the following set of signals in order to control and observe the scan mechanism. #Scan_in and scan_out define the input and output of a scan chain. In a full scan mode usually each input drives only one chain and scan out observe one as well. #A scan enable pin is a special signal that is added to a design. When this signal is asserted, every flip-flop in the design is connected into a long shift register. #Clock signal which is used for controlling all the FFs in the chain during shift phase and the capture phase. An arbitrary pattern can be entered into the chain of flip-flops, and the state of every flip-flop can be read out. In a full scan design, automatic test pattern generation (ATPG) is particularly simple. No sequential pattern generation is required - combinatorial test ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Design For Testing
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate t ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Combinational Logic
In automata theory, combinational logic (also referred to as time-independent logic or combinatorial logic) is a type of digital logic which is implemented by Boolean circuits, where the output is a pure function of the present input only. This is in contrast to sequential logic, in which the output depends not only on the present input but also on the history of the input. In other words, sequential logic has ''memory'' while combinational logic does not. Combinational logic is used in computer circuits to perform Boolean algebra on input signals and on stored data. Practical computer circuits normally contain a mixture of combinational and sequential logic. For example, the part of an arithmetic logic unit, or ALU, that does mathematical calculations is constructed using combinational logic. Other circuits used in computers, such as half adders, full adders, half subtractors, full subtractors, multiplexers, demultiplexers, encoders and decoders are also made by using combin ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Serial Peripheral Interface Bus
The Serial Peripheral Interface (SPI) is a synchronous serial communication interface specification used for short-distance communication, primarily in embedded systems. The interface was developed by Motorola in the mid-1980s and has become a ''de facto'' standard. Typical applications include Secure Digital cards and liquid crystal displays. SPI devices communicate in full duplex mode using a master-slave architecture usually with a single master (though some Atmel and Silabs devices support changing roles on the fly depending on an external (SS) pin). The master (controller) device originates the frame for reading and writing. Multiple slave-devices may be supported through selection with individual chip select (CS), sometimes called slave select (SS) lines. Sometimes SPI is called a ''four-wire'' serial bus, contrasting with three-, two-, and one-wire serial buses. The SPI may be accurately described as a synchronous serial interface, but it is different from the Sy ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Integrated Circuit Design
Integrated circuit design, or IC design, is a sub-field of electronics engineering, encompassing the particular logic and circuit design techniques required to design integrated circuits, or ICs. ICs consist of miniaturized electronic components built into an electrical network on a monolithic semiconductor substrate by photolithography. IC design can be divided into the broad categories of digital and analog IC design. Digital IC design is to produce components such as microprocessors, FPGAs, memories (RAM, ROM, and flash) and digital ASICs. Digital design focuses on logical correctness, maximizing circuit density, and placing circuits so that clock and timing signals are routed efficiently. Analog IC design also has specializations in power IC design and RF IC design. Analog IC design is used in the design of op-amps, linear regulators, phase locked loops, oscillators and active filters. Analog design is more concerned with the physics of the semiconductor devices such as ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Design Automation
Electronic design automation (EDA), also referred to as electronic computer-aided design (ECAD), is a category of software tools for designing Electronics, electronic systems such as integrated circuits and printed circuit boards. The tools work together in a Design flow (EDA), design flow that chip designers use to design and analyze entire semiconductor chips. Since a modern semiconductor chip can have billions of components, EDA tools are essential for their design; this article in particular describes EDA specifically with respect to integrated circuits (ICs). History Early days Prior to the development of EDA, integrated circuits were designed by hand and manually laid out. Some advanced shops used geometric software to generate tapes for a Gerber format, Gerber photoplotter, responsible for generating a monochromatic exposure image, but even those copied digital recordings of mechanically drawn components. The process was fundamentally graphic, with the translation f ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Pattern Generation
ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (Scan chain, full scan, synchronous sequential, or asynchron ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Design For Testing
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate t ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Test Compression
Test compression is a technique used to reduce the time and cost of testing integrated circuits. The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design. These techniques were very successful at creating high-quality vectors for manufacturing test, with excellent test coverage. However, as chips got bigger and more complex the ratio of logic to be tested per pin increased dramatically, and the volume of scan test data started causing a significant increase in test time, and required tester memory. This raised the cost of testing. Test compression was developed to help address this problem. When an ATPG tool generates a test for a fault, or a set of faults, only a small percentage of scan cells need to take specific values. The rest of the scan chain is ' ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Sequential Circuit
In automata theory, sequential logic is a type of logic circuit whose output depends on the present value of its input signals and on the sequence of past inputs, the input history. This is in contrast to ''combinational logic'', whose output is a function of only the present input. That is, sequential logic has ''state'' (''memory'') while combinational logic does not. Sequential logic is used to construct finite-state machines, a basic building block in all digital circuitry. Virtually all circuits in practical digital devices are a mixture of combinational and sequential logic. A familiar example of a device with sequential logic is a television set with "channel up" and "channel down" buttons. Pressing the "up" button gives the television an input telling it to switch to the next channel above the one it is currently receiving. If the television is on channel 5, pressing "up" switches it to receive channel 6. However, if the television is on channel 8, pressing "up" swi ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Flip-flop (electronics)
In electronics, a flip-flop or latch is a circuit that has two stable states and can be used to store state information – a bistable multivibrator. The circuit can be made to change state by signals applied to one or more control inputs and will have one or two outputs. It is the basic storage element in sequential logic. Flip-flops and latches are fundamental building blocks of digital electronics systems used in computers, communications, and many other types of systems. Flip-flops and latches are used as data storage elements. A flip-flop is a device which stores a single ''bit'' (binary digit) of data; one of its two states represents a "one" and the other represents a "zero". Such data storage can be used for storage of ''state'', and such a circuit is described as sequential logic in electronics. When used in a finite-state machine, the output and next state depend not only on its current input, but also on its current state (and hence, previous inputs). It can also b ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Observability
Observability is a measure of how well internal states of a system can be inferred from knowledge of its external outputs. In control theory, the observability and controllability of a linear system are mathematical duals. The concept of observability was introduced by the Hungarian-American engineer Rudolf E. Kálmán for linear dynamic systems. A dynamical system designed to estimate the state of a system from measurements of the outputs is called a state observer or simply an observer for that system. Definition Consider a physical system modeled in state-space representation. A system is said to be observable if, for every possible evolution of state and control vectors, the current state can be estimated using only the information from outputs (physically, this generally corresponds to information obtained by sensors). In other words, one can determine the behavior of the entire system from the system's outputs. On the other hand, if the system is not observable, there ar ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Controllability
Controllability is an important property of a control system, and the controllability property plays a crucial role in many control problems, such as stabilization of unstable systems by feedback, or optimal control. Controllability and observability are dual aspects of the same problem. Roughly, the concept of controllability denotes the ability to move a system around in its entire configuration space using only certain admissible manipulations. The exact definition varies slightly within the framework or the type of models applied. The following are examples of variations of controllability notions which have been introduced in the systems and control literature: * State controllability * Output controllability * Controllability in the behavioural framework State controllability The state of a deterministic system, which is the set of values of all the system's state variables (those variables characterized by dynamic equations), completely describes the system at any give ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
