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Profilometer
A profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography. While the historical notion of a profilometer was a device similar to a phonograph that measures a surface as the surface is moved relative to the contact profilometer's stylus, this notion is changing with the emergence of numerous non-contact profilometry techniques. Non-scanning technologies are able to measure the surface topography within a single camera acquisition, XYZ scanning is no longer needed. As a consequence, dynamic changes of topography are measured in real-time. Contemporary profilometers are not only measuring static topography, but now also dynamic topography – such systems are described as time-resolved profilometers. Types Optical methodsJean M. Bennett, Lars Mattsson, Introduction to Surface Roughness and Scattering, Optical Society of America, Was ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Digital Holographic Microscopy
Digital holographic microscopy (DHM) is digital holography applied to microscopy. Digital holographic microscopy distinguishes itself from other microscopy methods by not recording the projected image of the object. Instead, the light wave front information originating from the object is digitally recorded as a hologram, from which a computer calculates the object image by using a numerical reconstruction algorithm. The image forming lens in traditional microscopy is thus replaced by a computer algorithm. Other closely related microscopy methods to digital holographic microscopy are interferometric microscopy, optical coherence tomography and diffraction phase microscopy. Common to all methods is the use of a reference wave front to obtain amplitude (intensity) ''and'' phase information. The information is recorded on a digital image sensor or by a photodetector from which an image of the object is created (reconstructed) by a computer. In traditional microscopy, which do not u ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Surface Finish
Surface finish, also known as surface texture or surface topography, is the nature of a surface as defined by the three characteristics of lay, surface roughness, and waviness.. It comprises the small, local deviations of a surface from the perfectly flat ideal (a true plane). Surface texture is one of the important factors that control friction and transfer layer formation during sliding. Considerable efforts have been made to study the influence of surface texture on friction and wear during sliding conditions. Surface textures can be isotropic or anisotropic. Sometimes, stick-slip friction phenomena can be observed during sliding, depending on surface texture. Each manufacturing process (such as the many kinds of machining) produces a surface texture. The process is usually optimized to ensure that the resulting texture is usable. If necessary, an additional process will be added to modify the initial texture. The latter process may be grinding (abrasive cutting), polishing, ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Measuring Instrument
A measuring instrument is a device to measure a physical quantity. In the physical sciences, quality assurance, and engineering, measurement is the activity of obtaining and comparing physical quantities of real-world objects and events. Established standard objects and events are used as units, and the process of measurement gives a number relating the item under study and the referenced unit of measurement. Measuring instruments, and formal test methods which define the instrument's use, are the means by which these relations of numbers are obtained. All measuring instruments are subject to varying degrees of instrument error and measurement uncertainty. These instruments may range from simple objects such as rulers and stopwatches to electron microscopes and particle accelerators. Virtual instrumentation is widely used in the development of modern measuring instruments. Time In the past, a common time measuring instrument was the sundial. Today, the usual measuring instrum ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Surface Roughness
Surface roughness, often shortened to roughness, is a component of surface finish (surface texture). It is quantified by the deviations in the direction of the normal vector of a real surface from its ideal form. If these deviations are large, the surface is rough; if they are small, the surface is smooth. In surface metrology, roughness is typically considered to be the high-frequency, short-wavelength component of a measured surface. However, in practice it is often necessary to know both the amplitude and frequency to ensure that a surface is fit for a purpose. Roughness plays an important role in determining how a real object will interact with its environment. In tribology, rough surfaces usually wear more quickly and have higher friction coefficients than smooth surfaces. Roughness is often a good predictor of the performance of a mechanical component, since irregularities on the surface may form nucleation sites for cracks or corrosion. On the other hand, roughness may pr ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Atomic Force Microscopy
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Overview Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force. Abilities The AFM has three major abilities: force measurement, topographic imaging, and manipulation. In force measurement, AFMs can be used to measure the forces between the probe and the sample as ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Tunneling Microscopy
A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated. Most microscopes are built for use in ultra-high vacuum at temperatures approaching zero kelvin, but variants exist for studies in air, water and other environments, and for temperatures over 1000 °C. STM is based on the concept of quantum tunneling. When the tip is brought very near to the surface to be examined, a bias voltage applied between the two allows electrons to tunnel through the vacuum separating them. The resulting ''tunneling current'' is a function of the tip position, applied ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Triangulation Sensor
Optical Triangulation Sensors are commonly used to provide door mounted safety detection on swinging automatic doors. These types of sensors are common in North America. When automatic swinging doors open and close, it is important that they do not come into contact with pedestrians passing through the door. Sensors used in the automatic door industry typically fall into four categories: #Microwave sensors used to detect motion of a person as they approach an automatic door, #Reflective optical sensors that are mounted on the door header and detect the presence of a person in the door path #Camera based sensors that are also mounted on the door header and similarly detect presence; and #Triangulation sensors which are mounted on the door and move with the door to provide safety. Reflective and camera technologies do not perform well on moving swing doors, because they typically depend upon detection of changes in the background. A sensor mounted on a swing door system is consta ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Coherence Scanning Interferometry
Coherence scanning interferometry (CSI) is any of a class of optical surface measurement methods wherein the localization of interference fringes during a scan of optical path length provides a means to determine surface characteristics such as topography, transparent film structure, and optical properties. CSI is currently the most common interference microscopy technique for areal surface topography measurement. The term "CSI" was adopted by the International Organization for Standardization (ISO). The technique encompasses but is not limited to instruments that use spectrally broadband, visible sources ( white light) to achieve interference fringe localization. CSI uses either fringe localization alone or in combination with interference fringe In physics, interference is a phenomenon in which two waves combine by adding their displacement together at every single point in space and time, to form a resultant wave of greater, lower, or the same amplitude. Constructive a ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Digital Holography
Digital holography refers to the acquisition and processing of holograms with a digital sensor array, typically a CCD camera or a similar device. Image rendering, or reconstruction of object ''data'' is performed numerically from digitized interferograms. Digital holography offers a means of measuring optical phase data and typically delivers three-dimensional surface or optical thickness images. Several recording and processing schemes have been developed to assess optical wave characteristics such as amplitude, phase, and polarization state, which make digital holography a very powerful method for metrology applications . Digital recording and processing of holograms Off-axis configuration In the off-axis configuration, a small angle between the reference and the object beams is used to prevent overlapping of the cross-beating contributions between the object and reference optical fields with the self-beating contributions of these fields. These discoveries were made by Emmett Le ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
